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Wafer cleaning apparatus 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • B08B-001/04
출원번호 US-0440223 (1999-11-15)
발명자 / 주소
  • Donald Edgar Stephens
  • Oliver David Jones
  • Hugo John Miller, III
출원인 / 주소
  • Lam Research Corporation
대리인 / 주소
    Martine & Penilla, LLP
인용정보 피인용 횟수 : 10  인용 특허 : 29

초록

An apparatus for cleaning a wafer oriented vertically is provided. The apparatus includes a first brush and a second brush located horizontally from the first brush. During use, a wafer is oriented vertically the first and second brushes. The brushes are brought into contact with the wafer and rotat

대표청구항

1. A substrate cleaning apparatus, comprising:a first brush; a second brush located horizontally from said first brush; a first roller and a second roller located vertically below said first brush and said second brush; a first brush positioner for moving said first brush from a first position to a

이 특허에 인용된 특허 (29)

  1. Dexter Jeffrey L. (North Dartmouth MA) Fairweather William E. (Mattapoisett MA) Shurtleff Harold R. (Buzzards Bay MA), Apparatus and method for cleaning wafers.
  2. de Larios John Martin ; Ravkin Mikhail ; Gardner Douglas Grant, Apparatus for a brush assembly.
  3. Onodera Masami (Niigata JPX), Apparatus for cleaning and drying hard disk substrates.
  4. Gill ; Jr. Gerald L. (1812 Peaceful Mesa Prescott AZ 86301), Apparatus for cleaning semiconductor wafers.
  5. Scharpf Mike A. (4624 Buehring Rd. Oshkosh WI 54901), Apparatus for washing and drying phonograph records.
  6. Hillman Gary (Livingston NJ) Devico Michael J. (Chatham NJ), Automated single cassette load mechanism for scrubber.
  7. Kudo Hideo (Fukushima JPX) Uchiyama Isao (Fukushima JPX) Kimura Yoshiharu (Niigata JPX) Suzuki Morie (Fukushima JPX) Tanakajima Takashi (Gunma JPX), Automatic cleaning apparatus for wafers.
  8. Thrasher David L. (Santa Clara CA) Ryle Lynn (Santa Clara CA), Automatically adjustable brush assembly for cleaning semiconductor wafers.
  9. Uchiyama Isao (Fukushima-ken JPX) Nakano Masami (Fukushima-ken JPX) Takamatu Hiroyuki (Fukushima-ken JPX) Suzuki Morie (Fukushima-ken JPX), Brush cleaning apparatus and cleaning system for disk-shaped objects using same.
  10. Akimoto Masami (Kumamoto JPX), Cleaning apparatus for cleaning reverse surface of semiconductor wafer.
  11. Yonemizu Akira (Kumamoto JPX) Akimoto Masami (Kumamoto JPX), Cleaning apparatus for cleaning substrates.
  12. Suzuki Shizuo (Oume JPX) Yokosuka Noriyoshi (Iruma JPX), Cleaning device for a wafer mount plate.
  13. Thrasher David L. ; Hearne John S. ; Ryle Lynn S., Contamination control in substrate processing system.
  14. Lutz Rick A. (San Jose CA), Double-sided wafer scrubber with a wet submersing silicon wafer indexer.
  15. Krusell Wilbur C. ; Larson Lane L., Drip chemical delivery method and apparatus.
  16. Ryle Lynn S. (San Jose CA) Ruppell Robert M. (Cupertino CA) Thrasher David L. (Santa Clara CA) McGrath Martin J. (Sunnyvale CA), Method and apparatus for detecting a substrate in a substrate processing system.
  17. Simmons Mark A. (San Jose CA), Method and apparatus for resetting individual processes in a control system.
  18. Lutz Rick A. (San Jose CA), Method for wafer scrubbing.
  19. Yamashita Hiromi (Tokyo JPX) Wada Toshio (Tokyo JPX), Method of cleaning a photo-mask.
  20. Holley Brian (Wappingers Falls NY) Sauer Andrew (Sherman CT) Schmitt Herman (Hopewell Jct. NY), Method of cleaning brushes used in post CMP semiconductor wafer cleaning operations.
  21. Simmons Mark A. (San Jose CA) Krusell Wilbur C. (San Jose CA), Process for brush cleaning.
  22. Curcio, Joseph J., Scrubbing torque monitoring and control system.
  23. Thrasher David L. ; Ryle Lynn S. ; Ruppell Robert M. ; Hearne John S. ; Krussell Wilbur C. ; Youre Gary D., Substrate processing system.
  24. Stephens Donald Edgar ; Jones Oliver David ; Miller ; III Hugo John, Wafer cleaning apparatus.
  25. Frey Bernhard M., Wafer cleaning system.
  26. Itzkowitz Herman, Wafer scrubbing device.
  27. Itzkowitz Herman (Montgomery PA), Wafer scrubbing device.
  28. Jones Oliver David, Wafer spin dryer and method of drying a wafer.
  29. Maekawa Toshiro,JPX, Washing installation including plural washers.

이 특허를 인용한 특허 (10)

  1. Benesch, Robert; Haouchine, Malik; Jacksier, Tracey, Articles of manufacture containing increased stability low concentration gases and methods of making and using the same.
  2. Benesch, Robert; Haouchine, Malik; Jacksier, Tracey, Articles of manufacture containing increased stability low concentration gases and methods of making and using the same.
  3. Benesch, Robert; Haouchine, Malik; Jacksier, Tracey, Articles of manufacture containing increased stability low concentration gases and methods of making and using the same.
  4. Jacksier, Tracey; Benesch, Robert, Increased stability low concentration gases, products comprising same, and methods of making same.
  5. Jacksier, Tracey; Benesch, Robert; Haouchine, Malik, Reactive gases with concentrations of increased stability and processes for manufacturing same.
  6. Jacksier, Tracey; Benesch, Robert; Haouchine, Malik, Reactive gases with concentrations of increased stability and processes for manufacturing same.
  7. Jacksier,Tracey; Benesch,Robert; Kuhn,John, Reduced moisture compositions comprising an acid gas and a matrix gas, articles of manufacture comprising said compositions, and processes for manufacturing same.
  8. Jacksier,Tracey; Benesch,Robert; Kuhn,John, Reduced moisture compositions comprising an acid gas and a matrix gas, articles of manufacture comprising said compositions, and processes for manufacturing same.
  9. Yudovsky, Joseph; Tepman, Avi; Reynolds, Kenneth R.; Achkire, Younes; Marohl, Dan A.; Ghanayem, Steve G.; Polyak, Alexander S.; Ettinger, Gary; Zhang, Haochuan; Chen, Hui, Scrubber box and methods for using the same.
  10. Andros, Nicholas, Surface charge controlling apparatus for wafer cleaning.
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