|국가/구분||United States(US) Patent 등록|
|미국특허분류(USC)||702/095 ; 702/094 ; 702/104 ; 356/139.03 ; 356/375|
|발명자 / 주소|
|출원인 / 주소|
|대리인 / 주소||
|인용정보||피인용 횟수 : 22 인용 특허 : 16|
The photogrammetric measurement system is positioned at a vantage point to detect and calibrate its reference frame to the external reference frame demarcated by light-reflecting retroreflective target dot on a spherical target. A tetrahedron framework with the spherical target mounted on one of the vertices serves as a reference target that is placed in front of the non-contact sensor to be calibrated. The photogrammetric measurement system reads and calibrates the position of the retroreflective target dot (and thus the tetrahedron) while the structure...
[ What is claimed is:] [1.]1. A sensor calibration system for calibrating a non-contact sensor with respect to an external reference frame, the non-contact sensor of the type having a sensing zone associated with a sensor reference frame comprising:a reference indicia disposed in fixed relation to said external reference frame;a photogrammetric measurement system having a calibration field of observation associated with a photogrammetric reference frame, said photogrammetric measurement system being positionable at a vantage point such that said referenc...