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Carrier heads, planarizing machines and methods for mechanical or chemical-mechanical planarization of microelectronic-device substrate assemblies 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • B24B-005/36
출원번호 US-0295019 (1999-04-20)
발명자 / 주소
  • Custer Daniel G.
  • Ward Aaron Trent
출원인 / 주소
  • Micron Technology, Inc.
대리인 / 주소
    Dorsey & Whitney LLP
인용정보 피인용 횟수 : 109  인용 특허 : 8

초록

Planarizing machines, carrier heads for planarizing machines and methods for planarizing microelectronic-device substrate assemblies in mechanical or chemical-mechanical planarizing processes. In one embodiment of the invention, a carrier head includes a backing plate, a bladder attached to the back

대표청구항

[ What is claimed is:] [28.]28. A planarizing machine for mechanical or chemical-mechanical planarization of microelectronic-device substrate assemblies, comprising:a support table;a polishing pad on the support table, the polishing pad having a planarizing surface configured to planarize a microele

이 특허에 인용된 특허 (8)

  1. Zuniga Steven M. ; Blumenkranz Stephen J., Carrier head design for a chemical mechanical polishing apparatus.
  2. Zuniga Steven ; Chen Hung, Carrier head for chemical mechanical polishing.
  3. Zuniga Steven ; Chen Hung ; Birang Manoocher, Carrier head for chemical mechanical polishing a substrate.
  4. Chen Hung ; Zuniga Steven M., Carrier head including a flexible membrane and a compliant backing member for a chemical mechanical polishing apparatus.
  5. Chen Hung ; Zuniga Steven M., Carrier head with a removable retaining ring for a chemical mechanical polishing apparatus.
  6. Govzman Boris ; Zuniga Steven M. ; Chen Hung ; Somekh Sasson, Carrier head with a substrate detection mechanism for a chemical mechanical polishing system.
  7. Zuniga Steven ; Chen Hung ; Prabhu Gopalakrishna B., Carrier head with edge control for chemical mechanical polishing.
  8. Zuniga Steven M. ; Chen Hung Chih ; Birang Manoocher ; Wijekoon Kapila ; Ko Sen-Hou, Carrier head with local pressure control for a chemical mechanical polishing apparatus.

이 특허를 인용한 특허 (109)

  1. Taylor, Theodore M., Apparatus and method for conditioning a contact surface of a processing pad used in processing microelectronic workpieces.
  2. Taylor,Theodore M., Apparatus and method for conditioning a contact surface of a processing pad used in processing microelectronic workpieces.
  3. Taylor,Theodore M., Apparatus and method for conditioning a contact surface of a processing pad used in processing microelectronic workpieces.
  4. Taylor,Theodore M., Apparatus and method for conditioning a contact surface of a processing pad used in processing microelectronic workpieces.
  5. Taylor,Theodore M., Apparatus and method for conditioning a contact surface of a processing pad used in processing microelectronic workpieces.
  6. Taylor,Theodore M., Apparatus and method for conditioning a polishing pad used for mechanical and/or chemical-mechanical planarization.
  7. Taylor, Theodore M., Apparatus and method for enhanced processing of microelectronic workpieces.
  8. Chandrasekaran,Nagasubramaniyan, Apparatus and method for mechanical and/or chemical-mechanical planarization of micro-device workpieces.
  9. Blalock,Guy T., Apparatus and method for removing material from microfeature workpieces.
  10. Taylor, Theodore M., Apparatus for planarizing microelectronic workpieces.
  11. Ramarajan, Suresh, Apparatuses and methods for conditioning polishing pads used in polishing micro-device workpieces.
  12. Ramarajan, Suresh, Apparatuses and methods for conditioning polishing pads used in polishing micro-device workpieces.
  13. Ramarajan, Suresh, Apparatuses and methods for conditioning polishing pads used in polishing micro-device workpieces.
  14. Agarwal,Vishnu K., Apparatuses and methods for in-situ optical endpointing on web-format planarizing machines in mechanical or chemical-mechanical planarization of microelectronic-device substrate assemblies.
  15. Ramarajan,Suresh, Apparatuses and methods for monitoring rotation of a conductive microfeature workpiece.
  16. Ramarajan,Suresh, Apparatuses and methods for monitoring rotation of a conductive microfeature workpiece.
  17. Agarwal,Vishnu K.; Chopra,Dinesh, Apparatuses for forming a planarizing pad for planarization of microlectronic substrates.
  18. Agarwal,Vishnu K., Apparatuses for in-situ optical endpointing on web-format planarizing machines in mechanical or chemical-mechanical planarization of microelectronic-device substrate assemblies.
  19. Castor, Terry, Carrier assemblies, planarizing apparatuses including carrier assemblies, and methods for planarizing micro-device workpieces.
  20. Castor, Terry, Carrier assemblies, planarizing apparatuses including carrier assemblies, and methods for planarizing micro-device workpieces.
  21. Chandrasekaran, Nagasubramaniyan, Carrier assemblies, planarizing apparatuses including carrier assemblies, and methods for planarizing micro-device workpieces.
  22. Chandrasekaran,Nagasubramaniyan, Carrier assemblies, planarizing apparatuses including carrier assemblies, and methods for planarizing micro-device workpieces.
  23. Chandrasekaran,Nagasubramaniyan, Carrier assemblies, planarizing apparatuses including carrier assemblies, and methods for planarizing micro-device workpieces.
  24. Elledge,Jason B., Carrier assemblies, polishing machines including carrier assemblies, and methods for polishing micro-device workpieces.
  25. Elledge,Jason B., Carrier assemblies, polishing machines including carrier assemblies, and methods for polishing micro-device workpieces.
  26. Basol, Bulent M.; Uzoh, Cyprian E.; Volodarsky, Konstantin, Carrier head for holding a wafer and allowing processing on a front face thereof to occur.
  27. Paik, Young J.; Bhatnagar, Ashish; Narendrnath, Kadthala Ramaya, Carrier head membrane roughness to control polishing rate.
  28. Bennett,Doyle E.; Nagengast,Andrew J.; Chen,Hung Chih, Carrier head vibration damping.
  29. Tang, Jianshe; Brown, Brian J.; Garretson, Charles C.; Bonner, Benjamin A.; Osterheld, Thomas H.; Redeker, Fred C., Carrier head with a modified flexible membrane.
  30. Nesbitt, Bruce, Electrosurgical electrode and method of manufacturing same.
  31. Nesbitt, Bruce, Electrosurgical electrode and method of manufacturing same.
  32. Nesbitt, Bruce, Electrosurgical electrode and method of manufacturing same.
  33. Doan, Trung T., Endpoint detector and method for measuring a change in wafer thickness in chemical-mechanical polishing of semiconductor wafers and other microelectronic substrates.
  34. Paik,Young Joseph, Feedforward and feedback control for conditioning of chemical mechanical polishing pad.
  35. Sabde, Gundu M.; Hofmann, James J.; Joslyn, Michael J.; Lee, Whonchee, Method and apparatus for chemical-mechanical planarization of microelectronic substrates with selected planarizing liquids.
  36. Chopra, Dinesh; Meikle, Scott G., Method and apparatus for controlling chemical interactions during planarization of microelectronic substrates.
  37. Chopra, Dinesh; Meikle, Scott G., Method and apparatus for controlling chemical interactions during planarization of microelectronic substrates.
  38. Meikle, Scott G., Method and apparatus for forming a planarizing pad having a film and texture elements for planarization of microelectronic substrates.
  39. Meikle,Scott G., Method and apparatus for forming a planarizing pad having a film and texture elements for planarization of microelectronic substrates.
  40. Meikle,Scott G., Method and apparatus for forming a planarizing pad having a film and texture elements for planarization of microelectronic substrates.
  41. Kramer, Stephen J.; Joslyn, Michael J., Method and apparatus for forming and using planarizing pads for mechanical and chemical-mechanical planarization of microelectronic substrates.
  42. Kramer,Stephen J.; Joslyn,Michael J., Method and apparatus for forming and using planarizing pads for mechanical and chemical-mechanical planarization of microelectronic substrates.
  43. Kistler, Rodney C.; Carswell, Andrew, Method and apparatus for removing material from microfeature workpieces.
  44. Kistler, Rodney C.; Carswell, Andrew, Method and apparatus for removing material from microfeature workpieces.
  45. Kistler,Rodney C.; Carswell,Andrew, Method and apparatus for removing material from microfeature workpieces.
  46. Moore, Scott E., Method and apparatus for supporting a microelectronic substrate relative to a planarization pad.
  47. Moore,Scott E., Method and apparatus for supporting a microelectronic substrate relative to a planarization pad.
  48. Agarwal, Vishnu K.; Chopra, Dinesh, Method for forming a planarizing pad for planarization of microelectronic substrates.
  49. Kramer,Stephen J.; Joslyn,Michael J., Method for forming and using planarizing pads for mechanical and chemical-mechanical planarization of microelectronic substrates.
  50. Taylor,Theodore M., Method for planarizing microelectronic workpieces.
  51. Kazumi Sugai JP; Yasuaki Tsuchiya JP, Method of manufacturing semiconductor device and chemical mechanical polishing apparatus.
  52. Marshall, Brian, Methods and apparatuses for analyzing and controlling performance parameters in mechanical and chemical-mechanical planarization of microelectronic substrates.
  53. Marshall, Brian, Methods and apparatuses for analyzing and controlling performance parameters in mechanical and chemical-mechanical planarization of microelectronic substrates.
  54. Blalock, Guy T., Methods and apparatuses for making and using planarizing pads for mechanical and chemical mechanical planarization of microelectronic substrates.
  55. Blalock, Guy T., Methods and apparatuses for making and using planarizing pads for mechanical and chemical-mechanical planarization of microelectronic substrates.
  56. Blalock, Guy T., Methods and apparatuses for making and using planarizing pads for mechanical and chemical-mechanical planarization of microelectronic substrates.
  57. Blalock,Guy T., Methods and apparatuses for making and using planarizing pads for mechanical and chemical-mechanical planarization of microelectronic substrates.
  58. Lu, Jin, Methods and apparatuses for removing polysilicon from semiconductor workpieces.
  59. Chandrasekaran,Nagasubramaniyan, Methods and systems for conditioning planarizing pads used in planarizing substrates.
  60. Chandrasekaran,Nagasubramaniyan, Methods and systems for conditioning planarizing pads used in planarizing substrates.
  61. Chandrasekaran,Nagasubramaniyan, Methods and systems for conditioning planarizing pads used in planarizing substrates.
  62. Chandrasekaran,Nagasubramaniyan, Methods and systems for conditioning planarizing pads used in planarizing substrates.
  63. Chandrasekaran,Nagasubramaniyan, Methods and systems for conditioning planarizing pads used in planarizing substrates.
  64. Elledge, Jason B., Methods and systems for planarizing workpieces, e.g., microelectronic workpieces.
  65. Elledge,Jason B., Methods and systems for planarizing workpieces, e.g., microelectronic workpieces.
  66. Elledge,Jason B., Methods and systems for planarizing workpieces, e.g., microelectronic workpieces.
  67. Moore,Carter; Folkes,Elon; Castor,Terry, Methods and systems for planarizing workpieces, e.g., microelectronic workpieces.
  68. Marshall,Brian, Methods for analyzing and controlling performance parameters in mechanical and chemical-mechanical planarization of microelectronic substrates.
  69. Taylor,Theodore M., Methods for planarizing microelectronic workpieces.
  70. Moore,Carter; Folkes,Elon; Castor,Terry, Methods for planarizing workpieces, e.g., microelectronic workpieces.
  71. Elledge,Jason B., Methods of manufacturing carrier heads for polishing micro-device workpieces.
  72. Martin, Michael H.; Crump, Brett, Planarity diagnostic system, E.G., for microelectronic component test systems.
  73. Martin,Michael H.; Crump,Brett, Planarity diagnostic system, E.G., for microelectronic component test systems.
  74. Martin,Michael H.; Crump,Brett, Planarity diagnostic system, e.g., for microelectronic component test systems.
  75. Martin,Michael H.; Crump,Brett, Planarity diagnostic system, e.g., for microelectronic component test systems.
  76. Moore, Scott E., Planarizing machines and control systems for mechanical and/or chemical-mechanical planarization of microelectronic substrates.
  77. Joslyn, Michael J., Planarizing machines and methods for dispensing planarizing solutions in the processing of microelectronic workpieces.
  78. Joslyn,Michael J., Planarizing machines and methods for dispensing planarizing solutions in the processing of microelectronic workpieces.
  79. Wright, David Q., Planarizing machines and methods for mechanical and/or chemical-mechanical planarization of microelectronic-device substrate assemblies.
  80. Agarwal, Vishnu K.; Chopra, Dinesh, Planarizing pads for planarization of microelectronic substrates.
  81. Dapeng Wang, Planarizing pads, planarizing machines and methods for making and using planarizing pads in mechanical and chemical-mechanical planarization of microelectronic device substrate assemblies.
  82. Homma, Yoshio; Kondo, Seiichi; Sakuma, Noriyuki; Yamada, Youhei; Kimura, Takeshi; Nezu, Hiroki, Polishing apparatus.
  83. Homma, Yoshio; Kondo, Seiichi; Sakuma, Noriyuki; Yamada, Youhei; Kimura, Takeshi; Nezu, Hiroki, Polishing apparatus.
  84. Bottema,Brian E.; Cline,Keven A.; Pamatat,Alex P.; Brown,Nathan R., Polishing carrier head with a modified pressure profile.
  85. Elledge, Jason B., Polishing machines including under-pads and methods for mechanical and/or chemical-mechanical polishing of microfeature workpieces.
  86. Dunn,Freddie L., Polishing pad conditioners having abrasives and brush elements, and associated systems and methods.
  87. Bottema, Brian E.; Cline, Keven A.; Poteet, Morris S., Polishing system having a carrier head with substrate presence sensing.
  88. Bennett, Doyle E.; Nagengast, Andrew J.; Chen, Hung Chih, Retaining ring and articles for carrier head.
  89. Bennett, Doyle E.; Nagengast, Andrew J.; Chen, Hung Chih, Retaining ring and articles for carrier head.
  90. Chandrasekaran,Nagasubramaniyan, Retaining rings, and associated planarizing apparatuses, and related methods for planarizing micro-device workpieces.
  91. Chandrasekaran,Nagasubramaniyan, Retaining rings, and associated planarizing apparatuses, and related methods for planarizing micro-device workpieces.
  92. Taylor, Theodore M., Retaining rings, planarizing apparatuses including retaining rings, and methods for planarizing micro-device workpieces.
  93. Taylor, Theodore M., Retaining rings, planarizing apparatuses including retaining rings, and methods for planarizing micro-device workpieces.
  94. Taylor,Theodore M., Retaining rings, planarizing apparatuses including retaining rings, and methods for planarizing micro-device workpieces.
  95. Taylor,Theodore M., Shaped polishing pads for beveling microfeature workpiece edges, and associate system and methods.
  96. Taylor,Theodore M., Shaped polishing pads for beveling microfeature workpiece edges, and associated systems and methods.
  97. Taylor,Theodore M., Shaped polishing pads for beveling microfeature workpiece edges, and associated systems and methods.
  98. Klein, Rita J., System for planarizing microelectronic substrates having apertures.
  99. Elledge,Jason B., Systems and methods for mechanical and/or chemical-mechanical polishing of microfeature workpieces.
  100. Elledge,Jason B., Systems and methods for mechanical and/or chemical-mechanical polishing of microfeature workpieces.
  101. Elledge, Jason B.; Chandrasekaran, Nagasubramaniyan, Systems and methods for monitoring characteristics of a polishing pad used in polishing micro-device workpieces.
  102. Elledge,Jason B.; Chandrasekaran,Nagasubramaniyan, Systems and methods for monitoring characteristics of a polishing pad used in polishing micro-device workpieces.
  103. Elledge,Jason B.; Chandrasekaran,Nagasubramaniyan, Systems and methods for monitoring characteristics of a polishing pad used in polishing micro-device workpieces.
  104. Elledge,Jason B.; Chandrasekaran,Nagasubramaniyan, Systems and methods for monitoring characteristics of a polishing pad used in polishing micro-device workpieces.
  105. Elledge,Jason B.; Chandrasekaran,Nagasubramaniyan, Systems and methods for monitoring characteristics of a polishing pad used in polishing micro-device workpieces.
  106. Bastian, Joseph A.; Reukauf, Jeremey T., Systems and methods for removing microfeature workpiece surface defects.
  107. Bastian,Joseph A.; Reukauf,Jeremey T., Systems and methods for removing microfeature workpiece surface defects.
  108. Moore,Carter; Folkes,Elon; Castor,Terry, Systems for planarizing workpieces, e.g., microelectronic workpieces.
  109. Chen,Hung Chih; Li,Shijian; White,John M.; Emami,Ramin; Redeker,Fred C.; Zuniga,Steven M.; Cheboli,Ramakrishna, Vibration damping during chemical mechanical polishing.
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