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[미국특허] Hard disc drive verification tester 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01M-019/00
  • G06F-019/00
출원번호 US-0415598 (1999-10-08)
발명자 / 주소
  • Scott D. Ulrich
  • Cary D. Johnson
  • Morse Magnuson
  • Peter A. Sherrard
출원인 / 주소
  • Seagate Technology LLC
인용정보 피인용 횟수 : 46  인용 특허 : 20

초록

The present invention provides a portable on-site tester to test a disc drive at a location remote from the disc drive manufacturer. The tester supports multiple disc drive interfaces by supporting multiple drive initiator cards, one of which is selected for use at a time. A tester which controls op

대표청구항

1. A disc drive test apparatus, comprising:a tester; a local computer connected to the tester, the local computer operable to control the operation of the tester; a tester interface comprising part of the tester and communicatively coupled to the local computer; and one or more drive initiator cards

이 특허에 인용된 특허 (20) 인용/피인용 타임라인 분석

  1. Martin Stephen R. (San Jose CA) Mooney ; Jr. Randall O. (Boulder Creek CA), Active bus termination device.
  2. Konno Shigeo,JPX, Apparatus and method for diagnosing disk drives in disk array device.
  3. Hitchcock Glenn Daniel ; Prissel Lee Patrick, Apparatus and method for self generating error simulation test data from production code.
  4. Edwards David J. (Yorba Linda CA) Tillson John M. (Mission Viejo CA) Benning James K. (Mission Viejo CA), Automatic test system.
  5. Burckhartt David M. (Houston TX) Perez Lazaro D. (Houston TX) Emerson Theodore F. (Houston TX) Dow Randolph O. (Cypress TX) Stimac Gary A. (Montgomery TX), Computer failure recovery and alert system.
  6. Bezinque David J. (Santa Cruz County CA) McCornack Mark R. (Santa Clara County CA) Hammersley Michael E. (Santa Cruz County CA), Disc drive error mapping using threshold comparison methods.
  7. Cannata John W. ; Whitehouse Rodney K., Disk drive test sequence editor.
  8. Hoang Thanh V. ; Fontenot Paul, Driver level diagnostics.
  9. Magnuson Vernon P. (Canoga Park CA), Environmentally controlled media defect detection system for Winchester disk drives.
  10. Allen John H. (Orlando FL) Reif Robert S. (Orlando FL), Generic radar display.
  11. Wood Roy Lynn ; Eckerd Steven S., Measuring stiction and friction between the heads and discs of a hard disc drive.
  12. Stanley Thomas E. (Gilroy CA), Method and apparatus for addressing and testing more than two ATA/IDE disk drive assemblies using an ISA bus.
  13. Novotny Vlad Joseph, Method and apparatus for mechanical screening of magnetic recording disk drives.
  14. Elsing John W., Method and apparatus for testing a spindle in a disc drive.
  15. Klingsporn Benny J. (Spring TX) Fairchild Steven E. (Houston TX) Lundgreen Mark T. (Cypress TX) Geroche Michael R. (Tomball TX), Method for dynamically measuring computer disk error rates.
  16. Berger James K. (Malibu CA), Portable field test unit for computer data and program storage disc drive.
  17. Panesar Param (Santa Monica CA) Berger James K. (Santa Monica CA), Portable tester (qualifier) for evaluating and testing SCSI interface magnetic disc drives in accordance with ANSI SCSI-.
  18. Russello Vincent J. (West Haven CT), Programmable apparatus and method for testing computer peripherals.
  19. Paek Woon-Juk,KRX ; Kang Jeong-Min,KRX ; Ryoo Dae-Geun,KRX ; Sung Young-Bok,KRX ; Nam Chang-Woo,KRX, System for testing hard disk drives.
  20. Pence Donald Dean ; Raley Jay Francis, Variegated manufacturing process test method and apparatus.

이 특허를 인용한 특허 (46) 인용/피인용 타임라인 분석

  1. Bae,Min won; Moon,Sung uk; Choi,Jeong cheol, Apparatus for testing hard disk drive.
  2. Dickens, Louie A.; Johnson, Timothy A.; Owen, William W.; Sheret, Corinna J.; Valdez, Robert L., Apparatus, system, and method for simulating multiple hosts.
  3. Schulstad,Geir Olav, Automatically triggered snapshot data dump for storage unit with embedded system.
  4. Lee, Chun Liang, Back plane structure for SCSI.
  5. Noble, Scott; Garcia, Edward; Polyakov, Evgeny; Truebenbach, Eric L.; Merrow, Brian S., Bulk feeding disk drives to disk drive testing systems.
  6. Noble, Scott; Garcia, Edward; Polyakov, Evgeny; Truebenbach, Eric L.; Merrow, Brian S., Bulk feeding disk drives to disk drive testing systems.
  7. Truebenbach, Eric L., Bulk transfer of storage devices using manual loading.
  8. Truebenbach, Eric L., Bulk transfer of storage devices using manual loading.
  9. Martino, Peter, Damping vibrations within storage device testing systems.
  10. Merrow, Brian S.; Truebenbach, Eric L.; Smith, Marc Lesueur, Dependent temperature control within disk drive testing systems.
  11. Lin, Tao; Lin, Gang, Disk drive component test system.
  12. Merrow, Brian S.; Garcia, Edward; Polyakov, Evgeny, Disk drive transport, clamping and testing.
  13. Merrow, Brian S.; Garcia, Edward; Polyakov, Evgeny, Disk drive transport, clamping and testing.
  14. Merrow, Brian S.; Garcia, Edward; Polyakov, Evgeny, Disk drive transport, clamping and testing.
  15. Lin, Tao; Jen, Chih-Wu; Cheng, Chunjer C.; Lin, Gang H., Disk spindle assembly cartridge.
  16. Lin, Tao; Jen, Chih-Wu; Cheng, Chunjer Chuck; Lin, Gang Herbert, Disk spindle assembly cartridge.
  17. Arena, John Joseph; Suto, Anthony J., Electronic assembly test system.
  18. Merrow, Brian S., Enclosed operating area for disk drive testing systems.
  19. Merrow, Brian S., Enclosed operating area for storage device testing systems.
  20. Campbell, Philip; Wrinn, Joseph F., Engaging test slots.
  21. Cheng, Chunjer Chuck; Lin, Tao; Lin, Gang Herbert, Head stack assembly cartridge.
  22. Merrow, Brian S.; Akers, Larry W., Heating storage devices in a testing system.
  23. Edery, Yigal Mordechai; Vered, Nimrod Itzhak; Kroll, David R.; Touboul, Shlomo, Malicious mobile code runtime monitoring system and methods.
  24. Moon,Sung uk; Choi,Jeong cheol, Method and apparatus for communication via serial multi-port, and recording medium.
  25. Cheng, Chunjer Chuck; Lin, Tao; Lin, Gang Herbert, Method for test mounting a head stack assembly cartridge.
  26. Shin,Chang ick, Method of testing hard disk drive and computer readable medium therefor.
  27. Merrow, Brian S.; Akers, Larry W., Storage device temperature sensing.
  28. Merrow, Brian S.; Akers, Larry W., Storage device temperature sensing.
  29. Merrow, Brian S., Storage device testing system cooling.
  30. Merrow, Brian S., Storage device testing system cooling.
  31. Merrow, Brian S.; Akers, Larry W., Storage device testing system with a conductive heating assembly.
  32. Auerbach,Daniel Jonathan; Stanley,Thomas E., System and method for determining hard disk drive performance.
  33. Fan, Chiou-Lin; Huang, Ying-Chih; Chen, Chin-Feng, System for testing hard disks.
  34. Merrow, Brian S., Temperature control within disk drive testing systems.
  35. Merrow, Brian S., Temperature control within disk drive testing systems.
  36. Merrow, Brian S., Temperature control within storage device testing systems.
  37. Kao,Han Jung; Chen,Shih Chun; Lin,Chun Hsi; Lin,Chih Lang; Lee,ShyhShin, Test card for multiple functions testing.
  38. Merrow, Brian S.; Krikorian, Nicholas C., Test slot cooling system for a storage device testing system.
  39. Merrow, Brian S.; Krikorian, Nicholas C., Test slot cooling system for a storage device testing system.
  40. Merrow, Brian S., Thermal control system for test slot of test rack for disk drive testing system with thermoelectric device and a cooling conduit.
  41. Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring disk drives within disk drive testing systems.
  42. Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring disk drives within disk drive testing systems.
  43. Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring storage devices within storage device testing systems.
  44. Toscano, John; Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring storage devices within storage device testing systems.
  45. Toscano, John; Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring storage devices within storage device testing systems.
  46. Merrow, Brian S., Vibration isolation within disk drive testing systems.

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