$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Method and apparatus for etching a semiconductor article and method of preparing a semiconductor article by using the same 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-021/302
  • H01L-021/461
출원번호 US-0217130 (1998-12-21)
우선권정보 JP-0361572 (1997-12-26)
발명자 / 주소
  • Nobuhiko Sato JP
출원인 / 주소
  • Canon Kabushiki Kaisha JP
대리인 / 주소
    Fitzpatrick, Cella, Harper and Scinto
인용정보 피인용 횟수 : 22  인용 특허 : 12

초록

With a method according to the invention, a semiconductor article such as an SOI substrate having on the surface thereof a single crystal silicon film formed on an insulator is etched by heat treatment in a hydrogen-containing reducing atmosphere in order to remove the surface by a desired height an

대표청구항

1. A method for etching a semiconductor article having a surface comprising silicon, said method comprising a step of heat-treating said silicon surface in a hydrogen-containing reducing atmosphere, while keeping said silicon surface in a state disposed opposite to a surface comprising silicon oxide

이 특허에 인용된 특허 (12)

  1. Henley Francois J. ; Cheung Nathan, Controlled cleavage process using pressurized fluid.
  2. Sato Nobuhiko,JPX, Method and apparatus for heat-treating an SOI substrate and method of preparing an SOI substrate by using the same.
  3. Mikata Yuuichi,JPX ; Nakao Takashi ; Tsunashima Yoshitaka, Method and apparatus for manufacturing a semiconductor device.
  4. Ichikawa Takeshi (Hachioji JPX), Method for controlling roughness on surface of monocrystal.
  5. Ohki Konomu (Gunma-ken JPX) Kanai Akio (Gunma-ken JPX) Tanaka Shinji (Nagano-ken JPX), Method for producing substrate to achieve semiconductor integrated circuits.
  6. Tomozane Mamoru (Scottsdale AZ) Liaw H. Ming (Scottsdale AZ), Method of forming a SIMOX structure.
  7. Ogino Nobuyoshi (Musashino JPX), Method of producing a bonded wafer.
  8. Sato Nobuhiko,JPX ; Yonehara Takao,JPX ; Sakaguchi Kiyofumi,JPX, Process for producing semiconductor substrate by heating to flatten an unpolished surface.
  9. Bruel Michel,FRX ; Poumeyrol Thierry,FRX, Process for the production of a structure having a thin semiconductor film on a substrate.
  10. Bruel Michel (Veurey FRX), Process for the production of thin semiconductor material films.
  11. Yonehara Takao (Atsugi JPX), Semiconductor member and process for preparing semiconductor member.
  12. Yamaga Kenichi (Sagamihara JPX) Mikata Yuichi (Kawasaki JPX) Yamamoto Akihito (Kanagawa JPX), Thermal processing method and apparatus therefor.

이 특허를 인용한 특허 (22)

  1. Matsutani, Tetsuya, Dry etching method.
  2. Lin, Wei; Skordas, Spyridon; Young, Jr., Robert R., Gas-controlled bonding platform for edge defect reduction during wafer bonding.
  3. Lin, Wei; Skordas, Spyridon; Young, Jr., Robert R., Gas-controlled bonding platform for edge defect reduction during wafer bonding.
  4. Lin, Wei; Skordas, Spyridon; Young, Jr., Robert R., Gas-controlled bonding platform for edge defect reduction during wafer bonding.
  5. Yagi, Shinichiro, Inspection device for crystal defect of silicon wafer and method for detecting crystal defect of the same.
  6. Roberds, Brian; Colinge, Cindy; Doyle, Brian, Method for bonding and debonding films using a high-temperature polymer.
  7. Dietrich, Harry; Dudek, Volker; Schueppen, Andreas, Method for manufacturing a silicon wafer.
  8. Dietrich, Harry; Dudek, Volker; Schueppen, Andreas, Method for manufacturing buried areas.
  9. Dietrich, Harry; Dudek, Volker; Schueppen, Andreas, Method for manufacturing components of an SOI wafer.
  10. Watanabe, Masahisa; Ishii, Katsutoshi; Shibata, Tetsuya, Method for removing metal impurity from quartz component part used in heat processing apparatus of batch type.
  11. Booske, John H.; Thompson, Keith J.; Gianchandani, Yogesh B.; Cooper, Reid F., Method of bonding a stack of layers by electromagnetic induction heating.
  12. Schwarzenbach,Walter; Maleville,Christophe; Ben Mohamed,Nadia, Method of detaching a layer from a wafer using a localized starting area.
  13. Unno, Akira; Sato, Naotake; Miyazaki, Hajime; Doi, Noriyuki, Organic semiconductor device, process for producing the same, and organic semiconductor apparatus.
  14. Schwarzenbach, Walter; Maleville, Christophe, Process for cleaving a wafer layer from a donor wafer.
  15. Ito, Masataka, SOI annealing method and SOI manufacturing method.
  16. Akiyama, Shoji; Kubota, Yoshihiro; Ito, Atsuo; Tanaka, Koichi; Kawai, Makoto; Tobisaka, Yuuji, SOQ substrate and method of manufacturing SOQ substrate.
  17. Chen, Shuqi; Chen, Lingjun, Sample processing methods.
  18. Notsu, Kazuya; Sato, Nobuhiko, Semiconductor member manufacturing method and semiconductor device manufacturing method.
  19. Notsu,Kazuya; Sato,Nobuhiko, Semiconductor member manufacturing method and semiconductor device manufacturing method.
  20. Gadkaree, Kishor Purushottam; Moore, Michael John; Stocker, Mark Andrew; Feng, Jiangwei; Mach, Joseph Frank, Semiconductor on glass insulator made using improved thinning process.
  21. Sakaguchi,Kiyofumi; Sato,Nobuhiko, Semiconductor substrate, semiconductor device, and method of manufacturing the same.
  22. Miyabayashi, Hiroshi; Sato, Nobuhiko; Ito, Masataka, Semiconductor-on-insulator annealing method.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로