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In-situ air oxidation treatment of MOCVD process effluent 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • C01B-007/00
  • B01D-053/54
출원번호 US-0717439 (2000-11-21)
발명자 / 주소
  • Rebecca Faller
  • Mark Holst
출원인 / 주소
  • Advanced Technology Materials, Inc.
대리인 / 주소
    Oliver A. Zitzmann
인용정보 피인용 횟수 : 14  인용 특허 : 21

초록

An effluent abatement system for abating hydride species in a hydride-containing effluent, arranged for carrying out the steps of: (1) contacting the hydride-containing effluent with a dry scrubber material comprising a metal oxide that is reactive with the hydride species to remove the hydride spec

대표청구항

1. An effluent abatement and regeneration process for abating hydride species in a hydride-containing effluent, said process comprising: (1) contacting the hydride-containing effluent with a dry scrubber material comprising a metal oxide that is reactive with the hydride species to substantially rem

이 특허에 인용된 특허 (21)

  1. Moore Robert R. ; Getty James D. ; Safiullin Ravil, Apparatus and method for controlled decomposition oxidation of gaseous pollutants.
  2. Tom Glenn M. (New Milford CT) McManus James V. (Danbury CT) Luxon Bruce A. (Stamford CT), Composition, apparatus, and process, for sorption of gaseous compounds of group II-VII elements.
  3. Gkcek Cetin (Muhlheim DEX), Copper sulfate absorption mass to remove AsH3, PH3, B2H6, GeH 상세보기
  • Goozner Robert E., Destruction of volatile organic carbons.
  • Tom Glenn M. ; McManus James V. ; Olander W. Karl, Fluid storage and delivery system utilizing carbon sorbent medium.
  • Peterson Janice C. (Allentown PA) DiMartino Stephen P. (Topton PA), Metal hydride adsorption process for hydrogen purification.
  • Kitahara Koichi (Kanagawa JPX) Shimada Takashi (Kanagawa JPX), Method for cleaning exhaust gases.
  • Kitahara Koichi (Kanagawa JPX) Shimada Takashi (Kanagawa JPX) Akita Noboru (Kanagawa JPX) Hiramoto Tadashi (Kanagawa JPX) Sasaki Kohhei (Kanagawa JPX), Method for cleaning exhaust gases.
  • Kitahara Koichi (Kanagawa JPX) Akita Noboru (Kanagawa JPX) Shimada Takashi (Kanagawa JPX) Sasaki Kohhei (Kanagawa JPX) Hiramoto Tadashi (Kanagawa JPX), Method for cleaning gas containing toxic component.
  • Sechrist Paul A. ; Robinson Delmar W., Method for reducing chloride emissions from a catalyst regeneration process.
  • Jalan Vinod M. (Concord MA) Frost David G. (Maynard MA), Method of removing hydrogen sulfide from gases utilizing a zinc oxide sorbent and regenerating the sorbent.
  • Russell Stephen D. (San Diego CA) Sexton Douglas A. (San Diego CA), Photon controlled decomposition of nonhydrolyzable ambients.
  • Russell Stephen D. ; Sexton Douglas A., Photon controlled decomposition of nonhydrolyzable ambients.
  • Tom Glenn M. ; Miller Cynthia A., Piezoelectric end point sensor for detection of breakthrough of fluid, and fluid processing apparatus comprising same.
  • Li Yao-En ; Paganessi Joseph E. ; Vassallo David ; Fleming Gregory K., Process and system for separation and recovery of perfluorocompound gases.
  • Johnson Marvin M. (Bartlesville OK) Nowack Gerhard P. (Bartlesville OK), Process for removal of arsine impurities from gases containing arsine and hydrogen sulfide.
  • Carnell Peter John Herbert,GBX ; Willis Edwin Stephen,GBX, Process for removal of sulphur together with other contaminants from fluids.
  • Tom Glenn M. ; Fisher H. Eric ; Olander W. Karl, Process for removing and recovering halocarbons from effluent process streams.
  • Lush Richard A. (Wilmington DE) Tsao Hsiang-Wei (West Chester PA), Process for removing arsine impurities in process streams.
  • Denny Patrick J. (County Durham GB2) Thomas Alan E. (Cleveland GB2) Carnell Peter J. (Cleveland GB2), Purification of a hydrocarbon mixture.
  • Leondaridis Paul (Paris IL FRX) Vendel Albert S. (Chicago IL) Akthar Tarranum (Chicago IL), Removal of gaseous hydrides.
  • 이 특허를 인용한 특허 (14)

    1. Sherer, John Michael, Abatement system targeting a by-pass effluent stream of a semiconductor process tool.
    2. Sherer,John Michael, Abatement system targeting a by-pass effluent stream of a semiconductor process tool.
    3. Jha, Praveen; Vininski, Joseph V., Acetylene process gas purification methods and systems.
    4. Ferron, Shawn; Kelly, John; Vermeulen, Robbert, Apparatus and method for controlled combustion of gaseous pollutants.
    5. Hao, Hung Hu; Tseng, Kuo Pang, Filtering device and filtering method thereof and semiconductor fabricating method.
    6. Vininski,Joseph V.; Torres, Jr.,Robert; Houlding,Virginia H.; Spicer,Harold, Fluid purification system with low temperature purifier.
    7. Du, Hai; Jaynes, Scot E.; Falta, Steven R.; Stephenson, Neil A., Helium enhanced heat transfer in adsorptive liquid or gas phase argon purification processes.
    8. Loldj, Youssef A.; Crawford, Shaun W., Interface for operating and monitoring abatement systems.
    9. Nause, Jeffrey E.; Maciejewski, Joseph Owen; Munne, Vincente; Ganesan, Shanthi, Method of forming a p-type group II-VI semiconductor crystal layer on a substrate.
    10. Clark, Daniel O.; Raoux, Sebastien; Vermeulen, Robert M.; Crawford, Shaun W., Methods and apparatus for sensing characteristics of the contents of a process abatement reactor.
    11. Chiu, Ho-Man Rodney; Clark, Daniel O.; Crawford, Shaun W.; Jung, Jay J.; Loldj, Youssef A.; Vermeulen, Robbert M., Methods and apparatus for smart abatement using an improved fuel circuit.
    12. Adekore, Bunmi T.; Pierce, Jonathan M.; Davis, Robert F., Methods of forming zinc oxide based II-VI compound semiconductor layers with shallow acceptor conductivities.
    13. Adekore, Bunmi T.; Pierce, Jonathan M.; Davis, Robert F.; Kenney, George B., Methods of forming zinc oxide based II-VI compound semiconductor layers with shallow acceptor conductivities.
    14. Chiu, Ho-Man Rodney; Clark, Daniel O.; Crawford, Shaun W.; Jung, Jay J.; Todd, Leonard B.; Vermeulen, Robbert, Reactor design to reduce particle deposition during process abatement.

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