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Charge measuring instrument for flexible materials 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01R-027/60
  • G01N-027/62
출원번호 US-0192760 (1998-11-16)
발명자 / 주소
  • Abramsohn Dennis A.
  • Eckstrom Lois A.
  • Foley Diane M.
출원인 / 주소
  • Xerox Corporation
대리인 / 주소
    Wagley
인용정보 피인용 횟수 : 3  인용 특허 : 28

초록

An apparatus for measuring triboelectric charge applied by a material to a flexible member is provided. The apparatus includes a frame and a drum. The drum is used for mounting the member to an external periphery thereof. The drum is rotatably mounted to the frame. The apparatus also includes a mech

대표청구항

[ We claim:] [1.]1. A testing apparatus for measuring triboelectric charge applied by a material to a flexible member, where the material is operably associated and positionable with respect to the member and the material includes a portion adapted to be in intimate contact with the member at a posi

이 특허에 인용된 특허 (28)

  1. Raj Guru B. (Fairport NY), Adaptive process controller for electrophotographic printing.
  2. Pazda Robert J. (Waterloo NY) Clum Kenneth L. (Webster NY) Hood ; III Harrison P. (Rochester NY), Apparatus and method for measuring lateral charge distribution on a moving web.
  3. Pazda Robert J. (Waterloo NY) Clum Kenneth L. (Webster NY), Apparatus for measuring surface charge on a sheet or web.
  4. Barnaby Harold T. (Duncanville TX), Apparatus for measuring the resistivity of a sample.
  5. Raj Guru B. ; Budnik Roger W. ; Pacer James M., Background detection and compensation.
  6. Runion Derwood L. (Rte. 2 ; Box 300 Timberville VA 22853), Bird beak growth control feeder.
  7. Mizoe Kiyoshi,JPX ; Aita Shuichi,JPX ; Arahira Fumihiro,JPX ; Hano Yoshifumi,JPX, Charging member having bristless, process cartridge, and electrophotographic apparatus employing such a charging membe.
  8. Gatzlaff Harold (4545 - 200th St. East Prior Lake MN 55372) Post William E. (708 Meadow Ridge NW. Canton OH 44708), Coating defect detector system.
  9. Lee Su-In (Seoul KRX) Lym Young-Taek (Kangnam-gu KRX), Developing device with agitation member and elastic member.
  10. Mallory Chester L. (Campbell CA) Johnson Walter (San Jose CA) Lehman Kurt (San Mateo CA), Eddy current test method and apparatus for measuring conductance by determining intersection of lift-off and selected cu.
  11. Yano ; Takashi, Electrophotographic exposure and development system.
  12. Mestha Lingappa K. ; Padmanabhan Prasad, Electrostatic control with compensation for coupling effects.
  13. Smith William C. (Las Cruces NM), Electrostatic discharge test apparatus.
  14. Tsujita Mitsuji (Osaka JPX) Tanaka Nariaki (Osaka JPX) Tanaka Yuji (Osaka JPX) Terada Takashi (Osaka JPX) Terada Takuji (Osaka JPX), Image forming apparatus capable of changing the surface potential of a photosensitive member.
  15. Ohtsuka Yasumasa (Yokohama JPX) Asai Jun (Kawasaki JPX) Murasawa Yoshihiro (Kawasaki JPX) Sasame Hiroshi (Tokyo JPX) Ohkubo Masaharu (Yokohama JPX), Image forming apparatus for forming a visual image in accordance with image signals.
  16. Hyakutake Nobuo,JPX ; Enomoto Yoshihiro,JPX ; Fujita Tetsuya,JPX ; Yoshihara Kazuhiro,JPX, Image forming apparatus having induced charge density suppressing device for preventing electrostatic hysteresis phenome.
  17. Nagashima Nao (Tokyo JPX), Image forming apparatus provided with surface potential control device.
  18. Kawashima Masatoshi (Ohme JPX) Takechi Makoto (Tokorozawa JPX) Odani Hiroshi (Koganei JPX), LST logic circuit.
  19. Mestha Lingappa K., Look up table to control non-linear xerographic process.
  20. Scheuer Mark A. (Williamson NY), Maintaining precise electrostatic control using two ESVs.
  21. Edelman Piotr ; Hoff Andrew M. ; Jastrzebski Lubek ; Lagowski Jacek, Measurement of the mobile ion concentration in the oxide layer of a semiconductor wafer.
  22. Wedeven Lavern D. (One Old Covered Bridge Rd. Newtown Square PA 19073), Method and apparatus for comprehensive evaluation of tribological materials.
  23. Carr James R. (Puyallup WA) Sarr Dennis P. (Kent WA), Method and apparatus for gap measurement between a graphite/epoxy structure and a metallic model.
  24. Gitis Norm ; Levinson Leo ; Dorfman Vlad ; Vinogradov Michael, Method and apparatus for measuring friction and wear characteristics of materials.
  25. Miyakawa Seiichi (Tokyo JPX) Tatsumi Susumu (Tokyo JPX) Sakamoto Koji (Tokyo JPX), Method of maintaining the correct conditions of an electrophotographically duplicated image.
  26. Mestha Lingappa K., Method to model a xerographic system.
  27. Urbanek Karel (Atherton CA) Kren George J. (Los Altos CA) Wheeler William R. (Saratoga CA), Non-contacting resistivity instrument with structurally related conductance and distance measuring transducers.
  28. Dechene Ronald L. (Boxford MA) Newton Robert E. (Tewksbury MA), On line triboelectric probe contamination detector.

이 특허를 인용한 특허 (3)

  1. DePaso, Joseph M., Conveyor system, belt, and method for measuring and controlling static electricity.
  2. Blair, Christopher D.; Jaskowiak, Timothy R., Roll having glass coating.
  3. Fletcher, Gerald; de Jong, Joannes N. M.; Knausdorf, Peter J., System and method for adjusting an electrostatic field in an inkjet printer.
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