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Semiconductor device and method of manufacturing the same 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-023/48
  • H01L-023/52
  • H01L-029/40
출원번호 US-0915398 (1997-08-20)
우선권정보 JP-0219987 (1996-08-21)
발명자 / 주소
  • Minakshisundaran Balasubramanian Anand JP
출원인 / 주소
  • Kabushiki Kaisha Toshiba JP
대리인 / 주소
    Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
인용정보 피인용 횟수 : 37  인용 특허 : 7

초록

In the present invention, the bonding pad is formed in a lattice-like shape. Directly underneath the passivation layer, the etching stopper layer is provided. An opening is made through the passivation layer and the etching stopper layer so as to expose the bonding pad. The cavity sections of the la

대표청구항

1. A semiconductor device comprising:a semiconductor substrate; a semiconductor element formed on said semiconductor substrate; a first insulating layer formed above said semiconductor element and having a flat upper surface, a plurality of first grooves and a second groove formed therein, said plur

이 특허에 인용된 특허 (7)

  1. Wollesen Donald L. (Saratoga CA), High conductivity interconnection line.
  2. Harada Shigeru (Hyogo-ken JPX) Hagi Kimio (Hyogo-ken JPX) Tsumura Kiyoaki (Hyogo-ken JPX), Process of passivating a semiconductor device bonding pad by immersion in O2 or O3 solution<.
  3. Harada Shigeru (Hyogo-ken JPX) Endoh Takemi (Hyogo-ken JPX) Ishida Tomohiro (Hyogo-ken JPX), Semiconductor device and method of manufacturing thereof.
  4. Satoh Shinichi (Hyogo JPX) Ozaki Hiroji (Hyogo JPX) Kimura Hiroshi (Hyogo JPX) Wakamiya Wataru (Hyogo JPX) Tanaka Yoshinori (Hyogo JPX), Semiconductor device having bonding pad comprising buffer layer.
  5. Satoh Shinichi (Hyogo JPX) Ozaki Hiroji (Hyogo JPX) Kimura Hiroshi (Hyogo JPX) Wakamiya Wataru (Hyogo JPX) Tanaka Yoshinori (Hyogo JPX), Semiconductor device having bonding pad comprising buffer layer.
  6. Langley Rodney C. (Boise ID), Semiconductor device with improved bond pads.
  7. Cochran William T. (New Tripoli PA) Garcia Agustin M. (Allentown PA) Hills Graham W. (Allentown PA) Yeh Jenn L. (Macungie PA), Semiconductor devices having multi-level metal interconnects.

이 특허를 인용한 특허 (37)

  1. Li, Shaoping; Rudy, Steven C.; Bertero, Gerardo A.; Ding, Yunfei; Beaudry, Christopher L., Apparatus and method for middle shield connection in magnetic recording transducers.
  2. Li, Shaoping; Bertero, Gerardo A.; Rudy, Steven C.; He, Shihai; Mao, Ming; Xi, Haiwen; Ganesan, Srikanth; Leng, Qunwen; Yi, Ge; Xiao, Rongfu; Liu, Feng; Wang, Lei, Apparatuses and methods for providing thin shields in a multiple sensor array.
  3. Li, Shaoping; Bertero, Gerardo A.; Mallary, Michael L.; Yi, Ge; Rudy, Steven C., Connection schemes for a multiple sensor array usable in two-dimensional magnetic recording.
  4. Yamamoto, Koji; Kumamoto, Nobuhisa; Matsumoto, Muneyuki, Damascene interconnection and semiconductor device.
  5. Yamamoto,Koji; Kumamoto,Nobuhisa; Matsumoto,Muneyuki, Damascene interconnection and semiconductor device.
  6. Agarwala,Birendra N.; Coker,Eric M.; Correale, Jr.,Anthony; Rathore,Hazara S.; Sullivan,Timothy D.; Wachnik,Richard A., Dual-damascene metallization interconnection.
  7. Li, Shaoping; Rudy, Steven C.; Yi, Ge; Bertero, Gerardo A.; Leng, Qunwen; Mao, Ming, Electrical connection arrangement for a multiple sensor array usable in two-dimensional magnetic recording.
  8. Saito,Tatsuyuki; Noguchi,Junji; Yamaguchi,Hizuru; Owada,Nobuo, Fabrication process for a semiconductor integrated circuit device.
  9. Rogers, Harvey Newell; Kintis, Mark, Inexpensive wafer level MMIC chip packaging.
  10. Collins, David S.; Joseph, Alvin; Lindgren, Peter J.; Stamper, Anthony K.; Watson, Kimball M., Metal wiring structure for integration with through substrate vias.
  11. Collins, David S.; Joseph, Alvin; Lindgren, Peter J.; Stamper, Anthony K.; Watson, Kimball M., Metal wiring structure for integration with through substrate vias.
  12. Lee,Ellis; Huang,Yimin; Yew,Tri Rung, Method making bonding pad.
  13. Chen,Sheng Hsiung, Method of improving copper pad adhesion.
  14. Suzuki,Kazuhisa; Koide,Kazuo; Takahashi,Toshiro, Method of manufacturing a semiconductor integrated circuit device having a plurality of wiring layers and mask-pattern generation method.
  15. Brunnett, Donald; Bertero, Gerardo A.; Li, Shaoping, Multi-sensor array configuration for a two-dimensional magnetic recording (TDMR) operation.
  16. Li, Shaoping; Bertero, Gerardo A.; Yi, Ge; Mallary, Michael L.; Leng, Qunwen; Champion, Eric J., Multiple sensor array usable in two-dimensional magnetic recording.
  17. Wu,Bing Chang, Semiconductor chip capable of implementing wire bonding over active circuits.
  18. Wu,Bing Chang; Wang,Kun Chih; Chao,Mei Ling; Chen,Shiao Shien, Semiconductor chip capable of implementing wire bonding over active circuits.
  19. Wu,Bing Chang; Wang,Kun Chih; Chao,Mei Ling; Chen,Shiao Shien, Semiconductor chip capable of implementing wire bonding over active circuits.
  20. Hatano,Keisuke; Abiru,Takahisa, Semiconductor device.
  21. Akiyama, Kazutaka, Semiconductor device and manufacturing method thereof.
  22. Watanabe, Kenichi; Ikeda, Masanobu; Kimura, Takahiro, Semiconductor device and method for manufacturing the same.
  23. Watanabe, Kenichi; Ikeda, Masanobu; Kimura, Takahiro, Semiconductor device and method for manufacturing the same.
  24. Watanabe, Kenichi; Ikeda, Masanobu; Kimura, Takahiro, Semiconductor device and method for manufacturing the same.
  25. Wada, Makoto; Higashi, Kazuyuki, Semiconductor device and method of fabricating the same.
  26. Nozu,Tetsuro, Semiconductor device and semiconductor apparatus.
  27. Watanabe,Kenichi, Semiconductor device capable of suppressing current concentration in pad and its manufacture method.
  28. Hirano, Hiroshige; Ota, Yukitoshi; Itoh, Yutaka, Semiconductor device having a pad.
  29. Anand, Minakshisundaran Balasubramanian, Semiconductor device having a plurality of conductive layers.
  30. Morozumi, Yukio, Semiconductor devices and methods for manufacturing the same.
  31. Furuhata, Tomoyuki, Semiconductor devices having contact pads and methods of manufacturing the same.
  32. Saito, Tatsuyuki; Noguchi, Junji; Yamaguchi, Hizuru; Owada, Nobuo, Semiconductor integrated circuit device and fabrication process thereof.
  33. Saito, Tatsuyuki; Noguchi, Junji; Yamaguchi, Hizuru; Owada, Nobuo, Semiconductor integrated circuit device and fabrication process thereof.
  34. Rudy, Steven C.; Li, Shaoping; Bertero, Gerardo A.; Mallary, Michael L.; Li, Donghong; Zhang, Yingbo, Shield designed for middle shields in a multiple sensor array.
  35. Bachman, Mark A.; Bitting, Donald S.; Chittipeddi, Sailesh; Kang, Seung H.; Merchant, Sailesh M., Solder bump structure for flip chip semiconductor devices and method of manufacturing therefore.
  36. Kim, Sang Young, Test pattern for reliability measurement of copper interconnection line having moisture window and method for manufacturing the same.
  37. Yamamoto,Hiroshi, Wiring structure of a semiconductor integrated circuit and a method of forming the wiring structure.

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