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Determining a depth 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06K-009/36
출원번호 US-0464745 (1999-12-16)
발명자 / 주소
  • Wallack Aaron S.
출원인 / 주소
  • Cognex Corporation
대리인 / 주소
    Miele
인용정보 피인용 횟수 : 28  인용 특허 : 22

초록

A three dimensional image is derived from two-dimensional images. At least one of the two-dimensional images has a predetermined number of pixels. Depth measurements are derived from the two-dimensional images. The number of derived depth measurements is substantially equal to the predetermined numb

대표청구항

[ What is claimed is:] [1.]1. A method for analyzing pixel image information of a three-dimensional object to produce depth information, the depth information representing relative positions of respective points along a surface of said object, the relative positions being defined along a direction p

이 특허에 인용된 특허 (22)

  1. Stern Howard (Greenlawn NY), Arrangement for improved scanned 3-D measurement.
  2. Schmidt Richard (Huntington NY), Arrangement for rapid depth measurement using lens focusing.
  3. Wakai Hideyuki (Hiratsuka JPX) Mizoguchi Kiyokazu (Hiratsuka JPX) Suzuki Toru (Hiratsuka JPX) Terada Keiji (Hiratsuka JPX) Moriya Masato (Hiratsuka JPX) Ando Manabu (Hiratsuka JPX) Shio Koji (Hiratsu, Confocal optical apparatus.
  4. Netzer Yishay,ILX, Depth sensing camera systems and methods.
  5. Sissom Bradley ; Sussman Michael, Depth-from-defocus optical apparatus with invariance to surface reflectance properties.
  6. Sanderson Arthur C. (Williamstown MA) Weiss Lee E. (Pittsburgh PA) Nayar Shree K. (Pittsburgh PA), Fiber optic solder joint inspection system.
  7. Sussman Michael, Ghost image extinction in an active range sensor.
  8. Cosnard Eric (La Peyrouse-Fossat FRX) Steuperaert Jan (Le Faget FRX), High-resolution compact optical sensor for scanning three-dimensional shapes.
  9. Manthey David W. (Troy NY) Lee Daeyong (Loudonville NY), Method and apparatus for determining surface profile and/or surface strain.
  10. Svetkoff Donald J. (Ann Arbor MI) Rohrer Donald K. (Whitmore Lake MI) Noblett David A. (Agoura CA) Jackson Robert L. (Moorpark CA), Method and system for triangulation-based, 3-D imaging utilizing an angled scaning beam of radiant energy.
  11. Nakagawa Yasuo (Chigasaki PA JPX) Nayer Shree K. (Pittsburgh PA), Method of detecting solid shape of object with autofocusing and image detection at each focus level.
  12. Derndinger Eberhard (Aalen DEX) Grosskopf Rudolf E. (Konigsbronn DEX) Knupfer Klaus (Essingen DEX), Optical device with an illuminating grid and detector grid arranged confocally to an object.
  13. Lange Steven R. (Tucson AZ), Phase shifting device and method.
  14. Gordon Steven J. (Boston MA), Real time three dimensional sensing system.
  15. Nayar Shree K. (Pittsburgh PA), Robotic vision system.
  16. Nakagawa Yasuo (Yokohama JPX) Makihira Hiroshi (Yokohama JPX) Ikeda Souhei (Hadano JPX) Ezaki Satoru (Hadano JPX) Harada Osamu (Odawara JPX), Shape detecting apparatus.
  17. Griffel Giora, Socketless drip preventing candle holder.
  18. Nayar Shree K. (Pittsburgh PA) Sanderson Arthur C. (Williamstown MA) Weiss Lee E. (Pittsburgh PA) Simon David A. (Pittsburgh PA), Solder joint inspection system and method.
  19. Nayar Shree K. (Pittsburgh PA) Ikeuchi Katsushi (Pittsburgh PA) Kanade Takeo (Pittsburgh PA), Surface shape and reflectance extraction system.
  20. Sussman Michael, System for obtaining a uniform illumination reflectance image during periodic structured illumination.
  21. Kerstens Pieter J. (Beacon NY) Mandeville Jon R. (Redmond WA) Wu Frederick Y. (Cos Cob CT), Tandem linear scanning confocal imaging system with focal volumes at different heights.
  22. Svetkoff Ronald J. (Ann Arbor MI) Rohrer Donald K. (Whitmore Lake MI) Kelley Robert W. (Ann Arbor MI), Triangulation-based 3D imaging and processing method and system.

이 특허를 인용한 특허 (28)

  1. Kriesel, Marshall S., Apparatus and methods for the volumetric and dimensional measurement of livestock.
  2. Gerstner, Volker; Hecht, Frank; Lange, Ralph; Bloos, Helmut, Assembly for increasing the depth discrimination of an optical imaging system.
  3. Tzur, Meir, Depth estimation based on interpolation of inverse focus statistics.
  4. Tzur, Meir, Depth estimation based on interpolation of inverse focus statistics.
  5. Rapaport, Guy; Tzur, Meir; Baxansky, Artemy, Depth from defocus calibration.
  6. Satoh,Kiyohide, Depth information measurement apparatus and mixed reality presentation system.
  7. Haugen, Paul R., Enhanced illumination control for three-dimensional imaging.
  8. Pomerantz, Ori, Focus-based edge detection.
  9. Fishbaine,David, High speed optical image acquisition system with extended dynamic range.
  10. Tzur, Meir, Image capture for later refocusing or focus-manipulation.
  11. Skunes, Timothy A.; Fishbaine, David, Inspection system with vibration resistant video capture.
  12. Dotsenko,Elena V., Lighting correction for the outdoor environment with extension to the self adjusting algorithm for general lighting conditions.
  13. Pavlidis,Theo; Joseph,Eugene; He,Duanfeng; Hatton,Edward; Lu,Kefei, Measurement of dimensions of solid objects from two-dimensional image(s).
  14. Manstein, Dieter; Anderson, Richard, Method and apparatus for dermatological treatment and fractional skin resurfacing.
  15. Troxler, Robert Ernest, Method and apparatus for determining a characteristic of a construction material.
  16. Neeper, Robert K., Method and device for compensation for dimensional variations in low temperature sample group holders.
  17. Tzur, Meir; Rapaport, Guy, Method for progressively determining depth from defocused images.
  18. Fisher, Lance K.; Haugen, Paul R., Method for three-dimensional imaging using multi-phase structured light.
  19. Troxler, Robert Ernest; Pratt, Jr., James Daniel, Method of determining a dimension of a sample of a construction material and associated apparatus.
  20. Bryll, Robert K.; Delaney, Mark L., Optical aberration correction for machine vision inspection systems.
  21. Bryll, Robert K.; Delaney, Mark L., Optical aberration correction for machine vision inspection systems.
  22. Bryll, Robert Kamil, Optical aberration correction for machine vision inspection systems.
  23. Troxler, Robert Ernest, Optical method and apparatus for determining a characteristic such as volume and density of an excavated void in a construction material.
  24. Kranz, David M.; Rudd, Eric P.; Fishbaine, David; Haugan, Carl E., Phase profilometry system with telecentric projector.
  25. Rudd, Eric P.; Haugan, Carl E., Rapid-firing flashlamp discharge circuit.
  26. Godbaz, John Peter; Bamji, Cyrus S.; Schmidt, Mirko, Specular reflection removal in time-of-flight camera apparatus.
  27. Tzur, Meir; Levy, Noam, System and method for real time 2D to 3D conversion of a video in a digital camera.
  28. Merrill,M. Stanley; Combs,Ted; Sutton,Richard, Vehicle wheel alignment by rotating vision sensor.
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