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Method and apparatus for electro-optically determining the dimension, location and attitude of objects 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01C-003/08
출원번호 US-0462248 (1995-06-05)
발명자 / 주소
  • Pryor Timothy R.,CAX
  • Hockley Bernard,CAX
  • Liptay-Wagner Nick,CAX
  • Hageniers Omer L.,CAX
  • Pastorius W. J.,CAX
출원인 / 주소
  • Diffracto, Ltd., CAX
대리인 / 주소
    Larson & Taylor
인용정보 피인용 횟수 : 32  인용 특허 : 26

초록 ▼

A method and apparatus for optically determining the dimension of part surfaces. Particular embodiments describe optical triangulation based coordinate measurement machines capable of accurate measurement of complex surfaces, such as gear teeth and turbine blades. Other embodiments provide highly us

대표청구항 ▼

[What is claimed is:] [1.]a sensor comprising a solid state TV camera having an output, said sensor being capable of determining the location of a point on said object surface;means for moving said sensor relative to said object in at least three axes; andprocessing means for receiving said output f

이 특허에 인용된 특허 (26)

  1. Bamberg Jack A. (Boulder CO) Bucher Hans R. (Boulder CO) Bultena John G. (Boulder CO), Active sensor automatic range sweep technique.
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  2. Davis ; Jr. Ray E. (Black River NY) Becker Richard J. (Watertown NY) Foster Robert G. (Brownville NY) Westkamper Michael J. (Clinton CT), Automatic glass blowing apparatus and method.
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  3. Frngel Frank (im Glockenacker 2 8053 Zrich CHX) Spies Martin (Pfaffenhofen DEX), Ceilometric method and apparatus.
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  4. Hosoe Kazuya (Machida JPX) Niwa Yukichi (Yokohama JPX) Tsunekawa Tokuichi (Yokohama JPX) Owada Mitsutoshi (Yokohama JPX) Asano Noriyuki (Kawasaki JPX) Masunaga Makoto (Tokyo JPX), Device for focus detection or distance detection.
    상세보기
  5. Nosler John C. (2587 Floral Hill Dr. Eugene OR 97403), Electro-optical distance-measuring system.
    상세보기
  6. Lowrey ; Jr. Orvey P. (Madison CT) Molden Frederick P. (Manchester CT) Waters James P. (Rockville CT), Gauging surfaces by remotely tracking multiple images.
    상세보기
  7. Pentecost Eugene E. (Anaheim CA), Integrated automatic ranging device for optical instruments.
    상세보기
  8. Nosler John C. (2587 Floral Hill Dr. Eugene OR 97403), Linear array signal processing circuitry for locating the midpoint of a source of light.
    상세보기
  9. Ueda Hirotada (San Jose CA) Yasue Toshikazu (Hachioji JPX) Uno Takeshi (Sayama JPX), Mark detecting system using image pickup device.
    상세보기
  10. Chasson Leon H. (Los Altos Hills CA), Method and apparatus for automatically processing a workpiece employing calibrated scanning.
    상세보기
  11. Pryor Timothy R. (Windsor CAX) Hockley Bernard (Windsor CAX) Liptay-Wagner Nick (Windsor CAX) Hageniers Omer L. (Windsor CAX) Pastorius W. J. (Windsor CAX), Method and apparatus for electro-optically determining dimension, location and altitude of objects.
    상세보기
  12. Pryor Timothy R. (Windsor CAX) Hockley Bernard (Windsor CAX) Liptay-Wagner Nick (Windsor CAX) Hageniers Omer L. (Windsor CAX) Pastorius W. J. (Windsor CAX), Method and apparatus for electro-optically determining the dimension, location and attitude of objects.
    상세보기
  13. Pryor Timothy R. (Windsor CAX) Hockley Bernard S. (Windsor CAX) Liptay-Wagner Nick (Windsor CAX) Hageniers Omer L. (Windsor CAX) Pastorius W. J. (Windsor CAX), Method and apparatus for electro-optically determining the dimension, location and attitude of objects.
    상세보기
  14. Pryor Timothy R. (Windsor CAX) Hockley Bernard (Windsor CAX) Liptay-Wagner Nick (Windsor CAX) Hageniers Omer L. (Windsor CAX) Pastorius W. J. (Windsor CAX), Method and apparatus for electro-optically determining the dimension, location and attitude of objects including light s.
    상세보기
  15. Laliotis Theodore A. (Los Altos CA), Method and apparatus for measuring dimensions.
    상세보기
  16. Pryor Timothy R. (all Windsor CAX) Hockley Bernard (all Windsor CAX) Liptay-Wagner Nick (all Windsor CAX) Hageniers Omer L. (all Windsor CAX) Pastorius W. J. (all Windsor CAX), Method and apparatus utilizing an orientation code for automatically guiding a robot.
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  17. Shimizu Ken-Ichi (Tokorozawa JPX) Ikeya Chuji (Higashi-Murayama JPX), Method for measurement of displacement of moving body by use of target mark and apparatus therefor.
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  18. Suzuki Etsuji (Yokohama JPX) Yasue Itaru (Yokohama JPX) Kashihama Tomio (Yokohama JPX), Method of positioning a semiconductor member by examining it and a die bonding apparatus using the same.
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  19. Hutchins ; IV Thomas B. (310 NW. Brynwood Lane Portland OR 97229), Noncontacting method and apparatus for monitoring the speed and travel of a moving article.
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  20. Raber Peter E. (Milford CT) Gordon Jason M. (Katonah NY), Optical inspection system employing spherical mirror.
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  21. Harris David E. (Columbus OH), Optical triangulation gauging system.
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  22. Nihonmatsu Takashi (Nagano JPX), Optoelectric multi-sensor measuring apparatus and a method for measuring surface flatness therewith.
    상세보기
  23. Chen Richard M. (51-25 Goldsmith St. Elmhurst NY 11373), Orientation and control system for robots.
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  24. Lemelson Jerome H. (85 Rector St. Metuchen NJ 08840), Position indicating system and methods.
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  25. Wagner Herbert A. (Corona Del Mar CA), Railroad track profile spacing and alignment apparatus.
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  26. Kirsch Jerry (36 Beacon Hill Grosse Pointe Farms MI 48236) Kirsch Kerry F. (36 Beacon Hill Grosse Pointe Farms MI 48236), Rotary video article centering, orienting and transfer device for computerized electronic operating systems.
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이 특허를 인용한 특허 (32)

  1. Chang, Chih-Kuang; Jiang, Li; Yuan, Zhong-Kui; Wu, Wei-Wen; Xue, Xiao-Guang; Liu, Jian-Hua, Computing device and measurement control method.
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  2. Kamon,Koichi, Imaging system, photographing device and three-dimensional measurement auxiliary unit used for the system.
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  3. Boca,Remus F; Habibi,Babak; Sameti,Mohammad; Pescaru,Simona, Method and apparatus for machine-vision.
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  4. Habibi, Babak; Pescaru, Simona, Method and apparatus for single camera 3D vision guided robotics.
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  5. Habibi, Babak; Pescaru, Simona; Sameti, Mohammad; Boca, Remus Florinel, Method and apparatus for single image 3D vision guided robotics.
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  6. Rubbert, Rudger; Sporbert, Peer; Weise, Thomas, Method and system for generating a three-dimensional object.
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  7. Rubbert, Rudger; Sporbert, Peer; Weise, Thomas, Method and system for registering data.
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  8. Rudger Rubbert DE; Peer Sporbert DE; Thomas Weise DE, Method and system of scanning.
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  9. Mundy, Joseph LeGrand; Harding, Kevin George; Ross, Joseph Benjamin; Lloyd, Thomas Watkins, Method of measuring a part with a wide range of surface reflectivities.
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  10. Boca, Remus, Methods and apparatus to facilitate operations in image based systems.
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  11. Rubbert,R체dger; Weise,Thomas; Sporbert,Peer; Imgrund,Hans; Kouzian,Dimitrij, Methods for registration of three-dimensional frames to create three-dimensional virtual models of objects.
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  12. Raab, Simon, Portable coordinate measurement machine.
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  13. Raab, Simon; Barber, Marc M., Portable coordinate measurement machine having a bearing assembly with an optical encoder.
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  14. Raab, Simon; Barber, Marc M., Portable coordinate measurement machine having a handle that includes electronics.
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  15. Raab, Simon; Barber, Marc M., Portable coordinate measurement machine having a handle that includes electronics.
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  16. Raab, Simon; Barber, Marc M., Portable coordinate measurement machine having a handle that includes electronics.
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  17. Raab, Simon; Sajedi, Allen; Helm, C. Andrew; Hobden, Randy, Portable coordinate measurement machine having a removable external sensor.
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  18. Raab, Simon; Atwell, Paul C., Portable coordinate measurement machine with a rotatable handle.
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  19. Atwell, Paul Christopher; Barba, Jacint R.; York, Frederick, Portable coordinate measurement machine with integrated line laser scanner.
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  20. Braasch,Jan; Holzapfel,Wolfgang; Seyfried,Volker; Tondorf,Sebastian, Position measuring device.
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  21. Rubbert,R체dger; Weise,Thomas; Sporbert,Peer; Imgrund,Hans; Geerdes,Hans Florian; Pfeil,Lutz; See,Peter, Scanning system and calibration method for capturing precise three-dimensional information of objects.
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  22. Xu, Yiping; Abdulhalm, Ibrahim, Spectroscopic scatterometer system.
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  23. Rubbert, Rudger; Sporbert, Peer; Weise, Thomas, System and method for mapping a surface.
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  24. Rubbert, Rudger; Sporbert, Peer; Weise, Thomas, System and method for mapping a surface.
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  25. Rubbert,Rudger; Sporbert,Peer; Weise,Thomas, System and method for mapping a surface.
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  26. Sachdeva, Rohit; Rubbert, Rudger; Sporbert, Peer; Weise, Thomas, System and method for mapping a surface.
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  27. Boca, Remus F.; Pescaru, Simona Liliana; Beis, Jeffrey Scott; Habibi, Babak, System and method of determining object pose.
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  28. Bareket, Noah; Wack, Daniel C.; Zhao, Guoheng, System for measuring a sample with a layer containing a periodic diffracting structure.
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  29. Ammann, Luke John; Xu, Liming; Wassynger, Stephen; Pilson, Richard, Systems and methods for mode shape identification.
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  30. Wirz,Walter, Tooth aligning device for the aligning of workpiece with pre-cut teeth on gear finishing machines.
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  31. Skurnik, David; Sprague, Randall Brian; Jones, Geoffrey Hugh; Abbott, Eric Charles; Law, Waisiu, Very high speed photodetector system using a PIN photodiode array for position sensing.
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  32. Skurnik, David; Sprague, Randall Brian; Jones, Geoffrey Hugh; Abbott, Eric Charles; Law, Waisiu, Very high speed photodetector system using a PIN photodiode array for position sensing.
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