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Method and system for part measurement and verification 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01B-003/28
출원번호 US-0351032 (1999-07-09)
발명자 / 주소
  • Clifton Dale Cunningham
  • James McKinnon Fitch
  • James Jeffery Howard
  • James Paul Koesters
  • Michael Alan Leenhouts
  • Eric Dewayne Moore
출원인 / 주소
  • Vought Aircraft Industries, Inc.
대리인 / 주소
    Baker Botts L.L.P.
인용정보 피인용 횟수 : 9  인용 특허 : 38

초록

A system for part measurement and verification is disclosed. The system comprises a set of design criteria specifying a part and a fixture with gage blocks for positioning the part, where each of the gage blocks represents a known position. At least one probe is operable to measure the scalar values

대표청구항

1. A system for part measurement and verification, the system comprising:a) A set of design criteria specifying the part; b) A fixture, having gage blocks, for positioning the part, each of the gage blocks representing a known position; c) At least one probe operable to measure scalar values of the

이 특허에 인용된 특허 (38)

  1. Hinson Virgil H. (49 Choctaw Sq. Brunswick GA 31525), Apparatus for and method of measuring vehicle reference points.
  2. Tomelleri Raffaele (Verona ITX), Apparatus for measure and/or check the position and orientation of characteristic spots or areas in structures, particul.
  3. Enderle Eckhard (Aalen DEX) Kaufmann Dieter (Heidenheim DEX) Mller (Gmnd-Grossdeinbach DEX) Andrzejewski Thomas (Aalen DEX), Articulating head for a coordinate-measuring instrument.
  4. Sapia Mark A. (Canton CT), Calibration of eddy current profilometry.
  5. Simon David L. (Grosse Pointe Woods MI) Kloock Scott M. (Washington MI), Checking fixture with computer compensation for data collection device locators.
  6. McMurtry David R. (Wotton-under-Edge GBX) Robertson John P. (Horfield GBX) Darlington Alan D. (Dursley GBX), Co-ordinate measuring.
  7. Beeson Don E. (Columbus IN) Smith Karen S. (Columbus IN), Computer implemented go/no go gauging system.
  8. Waugaman John L. (Perrysburg OH), Contact measurement of container dimensional parameters.
  9. Ruck Otto,DEX, Coordinate measuring apparatus having a control which drives the probe head of the apparatus in accordance with desired.
  10. Iwano Hideo (Kawasaki JPX) Shudo Kazuo (Kawasaki JPX), Coordinate measuring instrument.
  11. Iwano Hideo (Kawasaki JPX) Kadowaki Soichi (Tokyo JPX), Coordinate measuring instrument and method of generating pattern data concerning shape of work to be measured.
  12. McMurtry David R. (‘Undercroft’Wotton-under-Edge ; Gloucestershire GB2), Coordinate measuring machine.
  13. Hurt James J. (Bettendorf IA) Foss Susan K. (LeClaire IA), Coordinate measuring machine inspection and adjustment method.
  14. Takahashi Keizo (Utsunomiya JPX) Matsumoto Masakazu (Utsunomiya JPX), Coordinate measuring machine with protected origin point blocks.
  15. Heier Helmut (Aalen DEX) Koch Klaus-Peter (Aalen DEX) Breyer Karl-Hermann (Heidenheim DEX), Coordinate-measuring machine for non-contact measurement of objects.
  16. Gupta Rajiv ; Webb Barry Joe, Fixture for calibrated positioning of an object.
  17. Weckenmann Albert (Ahrensburg DEX) Mordhorst Hans-Jurgen (Glinde DEX), Flexible CNC-multiposition measuring installation.
  18. Hurt James J. (Bettendorf IA), Inspection system and apparatus therefor.
  19. Tezuka Kazusaku,JPX ; Oneta Takao,JPX, Manual three dimensional coordinate measuring machine.
  20. Sogoian Kaloust P. (16210 North Park Dr. Southfield MI 48075), Manufacturing gaging system for quality control.
  21. Lebourg ; Maurice P., Method and apparatus for determining the spatial relationship between two misaligned tubular members.
  22. Eaton Homer L. (Balboa CA), Method and apparatus for measuring direction.
  23. Raab Simon (Longwood FL), Method and apparatus for measuring features of a part or item.
  24. Brenner Kurt,DEX ; Seitz Karl,DEX ; Herzog Klaus,DEX ; Lotze Werner,DEX, Method and manually guide coordinate measuring apparatus for measuring a workpiece.
  25. Dutler Werner (Haag CHX), Method for automatic compensation of probe offset in a coordinate measuring machine.
  26. Staaden Ulrich,DEX, Method for controlling a coordinate measuring apparatus.
  27. Breyer Karl-Hermann (Heidenheim DEX), Method for coordinate measurement of workpieces.
  28. Bell Frederick K. (Centerville OH) Brown Stephen N. (Dayton OH) Gale Michael T. (Dayton OH), Method for determining position within the measuring volume of a coordinate measuring machine and the like and system th.
  29. Raab Simon (Longwood FL), Method of constructing a 3-dimensional map of a measurable quantity using three dimensional coordinate measuring apparat.
  30. Georgi Bernd (Oberkochen DEX) Czepan Bernd (Heidenheim DEX) Peter Heinz (Ulm DEX), Method of controlling a coordinate measuring apparatus.
  31. Breyer Karl-Hermann (Heidenheim DEX) Kammleiter Berndt (Oberkochen DEX) Ruck Otto (Pfahlheim DEX), Method of measuring elemental shapes of a workpiece on a coordinate measuring machine.
  32. Collier Kevin E. (675 S. 1350 East Fruit Heights UT 84037), Modular gage.
  33. Collier Scott Mitchell ; Jennerjohn Paul Edward, Multi-axis part positioning system.
  34. Glasson J. Peter, Object inspection system and method.
  35. Ercole Maurizio,ITX ; Garau Enrico,ITX, Part measuring gauge.
  36. Pryor Timothy R.,CAX, Sensor based assembly tooling improvements.
  37. Baresh Joseph M. (Seattle WA) Hisey Elmer (Bellevue WA) Nash Robert E. (Seattle WA), Skin contour inspection system.
  38. Chanoni Antoine (rue du Haras FRX) Hourdel Alain (Forges Les Bains FRX) Villette Gerard (Allee des Bocages FRX), Unit for continuously measuring shape defects of a part, and measuring process used in this unit..

이 특허를 인용한 특허 (9)

  1. Goldberg, Nicholas S., Alignment fixture for facilitating electrical or mechanical connection.
  2. Hammond, Peter Russell; Brown, Anthony, Machine tool method.
  3. Clark, Don Michael; Cangelosi, Austin Michael; Chang, Li Chun; Errazo, Deborah E., Mandrel configuration monitoring system.
  4. McFarland, Geoffrey, Measuring methods for use on machine tools.
  5. Groell, Klaus; Eisenberger, Christian, Method and system for analyzing transmitted signals from a probe system.
  6. Skolnick, Jeffrey F.; Barrientos, Edward R.; Beliveau, Sean M.; Hedges, Thomas M.; Lundberg, Eric J.; Pendleton, Edmund S.; Wells, Roger, Method and system for creating a user-selectable arbitrary coordinate frame.
  7. Dowidar, Helmy A. M., Method of measuring a component.
  8. Xu, Jian-Hua; Lu, Jian-Qiang, Size inspection device.
  9. Szarski, Martin A.; Bain, David M.; Crothers, Phillip J., Systems and methods for coordinate transformation using non-destructive imaging.
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