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[미국특허] Device in a process system for detecting events 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G05B-013/02
출원번호 US-0303869 (1999-05-03)
발명자 / 주소
  • Evren Eryurek
  • Jogesh Warrior
출원인 / 주소
  • Rosemount Inc.
대리인 / 주소
    Westman, Champlin & Kelly, P.A.
인용정보 피인용 횟수 : 164  인용 특허 : 157

초록 ▼

A process device couples to a process control loop. The process device receives process signals. A memory in the process device contains a nominal parameter value and a rule. Computing circuitry calculates a statistical parameter of the process signal and operates on the statistical parameter and th

대표청구항 ▼

1. A process device coupled to a process control loop configured to control a process fluid, comprising: a process variable input to receive a process variable of the process control loop, the process variable related to the process; a process event input to receive a process event generated by a p

이 특허에 인용된 특허 (157) 인용/피인용 타임라인 분석

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  117. Mathiowetz,Brad N.; Russell, III,Alden C., One-handed operation of a handheld field maintenance tool.
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  118. Weatherhead, N. Andrew; Kaufman, Philip John, Patterns employed for module design.
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  119. Dillon, Steven R.; Rome, Gregory H., Personalized plant asset data representation and search system.
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  120. Mathiowetz, Brad N., Physical memory handling for handheld field maintenance tools.
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  123. Eryurek,Evren; Kavaklioglu,Kadir, Pressure transmitter with diagnostics.
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  124. Paik,Young J., Process control by distinguishing a white noise component of a process variance.
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  138. Padhi,Deenesh; Gandikota,Srinivas; Naik,Mehul; Parikh,Suketu A.; Dixit,Girish A., Selective metal encapsulation schemes.
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  139. Selli, Basilio, Sensor arrangements and methods of determining a characteristic of a sample fluid using such sensor arrangements.
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  140. Miller, John P., Simplified algorithm for abnormal situation prevention in load following applications including plugged line diagnostics in a dynamic process.
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  141. Miller, John Philip, Simplified algorithm for abnormal situation prevention in load following applications including plugged line diagnostics in a dynamic process.
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  142. Balentine, James R.; Dicaire, Andre A.; Scott, Cindy A.; Lattimer, Donald Robert; Schibler, Kenneth; Shepard, John R.; Jundt, Larry O., Software lockout coordination between a process control system and an asset management system.
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  143. Weatherhead, N. Andrew; Carmount, Mark K.; Wei, Jennifer; Meyer, Kenneth Carl; Mauk, Ronald L., Standard MES interface for discrete manufacturing.
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  145. Miller, John P.; Lundeberg, Marcus R., Statistical signatures used with multivariate analysis for steady-state detection in a process.
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  146. Miller, John Philip, Statistical signatures used with multivariate statistical analysis for fault detection and isolation and abnormal condition prevention in a process.
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  147. Heavner, III, Louis W.; Sharpe, Jr., Joseph H.; Eryurek, Evren; Kavaklioglu, Kadir, System and method for detecting an abnormal situation associated with a heater.
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