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Electronic measurement instrument probe accessory offset, gain, and linearity correction method 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01D-003/024
출원번호 US-0055014 (1998-04-03)
발명자 / 주소
  • Baker Clifford E.
출원인 / 주소
  • Tektronix, Inc.
대리인 / 주소
    Griffith
인용정보 피인용 횟수 : 18  인용 특허 : 21

초록

A correction method for an electronic instrument accessory probe utilizes an error correction equation wherein at least one term contains an exponent less than unity. One simple such equation is: S=Cs.sup.2 +Bs+A+b.vertline.s.vertline..sup.x (where 0

대표청구항

[ What is claimed is:] [1.]1. A method for compensating for offset, gain, and linearity errors in a measured signal, s, sent from an probe accessory to an electronic measurement instrument via a conductive pathway, said probe accessory serving the function of monitoring one or more of electrical par

이 특허에 인용된 특허 (21)

  1. McEachern Alexander (Oakland CA) Nitz Frederic W. (Boulder Creek CA) Terry Scott C. (Redwood Shores CA), Apparatus for digital calibration of detachable transducers.
  2. Hedeen Robert A. (Clifton Park NY), Calibrator and calibration method for computationally compensating for phase mismatch in sound intensity probes.
  3. Meinema Ate. J. (Roden NLX), Catheter sensor and memory unit.
  4. Ohkura Tadahiro (Yokohama JPX) Yoshida Toshiyuki (Yokohama JPX) Kainuma Mitsuru (Yokohama JPX) Aoki Kazuo (Yokohama JPX), Connector for measuring apparatus.
  5. Staley ; III John R. (Corona CA), Coupling radiant energy/electric current transducers to processors.
  6. McBean ; Sr. Ronald V. (551 W. Kent Dr. Chandler AZ 85224), Instrumentation system with multiple sensor modules.
  7. McBean Ronald V. (891 S. Paradise Dr. Gilbert AZ 85233), Instrumentation system with multiple sensor modules providing accuracy code information.
  8. McBean ; Sr. Ronald V. (551 W. Kent Dr. Chandler AZ 85224), Instrumentation system with multiple sensor modules providing calibration date information.
  9. Hata Yoogo (Otawara JPX), Measuring device.
  10. Mofachern Alexander (Oakland CA), Method and apparatus for calibrating transducer/amplifier systems.
  11. Regimand Ali (Raleigh NC), Method and system for transferring calibration data between calibrated measurement instruments.
  12. Nguyen Bich (San Jose CA) Schipper John F. (Palo Alto CA), Multiple variable compensation for transducers.
  13. French Patrick D., Portable data collection device with self identifying probe.
  14. Medelius Pedro J. ; Hallberg Carl G. ; Simpson ; III Howard J. ; Thayer Stephen W., Self-calibrating and remote programmable signal conditioning amplifier system and method.
  15. McBean Ronald V. (891 S. Paradise Dr. Gilbert AZ 85233), Self-calibrating instrumentation system with multiple sensor modules.
  16. Tripp Roger M. (Newbury Park CA) Woods Dennis J. (Reseda CA), Self-calibrating sensor.
  17. Eckardt Dieter (Nuremberg DEX) Hettich Gerhard (Rosstal DEX) Schmid Hans-Dieter (Nuremburg DEX), Sensor for measuring physical dimensions and process for balancing the sensor.
  18. Houvig Felix J. (Wayne PA), Sensor output correction circuit.
  19. Butenko R. Bruce (Bellevue WA) Sprague Randall B. (Redmond WA) Bateman Charles D. (Bellevue WA), Transducer memory circuit.
  20. Respaut James E. (Hampstead NH), Transducer with integral memory.
  21. Morys Marian, Universal measuring instrument with signal processing algorithm encapsulated into interchangeable intelligent detectors.

이 특허를 인용한 특허 (18)

  1. Dall'Aglio, Carlo, Apparatus and methods for measuring the pin diameter of a crankshaft at the place of grinding.
  2. Dall'Aglio, Carlo; Cipriani, Riccardo, Apparatus for checking diametral dimensions of a cylindrical part in orbital motion in a numerical control grinding machine.
  3. Dall'Aglio, Carlo; Cipriani, Riccardo, Apparatus for checking diametral dimensions of cylindrical parts rotating with an orbital motion.
  4. Fagot-Revurat, Lionel, Calibration method for SAW sensors.
  5. Dmytriw, Anthony M.; Ricks, Lamar F., Flow sensor with conditioning-coefficient memory.
  6. Arnold, Yan, Measuring device.
  7. Arnold, Yan, Measuring device.
  8. Volk, Raimund, Measuring device.
  9. Seewig, Jörg, Measuring device with calibration.
  10. Dall'Aglio, Carlo; Cipriani, Riccardo, Method for checking the diameter of a cylindrical part in orbital motion.
  11. Wegmann, Heinz, Method for determining the shape of a workpiece.
  12. Sessego, Raimondo P.; Jones, Peter T.; Paransun, Seyed K.; Stanley, James D.; McWhorter, William D., Methods and apparatus for calibrating transducer-including devices.
  13. Bey, Paul Prehn; Hoover, William; Speldrich, Jamie; Jones, Ryan, Modular sensor assembly including removable sensing module.
  14. Crook,David T.; Tesdahl,Curtis A, Probe based information storage for probes used for opens detection in in-circuit testing.
  15. Kohn, Oliver; Claus, Thomas; Bennini, Fouad, Rotation rate sensor and method for calibrating a rotation rate sensor.
  16. Dmytriw, Anthony M.; Ricks, Lamar F., Signal conditioning IC with conditioning-coefficient memory.
  17. Hickman, Barton T., Smart probe apparatus and method for automatic self-adjustment of an oscilloscope's bandwidth.
  18. Barrilado, Andres; Jones, Peter T.; Lestringuez, Stephane; Paransun, Seyed K.; Sessego, Raimondo P.; Stanley, James D., Transducer-including devices, and methods and apparatus for their calibration.
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