초록 ▼

A programmable voltage divider has normal and test modes of operation. The divider includes first and second supply nodes, a divider node that provides a data value, and a first divider element that is coupled between the first supply node and the divider node. The divider also includes a controlled

A programmable voltage divider has normal and test modes of operation. The divider includes first and second supply nodes, a divider node that provides a data value, and a first divider element that is coupled between the first supply node and the divider node. The divider also includes a controlled node, a second divider element that has a selectable resistivity and that is coupled between the divider node and the controlled node, and a test circuit that is coupled between the controlled node and the second supply node. During the normal mode of operation, the first and second divider elements generate the data value having a first logic level when the second divider element has a first resistivity, and generate the data value having a second logic level when the second divider element has a second resistivity. The test circuit generates a first voltage at the controlled node during the normal mode of operation, and generates a second voltage at the controlled node during the test mode of operation. The test circuit may generate the first and second voltages by varying its impedance, or by switching in and out one or more fixed voltages.

대표청구항 ▼

1. A semiconductor device, comprising:a circuit including a programmable voltage divider having normal and test modes of operation, the programmable voltage divider comprising: first and second supply nodes; a divider node operable to provide a data value; a first divider element coupled between sai

1. A semiconductor device, comprising:a circuit including a programmable voltage divider having normal and test modes of operation, the programmable voltage divider comprising: first and second supply nodes; a divider node operable to provide a data value; a first divider element coupled between said first supply node and said divider node; a controlled node; a second divider element coupled between said divider node and said controlled node, said second divider element having a selectable resistivity; and a test circuit coupled between said controlled node and said second supply node, said test circuit operable to generate a voltage at said controlled node during said normal mode of operation and to vary said voltage during said test mode of operation.