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[미국특허] Method for manufacturing a disk drive 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G11B-005/455
  • G11B-005/127
출원번호 US-0873230 (1997-06-11)
발명자 / 주소
  • William Orson Butts
  • Mostafa Pakzad
  • Mohammad Sarraf
출원인 / 주소
  • Western Digital Technologies, Inc.
대리인 / 주소
    Milad G Shara, Esq.
인용정보 피인용 횟수 : 61  인용 특허 : 13

초록 ▼

A method for manufacturing a disk drive includes assembling the head disk assembly in a clean room, performing servo writing upon the head disk assembly in the clean room, and performing a head disk assembly test upon the head disk assembly in the clean room. The head disk assembly is then connected

대표청구항 ▼

1. A method for manufacturing a disk drive, the disk drive comprising a head disk assembly and a controller printed circuit board assembly (PCBA), the method comprising the steps of:a) while in a clean room: i) assembling the head disk assembly; ii) performing servo writing upon the head disk assemb

이 특허에 인용된 특허 (13) 인용/피인용 타임라인 분석

  1. Blyth Geoffrey C. (Broxbourne GB2), Automatic test systems.
    상세보기
  2. Davis Bradley K. (Meridian ID) Voorman Johannes O. (Geldrop NLX) Ramalho Joao N. V. L. (Eindhoven NLX) Gamand Patrice (Douvres-la-delivrande FRX), Circuit and method for testing a disk drive head assembly without probing.
    상세보기
  3. Waugh David C. (Oklahoma City OK) Rider Michael A. (Yukon OK), Detection of mechanical defects in a disc drive using resonant frequencies.
    상세보기
  4. Bezinque David J. (Santa Cruz County CA) McCornack Mark R. (Santa Clara County CA) Hammersley Michael E. (Santa Cruz County CA), Disc drive error mapping using threshold comparison methods.
    상세보기
  5. Magnuson Vernon P. (Canoga Park CA), Environmentally controlled media defect detection system for Winchester disk drives.
    상세보기
  6. Varaiya Rooshabh (Cupertino CA) Ng David S. (Saratoga CA) Pauker Armando (Sunnyvale CA) Ferchau Joerg U. (Morgan Hill CA), Fault tolerant modular subsystems for computers.
    상세보기
  7. McIlwraith George (Stone Mountain GA), Gasket and cabinet for providing EMI/RFI shielding.
    상세보기
  8. Crispin Norbert (Markgroeningen DEX) Schumacher Hartmut (Stuttgart DEX) Vogt Harald (Schwieberdingen DEX) Eisenbarth Rudolf (Salzgitter DEX), Manufacturing process for an electronic device.
    상세보기
  9. Sompel Mark A. (San Jose CA) Clawson William W. (Tracy CA) Hong Jason (Cupertino CA), Multiple servo sector sets write with self-verification for disk drive.
    상세보기
  10. Mahmoudian Mostafa (San Carlos CA) Buttar Jagdeep S. (Union City CA) Gergel Oleg A. (Mountain View CA) Motiska Neil (Danville CA), Noise detecting apparatus for magnetic heads.
    상세보기
  11. Jurgenson Ryan A. (Hutchinson MN), Rigid disk drive assembly method.
    상세보기
  12. Pekin David F. ; Machcha Ashok, Single test station that can test a flying height and electrical characteristics of a recording head.
    상세보기
  13. Rhodes James V. (Chandler AZ), Universal burn-in driver system and method therefor.
    상세보기

이 특허를 인용한 특허 (61) 인용/피인용 타임라인 분석

  1. Magsombol, Fernando A.; Amornmannun, Arnon; Ashametra, Saravut; Songwiroj, Nitipat, Adaptive tacking of head gimbal assembly long tail and HSA arm slot.
    상세보기
  2. Pakzad, Mostafa; Pang, Peter Cheok Him; Bahadori, Mohammad R.; Viglione, Joseph M.; Leang, Roma; Yang, Boon Nee, Asynchronous automatic software module updates in a multi-cell disk drive test system.
    상세보기
  3. Gough,Ross E.; Rivkin,Steven Neal; Abrahamsson,Jan G.; Messenger,Carl R.; Makhija,Arun; Rydquist,Gordon K.; Cullen,Michael J., Binning disk drives during manufacturing by evaluating quality metrics prior to a final quality audit.
    상세보기
  4. Noble, Scott; Garcia, Edward; Polyakov, Evgeny; Truebenbach, Eric L.; Merrow, Brian S., Bulk feeding disk drives to disk drive testing systems.
    상세보기
  5. Noble, Scott; Garcia, Edward; Polyakov, Evgeny; Truebenbach, Eric L.; Merrow, Brian S., Bulk feeding disk drives to disk drive testing systems.
    상세보기
  6. Truebenbach, Eric L., Bulk transfer of storage devices using manual loading.
    상세보기
  7. Truebenbach, Eric L., Bulk transfer of storage devices using manual loading.
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  8. Tan, Jit Han; Tarrant, Dean Albert, Comb gripper for use with a shipping comb and a ramp in the assembly of a disk drive.
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  9. Bamrungtham, Ritthirong, Component receptacle to segregate components.
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  10. Slife, Russell P.; Jenkins, James R.; Jessen, Roger A.; Fowler, Ronald D., Computer directed head stack assembly installation system.
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  11. Martino, Peter, Damping vibrations within storage device testing systems.
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  12. Thongrattana, Chaiya; Boonpuang, Ruksakul; Khamon, Wirat; Nontree, Jetsada; Maneechote, Piya; Khwanma, Chaiyan, De-swage machine for removal of a head from a head stack assembly and method of using the same.
    상세보기
  13. Thongrattana, Chaiya; Boonpuang, Ruksakul; Khamon, Wirat; Nontree, Jetsada; Maneechote, Piya; Khwanma, Chaiyan, De-swage machine for removal of a head from a head stack assembly and method of using the same.
    상세보기
  14. Merrow, Brian S.; Truebenbach, Eric L.; Smith, Marc Lesueur, Dependent temperature control within disk drive testing systems.
    상세보기
  15. Chong, Jin Yang; Chang, Yih Fey; Hastama, Lie Dhani, Disk clamp and motor hub cleaning with stamping adhesive.
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  16. Zhang, Baoliang; Barlow, Carl E.; Tsai, Chun Sei, Disk drive calibrating failure threshold based on noise power effect on failure detection metric.
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  17. Merrow, Brian S.; Garcia, Edward; Polyakov, Evgeny, Disk drive transport, clamping and testing.
    상세보기
  18. Merrow, Brian S.; Garcia, Edward; Polyakov, Evgeny, Disk drive transport, clamping and testing.
    상세보기
  19. Merrow, Brian S.; Garcia, Edward; Polyakov, Evgeny, Disk drive transport, clamping and testing.
    상세보기
  20. Arena, John Joseph; Suto, Anthony J., Electronic assembly test system.
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  21. Merrow, Brian S., Enclosed operating area for disk drive testing systems.
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  22. Merrow, Brian S., Enclosed operating area for storage device testing systems.
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  23. Campbell, Philip; Wrinn, Joseph F., Engaging test slots.
    상세보기
  24. Thongrattana, Chaiya; Khamon, Wirat; Boonpuang, Ruksakul, Etching continuous periodic pattern on a suspension to adjust pitch and roll static attitude.
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  25. Henry, Paul H., Gas-charging head with integral valves.
    상세보기
  26. Thongrattana, Chaiya; Nontree, Jetsada; Srikwanjai, Teeraporn; Maneechote, Piya; Krudpuek, Chainat; Khamon, Wirat, HSA swage metrology calibration using solid weight gauge and torque sensor.
    상세보기
  27. Ferre, Andres G.; Phuah, Sie Cheang; Hastama, Lie Dhani; Lim, Mooi Hoon, Hard disk drive top cover removal.
    상세보기
  28. Merrow, Brian S.; Akers, Larry W., Heating storage devices in a testing system.
    상세보기
  29. Atkins, Andrew William; Bailey, Steve Andrew; Farquhar, David Ronald Bain; Orriss, David John; Richardson, Kevin, Housings and devices for disk drives.
    상세보기
  30. Wong, Kelvin; Sungkhaphong, Komgrit, Mechanism to deliver fastener vertically.
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  31. Thongrattana, Chaiya; Thongsuksai, Angkhan; Rungsang, Phatrasiri; Rodchom, Panuwat; Prangprasit, Porntep, Method and apparatus for measuring a pitch static attitude of a head stack assembly.
    상세보기
  32. Vangal-Ramamurthy, Jambunathan; Vasudevan, Rahool; Perez, Roberto, Method and devices for picking and placing workpieces into devices under manufacture using dual robots.
    상세보기
  33. Jun,Jin Wan, Method and system for error correction in disk drive using plural retry tables.
    상세보기
  34. Codilian, Raffi, Method for allocating disk drive spindle motors based on an operating characteristic.
    상세보기
  35. Eichblatt,Stephen; Samuelson,Laurence, Method for evaluating processes for manufacturing components.
    상세보기
  36. Vangal-Ramamurthy, Jambunathan; Yan, Kam Fung, Moveable slider for use in a device assembly process.
    상세보기
  37. Muchiyev, Sergey; Sherman, Paul Dylan; Vinh, Trung; Dangrungroj, Rungnapa, Pre-amplifier cartridge for test equipment of head gimbal assembly.
    상세보기
  38. Gough, Ross E.; Rivkin, Steven Neal, Predicting disk drive failure at a central processing facility using an evolving disk drive failure prediction algorithm.
    상세보기
  39. Merrow, Brian S.; Akers, Larry W., Storage device temperature sensing.
    상세보기
  40. Merrow, Brian S.; Akers, Larry W., Storage device temperature sensing.
    상세보기
  41. Merrow, Brian S., Storage device testing system cooling.
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  42. Merrow, Brian S., Storage device testing system cooling.
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  43. Merrow, Brian S.; Akers, Larry W., Storage device testing system with a conductive heating assembly.
    상세보기
  44. Ashametra, Saravut; Thaijarearn, Prachearn, Swage key enabling simultaneous transfer of two head gimbal assemblies onto two corresponding actuator pivot flex assembly arms.
    상세보기
  45. Merrow, Brian S., Temperature control within disk drive testing systems.
    상세보기
  46. Merrow, Brian S., Temperature control within disk drive testing systems.
    상세보기
  47. Merrow, Brian S., Temperature control within storage device testing systems.
    상세보기
  48. Merrow, Brian S.; Krikorian, Nicholas C., Test slot cooling system for a storage device testing system.
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  49. Merrow, Brian S.; Krikorian, Nicholas C., Test slot cooling system for a storage device testing system.
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  50. Merrow, Brian S., Thermal control system for test slot of test rack for disk drive testing system with thermoelectric device and a cooling conduit.
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  51. Chong, FongKheon; Hew, Edward YinKong; Liew, SanYuan; Oh, CheeFong; Yee, YoiSeng, Transfer function for track average amplitude prediction.
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  52. Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring disk drives within disk drive testing systems.
    상세보기
  53. Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring disk drives within disk drive testing systems.
    상세보기
  54. Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring storage devices within storage device testing systems.
    상세보기
  55. Toscano, John; Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring storage devices within storage device testing systems.
    상세보기
  56. Toscano, John; Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring storage devices within storage device testing systems.
    상세보기
  57. Gough,Ross E.; Rivkin,Steven Neal, Using a genetic algorithm to select a subset of quality metrics as input to a disk drive failure prediction algorithm.
    상세보기
  58. Sungkhaphong, Komgrit; Jaisorn, Chalermpon, Vacuum embedded bit for screw drivers.
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  59. Chhajed, Parag K., Vacuum nozzle having back-pressure release hole.
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  60. Wong, Kelvin; Sungkhaphong, Komgrit, Vacuum pick-up end effector with improved vacuum reading for small surface.
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  61. Merrow, Brian S., Vibration isolation within disk drive testing systems.
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