$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Method and apparatus for wireless radio frequency testing of RFID integrated circuits 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01R-031/26
출원번호 US-0247900 (1999-02-10)
발명자 / 주소
  • Brady Michael John
  • Duan Dah-Weih
출원인 / 주소
  • Intermec IP Corp.
대리인 / 주소
    O'Melveny & Myers
인용정보 피인용 횟수 : 229  인용 특허 : 51

초록

A method and apparatus for wireless radio frequency (RF) testing of radio frequency identification integrated circuits (RFID IC) is disclosed. A fixture is provided for physically and electrically contacting the RFID IC to feed an RF interrogating signal into the RFID IC and receive an RF return sig

대표청구항

[ What is claimed is:] [20.]20. A system for performing wireless radio frequency testing of a radio frequency identification integrated circuit, comprising:a fixture including a probe for physically and electrically contacting the radio frequency identification integrated circuit to feed a radio fre

이 특허에 인용된 특허 (51)

  1. Anthonyson Robert B., Automated vehicle parking system for a plurality of remote parking facilities.
  2. Chaum David (Sherman Oaks CA) Hendrick Peter L. (Jupiter FL), Automatic real-time highway toll collection from moving vehicles.
  3. Landt Jeremy A. (Los Alamos NM), Beam powered antenna.
  4. Schrott Alejandro Gabriel ; Brady Michael John ; Cofino Thomas A. ; Gambino Richard Joseph ; Von Gutfeld Robert Jacob ; Heinrich Harley Kent ; Moskowitz Paul Andrew, Circuit antitheft and disabling mechanism.
  5. Afzali-Ardakani Ali ; Brady Michael John ; Duan Dah-Weih ; Feild Christopher Adam ; Heinrich Harley Kent ; Moskowitz Paul Andrew, Communication channels through electrically conducting enclosures via frequency selective windows.
  6. Schrott Alejandro Gabriel ; Gambino Richard Joseph ; von Gutfeld Robert Jacob, Concealed magnetic ID code and antitheft tag.
  7. Heinrich Harley K. (Brewster NY) Friedman Daniel J. (Tarrytown NY), Diode modulator for radio frequency transponder.
  8. Brady Michael J. (Brewster NY) Chaudhari Praveen (Briarcliff Manor NY) Gambino Richard J. (Stony Brook NY) Heinrich Harley K. (Brewster NY) Moskowitz Paul A. (Yorktown NY) von Gutfeld Robert J. (New , Encodable tag with radio frequency readout.
  9. Hendrick Peter L. (Los Alamos NM) Speirs Donald F. (San Juan NM) Wolf Michael A. (Los Alamos NM), High speed system for reading and writing data from and into remote tags.
  10. Gambino Richard Joseph ; Schrott Alejandro Gabriel ; von Gutfeld Robert Jacob, Identification tags using amorphous wire.
  11. Jahnes Christopher ; Gambino Richard Joseph ; Paunovic Milan ; Schrott Alejandro Gabriel ; von Gutfeld Robert Jacob, Identification tags using amorphous wire.
  12. Carrender Curt L. ; Landt Jeremy A. ; Speirs Donald F., Integrated electronic tag reader and wireless communication link.
  13. Hietala Vincent M. ; Tiggers Chris P. ; Plut Thomas A., Integrated resonant tunneling diode based antenna.
  14. Schkolnick Mario ; von Gutfeld Robert Jacob, Intelligent shopping cart.
  15. Baldwin ; Howard A. ; Depp ; Steven W. ; Koelle ; Alfred R. ; Freyman ; Robert W., Interrogation, and detection system.
  16. Koelle Alfred R. (Santa Fe NM), Low level RF threshold detector.
  17. Gambino Richard J. (Stony Brook NY) Schrott Alejandro G. (New York NY) von Gutfeld Robert J. (New York NY), Magnetic tag using acoustic or magnetic interrogation.
  18. Wiese Richard W. (Milford MI), Method and apparatus for mapping printed circuit fields.
  19. Chieu Trieu Can ; Cofino Thomas Anthony ; Heinrich Harley Kent ; Sousa Paul Jorge ; Zai Li-Cheng Richard, Method of grouping RF transponders.
  20. Brady Michael J. ; Chalco Pedro A. ; Guindon Francois,CAX ; Moskowitz Paul Andrew ; Murphy Philip, Method of making a thin radio frequency transponder.
  21. Heinrich Harley Kent ; Martinez Rene Dominic ; Sousa Paul Jorge ; Zai Li-Cheng Richard, Method of transporting radio frequency power to energize radio frequency identification transponders.
  22. Veghte Richard L. ; Carrender Curtis L., Modulated backscatter microstrip patch antenna.
  23. Schrott Alejandro Gabriel ; Gambino Richard Joseph ; von Gutfeld Robert Jacob, Modulation of the resonant frequency of a circuit using an energy field.
  24. Schrott Alejandro G. (New York NY) von Gutfeld Robert J. (New York NY), Multibit bimorph magnetic tags using acoustic or magnetic interrogation for identification of an object coupled thereto.
  25. Brady Michael J. (Brewster NY) Chaudhari Praveen (Briarcliff Manor NY) Gambino Richard J. (Stony Brook NY) Heinrich Harley K. (Brewster NY) Moskowitz Paul A. (Yorktown NY) Schrott Alejandro G. (New Y, Multibit magnetic radio frequency tag using micromechanics.
  26. Gambino Richard J. (Stoney Brook NY) von Gutfeld Robert J. (New York NY), Multibit tag using Barkhausen effect.
  27. Schrott Alejandro Gabriel (New York NY) Gambino Richard Joseph (Stony Brook NY) von Gutfeld Robert Jacob (New York NY), Multibit tag with stepwise variable frequencies.
  28. Landt Jeremy A. (Los Alamos NM), Multichannel homodyne receiver.
  29. Chan Shun S. (Flushing NY) Heinrich Harley K. (Brewster NY) Kandlur Dilip D. (Briarcliff Manor NY) Krishna Arvind (Briarcliff Manor NY), Multiple item radio frequency tag identification protocol.
  30. Kandlur Dilip D. (Briarcliff Manor NY) Krishna Arvind (Briarcliff Manor NY), Power-efficient technique for multiple tag discrimination.
  31. Sansonetti Philippe (Paris FRX) Boileau Catherine (Paris FRX) D\Hauteville Hlne (Paris FRX), Probe for DNA and a process for the detection of “shigellae”and entero-invasive strains of Escherichia coli.
  32. Brown Richard R. (514 Paige Loop Los Alamos NM 87544), Programmer for identification system.
  33. Moskowitz Paul A. (Yorktown Heights NY) Brady Michael J. (Brewster NY) Coteus Paul W. (Yorktown Heights NY), Radio frequency circuit and memory in thin flexible package.
  34. Brady Michael John (Brewster NY) Cofino Thomas (Rye NY) Heinrich Harley Kent (Brewster NY) Johnson Glen Walden (Yorktown Heights NY) Moskowitz Paul Andrew (Yorktown Heights NY) Walker George Frederic, Radio frequency identification tag.
  35. Heinrich Harley Kent ; Capek Peter George ; Cofino Thomas Anthony ; Friedman Daniel J. ; McAuliffe Kevin Patrick ; Sousa Paul Jorge ; Walsh Brian John Hugh,GB6, Radio frequency identification transponder with electronic circuit enabling/disabling capability.
  36. Landt Jeremy A. (Los Alamos NM) Koelle Alfred R. (Santa Fe NM) Eckhardt David A. (Albuquerque NM), Range limiting system.
  37. Koelle Alfred R. (Santa Fe NM) Speirs Donald F. (San Juan NM) Hendrick Peter L. (Los Alamos NM), Rapid signal validity checking apparatus.
  38. Chmielewski Thomas (Highland Heights OH) Molyneaux David A. (Willowick OH) Braum William O. (Twinsburg OH), Scalar S-parameter test set for NMR instrumentation measurements.
  39. Landt Jeremy A. (Los Alamos NM) Koelle Alfred R. (Santa Fe NM) Eckhardt David A. (Albuquerque NM), Signal discrimination system.
  40. Koelle Alfred R. (Santa Fe NM), Single antenna location and direction finding system.
  41. Mays Wesley M. ; Kam Siu Aaron J. ; Fontanarosa Mike D., Spread spectrum frequency hopping reader system.
  42. Cesar Christian Lenz (Shrub Oak NY) Chan Shun Shing (Flushing NY) Cofino Thomas Anthony (Rye NY) Goldman Kenneth Alan (Norwalk CT) Greene Sharon L. (Mt. Kisco NY) Heinrich Harley Kent (Brewster NY) M, System and method for radio frequency tag group select.
  43. Cesar Christian Lenz, System and method for selecting a subset of autonomous and independent slave entities.
  44. Benson Steven J. (Rochester MN) Cofino Thomas A. (Rye NY) von Gutfeld Robert J. (New York NY), System and method for tracking vehicles in vehicle lots.
  45. Schrott Alejandro Gabriel ; Gambino Richard Joseph ; von Gutfeld Robert Jacob, System for concealed serialization utilizing a soft magnetic antitheft element.
  46. Landt Jeremy A. (Santa Fe NM) Koelle Alfred R. (Santa Fe NM) Speirs Donald F. (Fairview NM), System for preventing reading of undesired RF signals.
  47. Landt Jeremy A. (Los Alamos NM) Koelle Alfred R. (Santa Fe NM), System for reading and writing data from and into remote tags.
  48. Brady Michael J. ; Favreau Normand Gilles,CAX ; Guindon Francois,CAX ; Moskowitz Paul Andrew ; Murphy Philip, Thin radio frequency transponder with leadframe antenna structure.
  49. Landt Jeremy A. (Los Alamos NM), Transponder antenna.
  50. Veghte Richard L. ; Carrender Curtis L. ; Koelle Alfred R. ; Landt Jeremy A., Transponder employing modulated backscatter microstrip double patch antenna.
  51. Koelle Alfred R. (Los Alamos NM), Transponder useful in a system for identifying objects.

이 특허를 인용한 특허 (229)

  1. Strid, Eric; Gleason, K. Reed, Active wafer probe.
  2. Pauly, Gerald W.; Keller, III, Walter J., Advance manufacturing monitoring and diagnostic tool.
  3. Pauly, Gerald William; Keller, III, Walter John, Advance manufacturing monitoring and diagnostic tool.
  4. Rofougaran, Ahmadreza; Behzad, Arya Reza; Zhao, Sam Ziqun; Castaneda, Jesus Alfonso; Boers, Michael, Apparatus for reconfiguring an integrated waveguide.
  5. Rofougaran, Ahmadreza; Behzad, Arya Reza; Zhao, Sam Ziqun; Castaneda, Jesus Alfonso; Boers, Michael, Apparatus for reconfiguring an integrated waveguide.
  6. Grauzer, Attila; Bourbour, Feraidoon; Yoseloff, Mark L., Apparatus, system, method, and computer-readable medium for casino card handling with multiple hand recall feature.
  7. Grauzer, Attila; Bourbour, Feraidoon; Yoseloff, Mark L., Apparatus, system, method, and computer-readable medium for casino card handling with multiple hand recall feature.
  8. Grauzer, Attila; Bourbour, Feraidoon; Yoseloff, Mark L., Apparatus, system, method, and computer-readable medium for casino card handling with multiple hand recall feature.
  9. Grauzer, Attila; Bourbour, Feraidoon; Yoseloff, Mark L., Apparatus, system, method, and computer-readable medium for casino card handling with multiple hand recall feature.
  10. Scheper, Paul K.; Grauzer, Attila; Kelly, James V.; Stasson, James B.; Swanson, Ronald R.; Bourbour, Feraidoon; Nelson, Troy D.; Lopez, David B.; Yoseloff, Mark L.; Dunn, R. Brooke; Krenn, Peter; Blaha, Ernst, Automatic card shuffler with pivotal card weight and divider gate.
  11. Scheper, Paul K.; Grauzer, Attila; Kelly, James V.; Stasson, James B.; Swanson, Ronald R.; Bourbour, Feraidoon; Nelson, Troy D.; Lopez, David B.; Yoseloff, Mark L.; Dunn, Russell Brooke; Krenn, Peter; Blaha, Ernst, Automatic card shuffler with pivotal card weight and divider gate.
  12. Rynda, Robert J.; Bourbour, Feraidoon; Swanson, Ronald R.; Grauzer, Attila, Automatic system and methods for accurate card handling.
  13. Rynda, Robert J.; Bourbour, Feraidoon; Swanson, Ronald R.; Grauzer, Attila, Automatic system and methods for accurate card handling.
  14. Stasson, James B.; Rynda, Robert J.; Scheper, Paul K.; Swanson, Ronald R.; Grauzer, Attila, Batch card shuffling apparatuses including multi card storage compartments.
  15. Stasson, James B.; Rynda, Robert J.; Scheper, Paul K.; Swanson, Ronald R.; Grauzer, Attila, Batch card shuffling apparatuses including multi card storage compartments, and related methods.
  16. Strid, Eric; Campbell, Richard, Calibration structures for differential signal probing.
  17. Blaha, Ernst; Krenn, Peter, Card handling apparatus.
  18. Blaha, Ernst; Krenn, Peter, Card handling apparatus.
  19. Blaha, Ernst; Krenn, Peter, Card handling apparatus and associated methods.
  20. Grauzer, Attila; Scheper, Paul K.; Swanson, Ronald R., Card handling apparatuses and methods for handling cards.
  21. Krenn, Peter; Blaha, Ernst, Card handling devices and related assemblies and components.
  22. Grauzer, Attila; Blaha, Ernst; Krenn, Peter; Scheper, Paul K., Card handling devices and related methods.
  23. Grauzer, Attila; Schubert, Oliver M.; Kelly, James V.; Stasson, James B.; Bourbour, Feraidoon; Scheper, Paul K.; Nelson, Troy D., Card handling devices and related methods.
  24. Krenn, Peter, Card handling systems, devices for use in card handling systems and related methods.
  25. Yoseloff, Mark L.; Grauzer, Attila; Jackson, James P.; Wadds, Nathan J., Card reading shoe with card stop feature and systems utilizing the same.
  26. Kelly, James V.; Zvercov, Vladislav; Miller, Brian, Card recognition system, card handling device, and method for tuning a card handling device.
  27. Kelly, James V.; Zvercov, Vladislav; Miller, Brian E., Card recognition system, card handling device, and method for tuning a card handling device.
  28. Tedham, Thomas A., Card shuffler device.
  29. Downs, III, Justin G.; Roberts, James R.; Kulakkunnath, Kapilkumar N.; Zvercov, Vladislav, Card shuffling apparatus and card handling device.
  30. Downs, Justin G.; Roberts, James D.; Zvercov, Vladislav; Kulakkunnath, Kapilkumar N., Card shuffling apparatus and card handling device.
  31. Sines, Randy D.; Griffin, Gary W.; Lahti, Joseph J., Card shuffling apparatuses and related methods.
  32. Sines, Randy D.; Lahti, Joseph John; Griffin, Gary Wayne, Card shuffling apparatuses and related methods.
  33. Kelly, James V.; Helgesen, James P.; Zvercov, Vladislav; Bourbour, Feraidoon; Rynda, Robert J., Card shuffling device and calibration method.
  34. Swanson, Ronald R., Card-feeding device for a card-handling device including a pivotable arm.
  35. Hessing, Lynn C.; Mahoney, Daniel J.; Blad, Steven J.; Baker, Thompson A., Card-handling device and method of operation.
  36. Hessing, Lynn C.; Mahoney, Daniel J.; Blad, Steven J.; Baker, Thompson A., Card-handling device and method of operation.
  37. Grauzer, Attila; Bourbour, Feraidoon; Nelson, Troy D.; Rynda, Robert J.; Scheper, Paul K.; Stasson, James B.; Swanson, Ronald R., Card-handling devices.
  38. Johnson, Rodney G., Card-handling devices and methods of using such devices.
  39. Stasson, James B.; Grauzer, Attila; Rynda, Robert J.; Scheper, Paul K.; Swanson, Ronald R., Card-handling methods with simultaneous removal.
  40. Grauzer, Attila; Snow, Roger M.; Roberts, James R.; Jackson, James P.; Wadds, Nathan J.; Schubert, Oliver M., Card-reading shoe with inventory correction feature and methods of correcting inventory.
  41. Grauzer, Attila; Snow, Roger M.; Roberts, James R.; Jackson, James P.; Wadds, Nathan J.; Schubert, Oliver M., Card-reading shoe with inventory correction feature and methods of correcting inventory.
  42. Grauzer, Attila; Bourbour, Feraidoon; Yoseloff, Mark L.; Haushalter, Todd, Casino card handling system with game play feed.
  43. Grauzer, Attila; Bourbour, Feraidoon; Yoseloff, Mark L.; Haushalter, Todd, Casino card handling system with game play feed to mobile device.
  44. Grauzer, Attila; Bourbour, Feraidoon; Yoseloff, Mark L.; Haushalter, Todd, Casino card handling system with game play feed to mobile device.
  45. Dunklee, John, Chuck for holding a device under test.
  46. Dunklee, John, Chuck for holding a device under test.
  47. Dunklee, John, Chuck for holding a device under test.
  48. Dunklee,John, Chuck for holding a device under test.
  49. Dunklee,John, Chuck for holding a device under test.
  50. Dunklee,John, Chuck for holding a device under test.
  51. Stewart, Craig; Lord, Anthony; Spencer, Jeff; Burcham, Terry; McCann, Peter; Jones, Rod; Dunklee, John; Lesher, Tim; Newton, David, Chuck for holding a device under test.
  52. Stewart,Craig; Lord,Anthony; Spencer,Jeff; Burcham,Terry; McCann,Peter; Jones,Rod; Dunklee,John; Lesher,Tim; Newton,David, Chuck for holding a device under test.
  53. Andrews, Peter; Froemke, Brad; Dunklee, John, Chuck with integrated wafer support.
  54. Andrews,Peter; Froemke,Brad; Dunklee,John, Chuck with integrated wafer support.
  55. Martinez, Genaro; Wells, Jay; Lewis, Nelson; Martinez, Gabriel, Computer automated test and processing system of RFID tags.
  56. Miller,Charles A., Contactless interfacing of test signals with a device under test.
  57. Dewey, Alan R.; Citrano, III, Joseph; Toepke, Todd Mitchell; Russell, III, Alden C.; Rotvold, Eric D., Detection and location of wireless field devices.
  58. Dewey, Alan Roger; Citrano, III, Joseph; Toepke, Todd Mitchell; Russell, III, Alden Chester; Rotvold, Eric D., Detection and location of wireless field devices.
  59. Campbell, Richard; Strid, Eric W.; Andrews, Mike, Differential signal probe with integral balun.
  60. Strid, Eric; Campbell, Richard, Differential signal probing system.
  61. Campbell, Richard L.; Andrews, Michael, Differential waveguide probe.
  62. Burcham, Terry; McCann, Peter; Jones, Rod, Double sided probing structures.
  63. Burcham,Terry; McCann,Peter; Jones,Rod, Double sided probing structures.
  64. Kuroda, Tadahiro; Mizoguchi, Daisuke; Mirua, Noriyuki, Electronic circuit testing apparatus.
  65. Dunklee, John; Norgden, Greg; Cowan, C. Eugene, Guarded tub enclosure.
  66. Stasson, James B.; Rynda, Robert J.; Helgesen, James P.; Nelson, Troy D.; Scheper, Paul K.; Swanson, Ronald R.; Helsen, Colin A.; Wadds, Nathan J., Hand-forming card shuffling apparatuses including multi-card storage compartments, and related methods.
  67. Stasson, James B.; Rynda, Robert J.; Helgesen, James P.; Nelson, Troy D.; Scheper, Paul K.; Swanson, Ronald R.; Helsen, Collin A.; Wadds, Nathan J., Hand-forming card shuffling apparatuses including multi-card storage compartments, and related methods.
  68. Toepke, Todd M.; Kantzes, Christopher P.; Mathiowetz, Brad N.; Yang, Kun; Lund, Adam E., Handheld field maintenance device with improved user interface.
  69. Toepke, Todd M.; Kantzes, Christopher P.; Mathiowetz, Brad N.; Yang, Kun; Lund, Adam E., Handheld field maintenance tool with improved diagnostics.
  70. Russell, III, Alden Chester; Toepke, Todd Mitchell; Dewey, Alan Roger; Citrano, III, Joseph, Handheld field maintenance tool with improved functionality.
  71. Ferguson, Anthony D.; Kantzes, Christopher P.; Mathiowetz, Brad N.; Toepke, Todd M.; Yang, Kun; Lund, Adam E.; Lattimer, Donald R.; Franchuk, Brian A., Handheld field maintenance tool with improved locational awareness functionality.
  72. Mathiowetz, Brad N.; Kantzes, Christopher P.; Toepke, Todd M.; Yang, Kun; Lund, Adam E., Handheld field maintenance tool with integration to external software application.
  73. Imbruglio, Richard, High temperature tolerant RFID tag.
  74. Pesavento, Alberto, Hybrid non-volatile memory.
  75. Hewitt, Matthew C.; Parrent, Travis M.; Hobson, Tim; Genei, Martin, Industrial data capture system including a choke point portal and tracking software for radio frequency identification of cargo.
  76. Arai,Yasuyuki; Tachimura,Yuko; Akiba,Mai, Inspection method for semiconductor device.
  77. Arai, Yasuyuki; Tachimura, Yuko; Akiba, Mai, Inspection system, inspection method, and method for manufacturing semiconductor device.
  78. Arai,Yasuyuki; Tachimura,Yuko; Akiba,Mai, Inspection system, inspection method, and method for manufacturing semiconductor device.
  79. Kantzes, Christopher P.; Mathiowetz, Brad N.; Toepke, Todd M.; Yang, Kun; Lund, Adam E.; Lattimer, Donald R.; Franchuk, Brian A., Intrinsically-safe handheld field maintenance tool with image and/or sound capture.
  80. Walsh, Stephen; Liu, Henry, Load board for testing of RF chips.
  81. McFadden,Bruce, Localizing a temperature of a device for testing.
  82. Hsieh, Chih-Yuan; Yeh, Chun-Wen, Loop-back testing method and apparatus for IC.
  83. Toepke, Todd Mitchell; Citrano, III, Joseph; Dewey, Alan Roger; Russell, III, Alden Chester; Rotvold, Eric D., Maintenance of wireless field devices.
  84. Gleason, K. Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing method using improved contact.
  85. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing method using improved contact.
  86. Gleason, K. Reed; Smith, Kenneth R.; Bayne, Mike, Membrane probing structure with laterally scrubbing contacts.
  87. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing system.
  88. Smith,Kenneth; Gleason,Reed, Membrane probing system.
  89. Smith,Kenneth; Gleason,Reed, Membrane probing system.
  90. Tervo,Paul A.; Smith,Kenneth R.; Cowan,Clarence E.; Dauphinais,Mike P.; Koxxy,Martin J., Membrane probing system.
  91. Gleason, K. Reed; Smith, Kenneth R.; Bayne, Mike, Membrane probing system with local contact scrub.
  92. Li, Tsung-Hsiung; Yen, Kuang-Kai; Liu, Yi-Hsuan; Hsieh, Hsieh-Hung; Jou, Chewn-Pu; Hsueh, Fu-Lung, Method and apparatus for RFID tag testing.
  93. Sellathamby, Christopher V.; Slupsky, Steven; Moore, Brian, Method and apparatus for interrogating electronic equipment components.
  94. Sampson, David E.; Forte, Steven L., Method and apparatus for shuffling and handling cards.
  95. Grauzer, Attila; Lopez, David B., Method and apparatus for using upstream communication in a card shuffler.
  96. Grauzer, Attila; Lopez, David B., Method and apparatus for using upstream communication in a card shuffler.
  97. Grauzer, Attila; Lopez, David B., Method and apparatus for using upstream communication in a card shuffler.
  98. Puleston,David John; Kingston,Benjamin John; Forster,Ian J., Method and system for testing RFID devices.
  99. Voutilainen, Jukka; Partanen, Juho; Tuominen, Jesse, Method for characterizing the radio link of RFID tags.
  100. Okamoto,Michio; Morinaga,Yuichi; Ikeda,Yuji; Saito,Takeshi, Method for manufacturing electronic tag.
  101. Sampson, David E.; Forte, Steven L., Method for shuffling and dealing cards.
  102. Hayden, Leonard; Martin, John; Andrews, Mike, Method of assembling a wafer probe.
  103. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth, Method of constructing a membrane probe.
  104. Weakley,T. Craig; Forster,Ian J., Method of determining performance of RFID devices.
  105. Scheper, Paul K.; Grauzer, Attila; Kelly, James V.; Stasson, James B.; Swanson, Ronald R.; Bourbour, Feraidoon; Nelson, Troy D.; Lopez, David B.; Yoseloff, Mark L.; Dunn, R. Brooke; Krenn, Peter; Blaha, Ernst, Method of readying a card shuffler.
  106. Smith, Kenneth R., Method of replacing an existing contact of a wafer probing assembly.
  107. Forster,Ian J., Method of variable position strap mounting for RFID transponder.
  108. Czyzewski, Zbigniew; Zvercov, Vladislav; Grauzer, Attila, Methods and apparatuses for an automatic card handling device and communication networks including same.
  109. Czyzewski, Zbigniew; Zvercov, Vladislav; Grauzer, Attila, Methods and apparatuses for an automatic card handling device and communication networks including same.
  110. Shanton,Kenneth, Methods and systems for in-line RFID transponder testing.
  111. Kelly, James V.; Zvercov, Vladislav; Miller, Brian, Methods for automatically generating a card deck library and master images for a deck of cards, and a related card processing apparatus.
  112. Hessing, Lynn; Mahoney, Daniel J.; Blad, Steven J.; Baker, Thompson A., Methods for handling playing cards with a card handling device.
  113. Grauzer, Attila; Scheper, Paul K.; Swanson, Ronald R., Methods for shuffling cards and rack assemblies for use in automatic card shufflers.
  114. Grauzer, Attila; Blaha, Ernst; Krenn, Peter; Scheper, Paul K., Methods of handling cards and of selectively delivering bonus cards.
  115. Grauzer, Attila; Bourbour, Feraidoon; Nelson, Troy D.; Rynda, Robert J.; Scheper, Paul K.; Stasson, James B.; Swanson, Ronald R., Methods of randomizing cards.
  116. Heinze,Eric T.; Haensgen,Gregg J.; Hofmeister,Christopher M., Mobile locator system and method.
  117. Heinze,Eric T.; Haensgen,Gregg J.; Gerner,Nathan J., Mobile locator system and method with wander management.
  118. Pessoa, Lucio F. C.; Pelley, III, Perry H., Multiple core system.
  119. Grauzer, Attila; Schubert, Oliver M.; Kelly, James V.; Stasson, James B.; Bourbour, Feraidoon; Scheper, Paul K.; Nelson, Troy D., Multiple mode card shuffler and card reading device.
  120. Horch, Andrew E., On die RFID tag antenna.
  121. Strid,Eric; Campbell,Richard, On-wafer test structures for differential signals.
  122. Lindhorst, Chad A.; Humes, Todd E.; Horch, Andrew E.; Allen, III, Ernest, One time programmable memory test structures and methods.
  123. Kuehl, Hartmut; Weyerhaeuser, Joerg; Windeln, Johannes, Packaging a semiconductor wafer.
  124. Castaneda, Jesus Alfonso; Behzad, Arya Reza; Rofougaran, Ahmadreza; Zhao, Sam Ziqun; Boers, Michael, Passive probing of various locations in a wireless enabled integrated circuit (IC).
  125. Haushalter, Todd M.; Wadds, Nathan J., Playing card handling devices, systems, and methods for verifying sets of cards.
  126. Haushalter, Todd M.; Wadds, Nathan J., Playing card handling devices, systems, and methods for verifying sets of cards.
  127. Sines, Randy D., Playing card shuffler.
  128. Sines, Randy D., Playing card shuffler.
  129. Sines, Randy D., Playing card shufflers and related methods.
  130. Rynda, Robert J.; Bourbour, Feraidoon; Swanson, Ronald R.; Grauzer, Attila, Playing card shuffling devices and related methods.
  131. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
  132. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
  133. Campbell,Richard L.; Andrews,Michael; Bui,Lynh, Probe for high frequency signals.
  134. Smith, Kenneth; Jolley, Michael; Van Syckel, Victoria, Probe head having a membrane suspended probe.
  135. Smith,Kenneth; Jolley,Michael; Van Syckel,Victoria, Probe head having a membrane suspended probe.
  136. Schwindt,Randy, Probe holder for testing of a test device.
  137. Nordgren, Greg; Dunklee, John, Probe station.
  138. Nordgren, Greg; Dunklee, John, Probe station.
  139. Peters, Ron A.; Hayden, Leonard A.; Hawkins, Jeffrey A.; Dougherty, R. Mark, Probe station having multiple enclosures.
  140. Peters,Ron A.; Hayden,Leonard A.; Hawkins,Jeffrey A.; Dougherty,R. Mark, Probe station having multiple enclosures.
  141. Cowan, Clarence E.; Tervo, Paul A.; Dunklee, John L., Probe station thermal chuck with shielding for capacitive current.
  142. Dunklee,John; Cowan,Clarence E., Probe station with low inductance path.
  143. Lesher, Timothy; Miller, Brad; Cowan, Clarence E.; Simmons, Michael; Gray, Frank; McDonald, Cynthia L., Probe station with low noise characteristics.
  144. Navratil,Peter; Froemke,Brad; Stewart,Craig; Lord,Anthony; Spencer,Jeff; Runbaugh,Scott; Fisher,Gavin; McCann,Pete; Jones,Rod, Probe station with two platens.
  145. Lesher, Timothy E., Probe testing structure.
  146. Smith, Kenneth R.; Hayward, Roger, Probing apparatus with impedance optimized interface.
  147. Forster,Ian J., RFID application test systems and methods.
  148. Forster,Ian J., RFID communication systems and methods.
  149. Forster,Ian J.; Weakley,Thomas C., RFID device test thresholds systems and methods.
  150. Forster,Ian J., RFID device tester and method.
  151. Forster,Ian J., RFID device variable test systems and methods.
  152. Green, Alan; Benoit, Dennis Rene, RFID label technique.
  153. Green, Alan; Benoit, Dennis Rene, RFID label technique.
  154. Moore, Scott E., RFID material tracking method and apparatus.
  155. Moore, Scott E., RFID material tracking method and apparatus.
  156. Moore, Scott E., RFID material tracking method and apparatus.
  157. Moore, Scott E., RFID material tracking method and apparatus.
  158. Moore, Scott E., RFID material tracking method and apparatus.
  159. Moore,Scott E., RFID material tracking method and apparatus.
  160. Moore,Scott E., RFID material tracking method and apparatus.
  161. Scott,Jeffrey Wayne, RFID receiver apparatus and method.
  162. Glidden,Robert M.; Hara,Dennis Kiyoshi; Oliver,Ronald A.; Kuhn,Jay A.; Hyde,John D., RFID tag design with circuitry for wafer level testing.
  163. Hara,Dennis Kiyoshi; Glidden,Robert M., RFID tag with bist circuits.
  164. Gutnik,Vadim; Hyde,John D.; Dressler,David D.; Pesavento,Alberto; Oliver,Ronald A.; Cooper,Scott Anthony; Sundstrom,Kurt Eugene, RFID tags with electronic fuses for storing component configuration data.
  165. Forster,Ian J., RFID test interface systems and methods.
  166. Forster,Ian J., RFID testing and classification systems and methods.
  167. Cirkel,Cornelis Oene; Scheurwater,Pieter Cornelis Nicolaas, Reduced chip testing scheme at wafer level.
  168. Khandros, Igor Y.; Eldridge, Benjamin N., Remote test facility with wireless interface to local facilities.
  169. Khandros,Igor Y.; Eldridge,Benjamin N., Remote test facility with wireless interface to local test facilities.
  170. Smith, Kenneth R., Replaceable coupon for a probing apparatus.
  171. Takamiya, Makoto; Mizuno, Masayuki, Semiconductor integrated circuit apparatus, measurement result management system, and management server.
  172. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for high-frequency testing of a device under test.
  173. Gleason, K. Reed; Lesher, Tim; Strid, Eric W.; Andrews, Mike; Martin, John; Dunklee, John; Hayden, Leonard; Safwat, Amr M. E., Shielded probe for testing a device under test.
  174. Gleason,K. Reed; Lesher,Tim; Andrews,Mike; Martin,John, Shielded probe for testing a device under test.
  175. Gleason,K. Reed; Lesher,Tim; Andrews,Mike; Martin,John, Shielded probe for testing a device under test.
  176. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for testing a device under test.
  177. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for testing a device under test.
  178. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe with low contact resistance for testing a device under test.
  179. Stasson, James B.; Swanson, Ronald R.; Scheper, Paul K.; Nelson, Troy D.; Bourbour, Feraidoon; Grauzer, Attila, Shuffler and method of shuffling cards.
  180. Krenn, Peter; Blaha, Ernst, Shuffling devices including one or more sensors for detecting operational parameters and related methods.
  181. Rofougaran, Ahmadreza; Behzad, Arya Reza; Zhao, Sam Ziqun; Castaneda, Jesus Alfonso; Boers, Michael, Signal distribution and radiation in a wireless enabled integrated circuit (IC) using a leaky waveguide.
  182. Dunklee,John, Switched suspended conductor and connection.
  183. Giordano, Joseph; Murray, Jack, System and method for processing financial transactions.
  184. Bode,Udo Heinz Helmut; Bosco,Edward Michael; Gunther,William G.; Golicz,Roman; Golicz,Stefan G., System and method for validating radio frequency identification tags.
  185. Bosco, Edward Michael; Gunther, William G.; Golicz, Roman; Golicz, Stefan G., System and method for validating radio frequency identification tags.
  186. Tafas, Triantafyllos P.; Kim, Youngmin, System for automatically locating and manipulating positions on an object.
  187. Tafas,Triantafyllos P.; Kim,Youngmin, System for automatically locating and manipulating positions on an object.
  188. Wadds, Nathan; Helsen, Collin; Czyzewski, Zbigniew; Helgesen, James; Marsden, Russ, System for billing usage of a card handling device.
  189. Wadds, Nathan; Helsen, Colin; Czyzewski, Zbigniew; Helgesen, James; Marsden, Russ, System for billing usage of an automatic card handling device.
  190. Strid,Eric W.; Schappacher,Jerry B.; Carlton,Dale E.; Gleason,K. Reed, System for evaluating probing networks.
  191. Andrews, Peter; Hess, David, System for testing semiconductors.
  192. Nguyen,Thanh H., System, apparatus, and method for testing identification tags.
  193. Thomason, Gary S., Systems and methods for evaluating electromagnetic interference.
  194. Thomason,Gary S., Systems and methods for evaluating electromagnetic interference.
  195. Schmidt,Dominik J., Systems and methods for testing wireless devices.
  196. Schmidt,Dominik J., Systems and methods for testing wireless devices.
  197. Khandros,Igor Y.; Eldridge,Benjamin N.; Miller,Charles A.; Sporck,A. Nicholas, Systems and methods for wireless semiconductor device testing.
  198. Negishi, Kazuki; Hansen, Mark, Test apparatus for measuring a characteristic of a device under test.
  199. Reyes,Ray A.; Schmoke,David L.; Sherwood,Edward, Test fixture for evaluating RF identification system and related methods.
  200. Hwan, Lu-Chen, Test module for radio frequency identification chips and method of the same.
  201. Campbell, Richard, Test structure and probe for differential signals.
  202. Campbell,Richard, Test structure and probe for differential signals.
  203. Dokai, Yuya; Kato, Noboru, Test system for radio frequency IC devices and method of manufacturing radio frequency IC devices using the same.
  204. Khandros, Igor Y.; Eldridge, Benjamin N.; Miller, Charles A.; Sporck, A. Nicholas, Test system with wireless communications.
  205. Khandros, Igor Y.; Eldridge, Benjamin N.; Miller, Charles A.; Sporck, A. Nicholas, Testing an electronic device using test data from a plurality of testers.
  206. Pessoa, Lucio F. C.; Pelley, III, Perry H., Testing of multiple integrated circuits.
  207. Rumbaugh,Scott, Thermal optical chuck.
  208. Lourens,Ruan; Eagar,Layton W.; Cooper,Russell Eugene, Time signal receiver and decoder.
  209. Hyde,John D.; Glidden,Robert M.; Horch,Andrew Edward; Kuhn,Jay A.; Oliver,Ronald A., Wafer level testing for RFID tags.
  210. Hayden, Leonard; Martin, John; Andrews, Mike, Wafer probe.
  211. Hayden,Leonard; Martin,John; Andrews,Mike, Wafer probe.
  212. Hayden,Leonard; Martin,John; Andrews,Mike, Wafer probe.
  213. Schwindt, Randy J.; Harwood, Warren K.; Tervo, Paul A.; Smith, Kenneth R.; Warner, Richard H., Wafer probe station having a skirting component.
  214. Schwindt,Randy J.; Harwood,Warren K.; Tervo,Paul A.; Smith,Kenneth R.; Warner,Richard H., Wafer probe station having a skirting component.
  215. Harwood, Warren K.; Tervo, Paul A.; Koxxy, Martin J., Wafer probe station having environment control enclosure.
  216. Harwood,Warren K.; Tervo,Paul A.; Koxxy,Martin J., Wafer probe station having environment control enclosure.
  217. Hsu, Wen Cheng; Lo, Min Ming; Wang, Chao Chien; Cho, Yi Fang, Wafer testing system integrated with RFID techniques and thesting method thereof.
  218. Campbell, Richard, Wideband active-passive differential signal probe.
  219. Castaneda, Jesus Alfonso; Behzad, Arya Reza; Rofougaran, Ahmadreza; Zhao, Sam Ziqun; Boers, Michael, Wireless communicating among vertically arranged integrated circuits (ICs) in a semiconductor package.
  220. Castaneda, Jesus Alfonso; Behzad, Arya Reza; Rofougaran, Ahmadreza; Zhao, Sam Ziqun; Boers, Michael, Wireless communicating among vertically arranged integrated circuits (ICs) in a semiconductor package.
  221. Citrano, III, Joseph; Toepke, Todd M.; Dewey, Alan R.; Russell, III, Alden C.; Armstrong, Stephen; Llewellyn, Craig T.; Baker, David J.; Harris, Stuart A., Wireless field maintenance adapter.
  222. Horch,Andrew E., Wireless functional testing of RFID tag.
  223. Moore, Brian, Wireless radio frequency technique design and method for testing of integrated circuits and wafers.
  224. Moore, Brian, Wireless radio frequency technique design and method for testing of integrated circuits and wafers.
  225. Moore,Brian, Wireless radio frequency technique design and method for testing of integrated circuits and wafers.
  226. Khandros, Igor Y.; Eldridge, Benjamin N.; Miller, Charles A.; Sporck, A. Nicholas, Wireless test system.
  227. Khandros,Igor Y.; Eldridge,Benjamin N.; Sporck,A. Nicholas; Miller,Charles A., Wireless test system.
  228. Pesavento, Alberto, pFET nonvolatile memory.
  229. Pesavento, Alberto; Hyde, John D., pFET nonvolatile memory.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로