IPC분류정보
| 국가/구분 |
United States(US) Patent
등록
|
| 국제특허분류(IPC7판) |
|
| 출원번호 |
US-0403386
(1999-10-21)
|
| 우선권정보 |
BE0000366 (1997-04-21) |
| 국제출원번호 |
PCT/BE98/00055
(1998-04-15)
|
| §371/§102 date |
20000203
(20000203)
|
| 국제공개번호 |
WO-9848241
(1998-10-29)
|
|
발명자
/ 주소 |
|
| 출원인 / 주소 |
- N.V. Krypton Electronic Engineering, BEX
|
| 대리인 / 주소 |
|
| 인용정보 |
피인용 횟수 :
15 인용 특허 :
9 |
초록
▼
The invention concerns a method for determining the position of a point, in which use is made of a holder (1) with a measuring point (6) and at least three reference points (2, 3, 4), where said measuring point (6) is placed against the point which it is wished to measure, the position of said refer
The invention concerns a method for determining the position of a point, in which use is made of a holder (1) with a measuring point (6) and at least three reference points (2, 3, 4), where said measuring point (6) is placed against the point which it is wished to measure, the position of said reference points (2, 3, 4) is measured and the position of said point is calculated, in which use is made of a holder (1) on which the position of said measuring point (6) is determined by holding the latter at a fixed point, rotating the holder (1) in various relative positions, then measuring the positions of the reference points (2, 3, 4) for at least two different positions of the holder (1), and calculating the relative position of the measuring point (6) with respect to the reference points (2, 3, 4).
대표청구항
▼
[ What is claimed is:] [1.]1. Method for determining the position of a point, in which use is made of a holder (1) with a measuring point (6) and at least three reference points (2, 3, 4) not in a straight line, where said measuring point (6) is placed against the point which is to be measured, the
[ What is claimed is:] [1.]1. Method for determining the position of a point, in which use is made of a holder (1) with a measuring point (6) and at least three reference points (2, 3, 4) not in a straight line, where said measuring point (6) is placed against the point which is to be measured, the position of said reference points (2, 3, 4) is then measured, and on the basis of the position of said reference points (2, 3, 4), the position of said point is calculated, whereby the position of said measuring point (6) is determined by holding the latter at a fixed point, rotating the holder (1) in various positions, then measuring the positions of the reference points (2, 3, 4) for at least two different positions of the holder (1), and calculating the relative position of the measuring point (6) with respect to the reference points (2, 3, 4) from the measured positions of said reference points (2, 3, 4).
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