초록 ▼

A method and apparatus which provides for continual monitoring of the electrical and optical performance of one or more field emission display devices while the devices are burned-in is for the purpose of proper aging and testing of screen phosphors and semiconductor circuitry as well as determining

A method and apparatus which provides for continual monitoring of the electrical and optical performance of one or more field emission display devices while the devices are burned-in is for the purpose of proper aging and testing of screen phosphors and semiconductor circuitry as well as determining the failure of the display devices including failures of individual field emitters within a display device. Display performance parameters including luminance anode current and field emitter performance are measured for determining when the components are properly aged as well as determining catastrophic failures in a display or a substantial degrade in performance in order to determine when and how the device may have failed.

대표청구항 ▼

[ What is claimed is:] [1.]1. A method of burning-in and testing of field emission display devices comprising:loading at least one of the devices into an oven and operating the oven at an oven temperature in the range from approximately 20.degree. C. to approximately 125.degree. C.;applying an opera

[ What is claimed is:] [1.]1. A method of burning-in and testing of field emission display devices comprising:loading at least one of the devices into an oven and operating the oven at an oven temperature in the range from approximately 20.degree. C. to approximately 125.degree. C.;applying an operation voltage to emitters of the at least one of the devices at said oven temperature;applying anode voltage to the at least one of the devices;applying grid voltage to the at least one of the devices;setting a video gain voltage at an initial low voltage value to cause substantially uniform luminance to occur for display pixels of said at least one display device;increasing the video gain voltage until a maximum voltage value is obtained; andmonitoring display performance parameters including luminance and anode current values during a burn-in period while operating the at least one of the display devices at said oven temperature.