초록 ▼

A system and method for imaging a sample labeled with a material having a strong light scattering and reflecting properties are provided. A typical material having strong light scattering and reflecting properties is a metal colloid. The imaging system employs a light scattering and reflecting illum

A system and method for imaging a sample labeled with a material having a strong light scattering and reflecting properties are provided. A typical material having strong light scattering and reflecting properties is a metal colloid. The imaging system employs a light scattering and reflecting illumination technique. The sample can be imaged with reflection mode imaging along or with a combination of reflection mode and scatter mode imaging.

대표청구항 ▼

[ We claim:] [1.]1. An instrument comprising:a first light source providing reflection mode light to a sample;a second light source providing diffuse scattering light to said sample;a detector; anda computer configured to interact with said detector such that said detector detects light reflected fr

[ We claim:] [1.]1. An instrument comprising:a first light source providing reflection mode light to a sample;a second light source providing diffuse scattering light to said sample;a detector; anda computer configured to interact with said detector such that said detector detects light reflected from said sample in response to application of light from said first light source and said detector detects reemitted light in response to application of light from said second light source;wherein said instrument is configured to cause the first light source to provide reflection mode light to the sample during a first time period, and to cause the second light source to provide diffuse scattering light to said sample during a time period other than said first time period.