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Multilayer dielectric stack and method 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-029/76
출원번호 US-0502420 (2000-02-11)
발명자 / 주소
  • Yanjun Ma
  • Yoshi Ono
출원인 / 주소
  • Sharp Laboratories of America, Inc.
대리인 / 주소
    Matthew D. Rabdau
인용정보 피인용 횟수 : 242  인용 특허 : 5

초록

A multilayer dielectric stack is provided which has alternating layers of a high-k material and an interposing material. The presence of the interposing material and the thinness of the high-k material layers reduces or eliminate effects of crystallization within the high-k material, even at relativ

대표청구항

1. An integrated circuit (IC) structure for an IC comprising a multilayer dielectric stack comprising:a) a first dielectric layer comprising a first dielectric material overlying a semiconductor substrate, wherein the first dielectric material is selected from the group consisting of ZrO2, and HfO2;

이 특허에 인용된 특허 (5)

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