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A method and system of efficiently switching between a first test application that tests a first format and a second test application that tests a second format. First, a fast test application switching module (FTASM) is loaded into a program memory. The FTASM has a format independent portion (FIP)

A method and system of efficiently switching between a first test application that tests a first format and a second test application that tests a second format. First, a fast test application switching module (FTASM) is loaded into a program memory. The FTASM has a format independent portion (FIP) and at least two format dependent portions (FDPs) that are specific to the particular format to be tested. The FIP is configured to be compatible with each of the format dependent portions so that any of the format dependent portions can utilize the FIP to perform testing tasks. When a first format test request is received, the FIP activates the virtual instruments associated with the first format. Then, when a second format test request is received, the FIP de-activates the virtual instruments associated with the first format and activates the virtual instruments associated with the second format. A first mechanism is provided for maintaining a plurality of settings associated with while the format dependent portion is inactive. This mechanism also automatically applies these settings to the format dependent portion when the format dependent portion is activated. A second mechanism is provided for allowing a user to individually access a plurality of settings of a particular format dependent portion when the format dependent portion is not being executed.

대표청구항 ▼

A method and system of efficiently switching between a first test application that tests a first format and a second test application that tests a second format. First, a fast test application switching module (FTASM) is loaded into a program memory. The FTASM has a format independent portion (FIP)

A method and system of efficiently switching between a first test application that tests a first format and a second test application that tests a second format. First, a fast test application switching module (FTASM) is loaded into a program memory. The FTASM has a format independent portion (FIP) and at least two format dependent portions (FDPs) that are specific to the particular format to be tested. The FIP is configured to be compatible with each of the format dependent portions so that any of the format dependent portions can utilize the FIP to perform testing tasks. When a first format test request is received, the FIP activates the virtual instruments associated with the first format. Then, when a second format test request is received, the FIP de-activates the virtual instruments associated with the first format and activates the virtual instruments associated with the second format. A first mechanism is provided for maintaining a plurality of settings associated with while the format dependent portion is inactive. This mechanism also automatically applies these settings to the format dependent portion when the format dependent portion is activated. A second mechanism is provided for allowing a user to individually access a plurality of settings of a particular format dependent portion when the format dependent portion is not being executed.