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Method of forming multilevel interconnect structure containing air gaps including utilizing both sacrificial and placeholder material 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-021/8234
출원번호 US-0652754 (2000-08-31)
발명자 / 주소
  • Alfred Grill
  • Jeffrey Curtis Hedrick
  • Christopher Vincent Jahnes
  • Satyanarayana Venkata Nitta
  • Kevin S. Petrarca
  • Sampath Purushothaman
  • Katherine Lynn Saenger
  • Stanley Joseph Whitehair
출원인 / 주소
  • International Business Machines Corporation
대리인 / 주소
    Scully, Scott, Murphy & Presser
인용정보 피인용 횟수 : 106  인용 특허 : 8

초록

A method for forming a multilayer interconnect structure on a substrate that include interconnected conductive wiring and vias spaced apart by a combination of solid or gaseous dielectrics. The inventive method includes the steps of: (a) forming a first planar via plus line level pair embedded in a

대표청구항

1. A method for forming a multilayer interconnect structure on a substrate, said structure comprising interconnected conductive wiring and vias spaced apart by a combination of solid and gaseous dielectrics, said method comprising the steps of:(a) forming on a substrate a first planar via plus line

이 특허에 인용된 특허 (8)

  1. Grabbe Dimitry (2160 Rosedale Ave. Middletown PA 17057), Ball grid array socket.
  2. Honn ; James J. ; Stuby ; Kenneth P., Electrical package for LSI devices and assembly process therefor.
  3. Fredrickson Toby Alan, Interface structure for an integrated circuit device tester.
  4. Buynoski Matthew S., Low dielectric semiconductor device with rigid lined interconnection system.
  5. Akram Salman ; Farnworth Warren M. ; Wood Alan G., Method for fabricating a semiconductor interconnect with laser machined electrical paths through substrate.
  6. Jin Changming ; Luttmer Joseph D., Method of forming integrated circuit dielectric by evaporating solvent to yield phase separation.
  7. McKenzie ; Jr. Joseph A. (6330 Laura La. Pleasanton CA 94566), Self-masking socket pin carrier for printed circuit boards.
  8. Matsumura Shigeru,JPX, Socket for measuring a ball grid array semiconductor.

이 특허를 인용한 특허 (106)

  1. Geffken,Robert M.; Motsiff,William T., Adjustable self-aligned air gap dielectric for low capacitance wiring.
  2. Geffken,Robert M.; Motsiff,William T., Adjustable self-aligned air gap dielectric for low capacitance wiring.
  3. Lur,Water; Lee,David; Wang,Kuang Chih; Yang,Ming Sheng, Air gap for dual damascene applications.
  4. Liou,Huey Chiang, Air gap integration.
  5. Park, Hyun-Mog; Kloster, Grant M., Air gap interconnect method.
  6. Park,Hyun Mog; Kloster,Grant M., Air gap interconnect structure and method.
  7. Cheng, Kangguo; Haigh, Thomas J.; Li, Juntao; Liniger, Eric G.; Mehta, Sanjay C.; Nguyen, Son V.; Park, Chanro; Yamashita, Tenko, Air gap spacer formation for nano-scale semiconductor devices.
  8. Cheng, Kangguo; Haigh, Thomas J.; Li, Juntao; Liniger, Eric G.; Mehta, Sanjay C.; Nguyen, Son V.; Park, Chanro; Yamashita, Tenko, Air gap spacer formation for nano-scale semiconductor devices.
  9. Hsu, Sheng Teng; Pan, Wei, Air gaps copper interconnect structure.
  10. Latchford, Ian S.; Bencher, Christopher D.; Armacost, Michael D.; Weidman, Timothy; Ngai, Christopher, Airgap for semiconductor devices.
  11. Franosch, Martin; Meckes, Andreas; Nessler, Winfried; Oppermann, Klaus-Gunter, Apparatus for housing a micromechanical structure.
  12. Franosch,Martin; Meckes,Andreas; Nessler,Winfried; Oppermann,Klaus Gunter, Apparatus for housing a micromechanical structure and method for producing the same.
  13. Chiu, Chia-Pin; Qian, Zhiguo; Manusharow, Mathew J., Bridge interconnect with air gap in package assembly.
  14. Chiu, Chia-Pin; Qian, Zhiguo; Manusharow, Mathew J., Bridge interconnect with air gap in package assembly.
  15. Chiu, Chia-Pin; Qian, Zhiguo; Manusharow, Mathew J., Bridge interconnect with air gap in package assembly.
  16. Saenger,Katherine L; Surendra,Maheswaran; Karecki, legal representative,Anna Dorothy; Nitta,Satya V; Purushothaman,Sampath; Colburn,Matthew E; Dalton,Timothy J; Huang,Elbert; Karecki,Simon M, Closed air gap interconnect structure.
  17. Gosset, Laurent; Pontcharra, Jean Raymond Jacques Marie; Gaillard, Frederic, Control of localized air gap formation in an interconnect stack.
  18. Kloster, Grant; Leu, Jihperng; Park, Hyun-Mog, Creating air gap in multi-level metal interconnects using electron beam to remove sacrificial material.
  19. Stamper, Anthony K.; Cooney, III, Edward C.; Gambino, Jeffrey P.; Dalton, Timothy J.; Fitzsimmons, John A.; Nicholson, Lee M., Damascene interconnect structures including etchback for low-k dielectric materials.
  20. Nguyen,Son Van; Armacost,Michael D.; Naik,Mehul; Dixit,Girish A.; Yieh,Ellie Y., Dielectric materials to prevent photoresist poisoning.
  21. Ben Tzur,Mira; Ramkumar,Krishnaswamy, Dual-damascene process and associated floating metal structures.
  22. Cohen, Adam L.; Lockard, Michael S.; Kim, Kieun; Le, Qui T.; Zhang, Gang; Frodis, Uri; McPherson, Dale S.; Smalley, Dennis R., Electrochemical fabrication methods incorporating dielectric materials and/or using dielectric substrates.
  23. Trivedi, Vishal P.; John, Jay P., Electronic device including interconnects with a cavity therebetween and a process of forming the same.
  24. Trivedi, Vishal P.; John, Jay P., Electronic device including interconnects with a cavity therebetween and a process of forming the same.
  25. Goodner,Michael D.; O'Brien,Kevin P.; Kloster,Grant M., Formation of air gaps in an interconnect structure using a thin permeable hard mask and resulting structures.
  26. Huang, Richard J.; Dakshina-Murthy, Srikanteswara; Fisher, Philip A.; Tabery, Cyrus E.; You, Lu, Formation of amorphous carbon ARC stack having graded transition between amorphous carbon and ARC material.
  27. MacNeil,John; Ishaq,Sajid; Gris,Herv?; Giles,Katherine, Forming low k dielectric layers.
  28. Pamler,Werner; Schwarzl,Siegfried; Gabric,Zvonimir, Hollow structure in an integrated circuit and method for producing such a hollow structure in an integrated circuit.
  29. Field, Dean L.; Stone, Charles N.; Bruner, Michael W., Integrated circuit having one or more conductive devices formed over a SAW and/or MEMS device.
  30. Torres, Joaquin; Gosset, Laurent-Georges, Integration of self-aligned trenches in-between metal lines.
  31. Gaillard, Frederic; Xia, Li-Qun; Yieh, Ellie; Fisher, Paul; Gotuaco, Margaret, Integration scheme for dual damascene structure.
  32. Horak, David V.; Koburger, Charles W.; Ponoth, Shom; Yang, Chih-Chao, Interconnect structures and methods for back end of the line integration.
  33. Horak, David V.; Koburger, III, Charles W.; Ponoth, Shom; Yang, Chih-Chao, Interconnect structures and methods for back end of the line integration.
  34. Bell,Scott A.; Dakshina Murthy,Srikanteswara; Lyons,Christopher F., Ion implantation to modulate amorphous carbon stress.
  35. Seamons,Martin Jay; Yeh,Wendy H.; Rathi,Sudha S. R.; Padhi,Deenesh; Luan,Andy (Hsin Chiao); Tang,Sum Yee Betty; Kulkarni,Priya; Sivaramakrishnan,Visweswaren; Kim,Bok Hoen; M'Saad,Hichem; Wang,Yuxiang May; Kwan,Michael Chiu, Liquid precursors for the CVD deposition of amorphous carbon films.
  36. Wang, Ping-Chuan; Brelsford, Kevin H.; Filippi, Ronald, Low dielectric constant material reinforcement for improved electromigration reliability.
  37. Kloster,Grant M.; Morrow,Xiarong; Leu,Jihperng, Low-K dielectric structure and method.
  38. Vrtis, Raymond Nicholas; Wu, Dingjun; O'Neill, Mark Leonard; Bitner, Mark Daniel; Vincent, Jean Louise; Karwacki, Jr., Eugene Joseph; Lukas, Aaron Scott, Materials and methods of forming controlled void.
  39. Vrtis, Raymond Nicholas; Wu, Dingjun; O'Neill, Mark Leonard; Bitner, Mark Daniel; Vincent, Jean Louise; Karwacki, Jr., Eugene Joseph; Lukas, Aaron Scott, Materials and methods of forming controlled void.
  40. Lee, Jae Suk, Metal interconnection lines of semiconductor devices and methods of forming the same.
  41. Lee,Jae Suk, Metal interconnection lines of semiconductor devices and methods of forming the same.
  42. Huang, Richard J.; Bell, Scott A.; Dakshina Murthy, Srikanteswara; Fisher, Philip A.; Nguyen, Richard C.; Tabery, Cyrus E.; You, Lu, Method for forming integrated circuit.
  43. Usami, Tatsuya, Method for manufacturing a semiconductor device having an interconnect structure and a reinforcing insulating film.
  44. Wang, Yuxiang May; Rathi, Sudha S. R.; Kwan, Michael Chiu; M'Saad, Hichem, Method of depositing an amorphous carbon film for etch hardmask application.
  45. Fairbairn, Kevin; Rice, Michael; Weidman, Timothy; Ngai, Christopher S; Latchford, Ian Scot; Bencher, Christopher Dennis; Wang, Yuxiang May, Method of depositing an amorphous carbon layer.
  46. Fairbairn,Kevin; Rice,Michael; Weidman,Timothy; Ngai,Christopher S; Latchford,Ian Scot; Bencher,Christopher Dennis; Wang,Yuxiang May, Method of depositing an amorphous carbon layer.
  47. Fairbairn,Kevin; Rice,Michael; Weidman,Timothy; Ngai,Christopher S; Latchford,Ian Scot; Bencher,Christopher Dennis; Wang,Yuxiang May, Method of depositing an amorphous carbon layer.
  48. Stamper, Anthony K., Method of forming a semiconductor device.
  49. Stamper,Anthony K., Method of forming a semiconductor device having air gaps and the structure so formed.
  50. Stamper,Anthony K., Method of forming a semiconductor device having air gaps and the structure so formed.
  51. Hussein, Makarem A.; Moon, Peter; Powers, Jim; O'Brien, Kevin P., Method of forming an air gap intermetal layer dielectric (ILD) by utilizing a dielectric material to bridge underlying metal lines.
  52. Cai, Weizhong; Sudhama, Chandrasekhara; Wu, Yujing; Kamekona, Keith, Method of making a semiconductor device with a low permittivity region.
  53. Hsu, Sheng Teng; Pan, Wei, Method of making air gaps copper interconnect.
  54. Lin, Charles, Method of making an ultimate low dielectric device.
  55. Wong,Lawrence D.; Leu,Jihperng; Kloster,Grant; Ott,Andrew; Morrow,Patrick, Method of making semiconductor device using a novel interconnect cladding layer.
  56. Grove, Nicole R., Method of manufacturing a semiconductor device with an air gap formed using a photosensitive material.
  57. Siew, Yong-Kong, Method of manufacturing a wiring structure on a self-forming barrier pattern.
  58. Braeckelmann, Greg; Orlowski, Marius; Wild, Andreas, Method of sealing an air gap in a layer of a semiconductor structure and semiconductor structure.
  59. Lee, Kwangduk Douglas; Rathi, Sudha; Sankarakrishnan, Ramprakash; Seamons, Martin Jay; Jamil, Irfan; Kim, Bok Hoen, Methods of dry stripping boron-carbon films.
  60. Kim, Sun-Young; Song, Jun-Eui; Lim, Tae-Wan, Methods of forming semiconductor devices.
  61. Lee, Kyoung-Woo, Methods of forming wiring structures.
  62. Naujok, Markus; Wendt, Hermann; Gutmann, Alois; Pallachalil, Muhammed Shafi, Methods of manufacturing semiconductor devices.
  63. Naujok, Markus; Wendt, Hermann; Gutmann, Alois; Pallachalil, Muhammed Shafi, Methods of manufacturing semiconductor devices and structures thereof.
  64. Lee, Kwangduk Douglas; Rathi, Sudha; Chan, Chiu; Seamons, Martin J.; Kim, Bok Heon, Methods of removing a material layer from a substrate using water vapor treatment.
  65. Fisher, Philip A.; Plat, Marina V.; Yang, Chih-Yuh; Lyons, Christopher F.; Bell, Scott A.; Bonser, Douglas J.; You, Lu; Dakshina-Murthy, Srikanteswara, Modified film stack and patterning strategy for stress compensation and prevention of pattern distortion in amorphous carbon gate patterning.
  66. Wu, Ming Ting; Larsen, III, Rulon Joseph; Kim, Young; Kim, Kieun; Cohen, Adam L.; Kumar, Ananda H.; Lockard, Michael S.; Smalley, Dennis R., Multi-layer, multi-material fabrication methods for producing micro-scale and millimeter-scale devices with enhanced electrical and/or mechanical properties.
  67. Wu, Ming Ting; Larsen, III, Rulon J.; Kim, Young; Kim, Kieun; Cohen, Adam L.; Kumar, Ananda H.; Lockard, Michael S.; Smalley, Dennis R., Multi-layer, multi-material micro-scale and millimeter-scale devices with enhanced electrical and/or mechanical properties.
  68. Wu, Ming Ting; Larsen, III, Rulon J.; Kim, Young; Kim, Kieun; Cohen, Adam L.; Kumar, Ananda H.; Lockard, Michael S.; Smalley, Dennis R., Multi-layer, multi-material micro-scale and millimeter-scale devices with enhanced electrical and/or mechanical properties.
  69. Jahnes, Christopher V.; Nitta, Satyanarayana V.; Petrarca, Kevin S.; Saenger, Katherine L., Multilayer interconnect structure containing air gaps and method for making.
  70. Kim, Bok Hoen; Rathi, Sudha; Ahn, Sang H.; Bencher, Christopher D.; Wang, Yuxiang May; M'Saad, Hichem; Silvetti, Mario D.; Fung, Miguel; Jung, Keebum; Zhu, Lei, Nitrogen-free dielectric anti-reflective coating and hardmask.
  71. Latchford, Ian; Bencher, Christopher Dennis; Wang, Yuxiang; Silvetti, Mario Dave, Photolithography scheme using a silicon containing resist.
  72. Latchford,Ian; Bencher,Christopher Dennis; Wang,Yuxiang; Silvetti,Mario Dave, Photolithography scheme using a silicon containing resist.
  73. Kim, Yong-Bae, Process for reducing defects in copper-filled vias and/or trenches formed in porous low-k dielectric material.
  74. Pan, Wei; Hsu, Sheng Teng, Process of making dual damascene structures using a sacrificial polymer.
  75. Bencher, Christopher Dennis, Removable amorphous carbon CMP stop.
  76. Bencher, Christopher Dennis, Removable amorphous carbon CMP stop.
  77. Bencher,Christopher Dennis, Removable amorphous carbon CMP stop.
  78. Bencher,Christopher Dennis, Removable amorphous carbon CMP stop.
  79. Colburn, Matthew E.; Huang, Elbert E.; Nitta, Satyanarayana V.; Purushothaman, Sampath; Saenger, Katherine L., Robust ultra-low k interconnect structures using bridge-then-metallization fabrication sequence.
  80. Lavoie, Adrien R.; Fajardo, Arnel M.; Ramachandrarao, Vijayakumar S., Sealants for metal interconnect protection in microelectronic devices having air gap interconnect structures.
  81. Fisher, Philip A.; Lyons, Christopher F.; Dakshina-Murthy, Srikanteswara, Selective stress-inducing implant and resulting pattern distortion in amorphous carbon patterning.
  82. Dutta, Ashim; Akhtar, Mohd Kamran; Trapp, Shane J., Semiconductor constructions.
  83. Dutta, Ashim; Akhtar, Mohd Kamran; Trapp, Shane J., Semiconductor constructions.
  84. Aoyama,Junichi; Kobayashi,Toshio, Semiconductor device and wiring forming method in semiconductor device.
  85. Powers,James; O'Brien,Kevin P., Semiconductor device formed with an air gap using etch back of inter layer dielectric (ILD).
  86. Usami, Tatsuya, Semiconductor device having an interconnect structure and a reinforcing insulating film.
  87. Shimooka, Yoshiaki; Shibata, Hideki; Miyajima, Hideshi; Tomioka, Kazuhiro, Semiconductor device having multiple wiring layers and method of producing the same.
  88. Shimooka, Yoshiaki; Shibata, Hideki; Miyajima, Hideshi; Tomioka, Kazuhiro, Semiconductor device having multiple wiring layers and method of producing the same.
  89. Shimooka, Yoshiaki; Shibata, Hideki; Miyajima, Hideshi; Tomioka, Kazuhiro, Semiconductor device having multiple wiring layers and method of producing the same.
  90. Kim, Jun-Ki, Semiconductor device with air gap and method for fabricating the same.
  91. Naujok, Markus; Wendt, Hermann; Gutmann, Alois; Pallachalil, Muhammed Shafi, Semiconductor devices and structures thereof.
  92. Naujok, Markus; Wendt, Hermann; Gutmann, Alois; Pallachalil, Muhammed Shafi, Semiconductor devices and structures thereof.
  93. Briggs, Benjamin D.; Clevenger, Lawrence A.; DeProspo, Bartlet H.; Huang, Huai; Penny, Christopher J.; Rizzolo, Michael, Skip-vias bypassing a metallization level at minimum pitch.
  94. Briggs, Benjamin D.; Clevenger, Lawrence A.; DeProspo, Bartlet H.; Huang, Huai; Penny, Christopher J.; Rizzolo, Michael, Skip-vias bypassing a metallization level at minimum pitch.
  95. Wang, Pengfei; Zhang, Wei, Structure for interconnecting copper with low dielectric constant medium and the integration method thereof.
  96. Bhattacharyya,Arup; Farrar,Paul A., Techniques to create low K ILD for BEOL.
  97. Bhattacharyya,Arup; Farrar,Paul A., Techniques to create low K ILD for beol.
  98. Bhattacharyya,Arup; Farrar,Paul A., Techniques to create low K ILD forming voids between metal lines.
  99. Lin, Jing-Cheng; Shue, Shau-Lin, Thermal annealing/hydrogen containing plasma method for forming structurally stable low contact resistance damascene conductor structure.
  100. Vandroux,Laurent; Monchoix,Herve, Use of amorphous carbon film as a hardmask in the fabrication of optical waveguides.
  101. Fisher,Philip A.; Huang,Richard J.; Tabery,Cyrus E., Use of amorphous carbon for gate patterning.
  102. Dakshina Murthy,Srikanteswara; Bell,Scott A.; Huang,Richard J.; Nguyen,Richard C.; Tabery,Cyrus E., Use of multilayer amorphous carbon ARC stack to eliminate line warpage phenomenon.
  103. Singh, Kanwal Jit; Myers, Alan M., Via self alignment and shorting improvement with airgap integration capacitance benefit.
  104. Yu, Cheong-Sik; Lee, Kyung-Tae, Void boundary structures, semiconductor devices having the void boundary structures and methods of forming the same.
  105. Miller, Gregory D.; Bruner, Mike, Wafer-level seal for non-silicon-based devices.
  106. Lee, Kyoung-Woo, Wiring structures.
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