$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Grid array inspection system and method 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H04N-007/18
출원번호 US-0130197 (1998-08-05)
발명자 / 주소
  • Chow, Hon Yean
  • Luo, De Yong
  • Li, Jia Ju
출원인 / 주소
  • National Semiconductor Corporation
대리인 / 주소
    Beyer Weaver & Thomas, LLP
인용정보 피인용 횟수 : 18  인용 특허 : 20

초록

An inspection apparatus and method is provided for inspecting external lead connectors in a grid array of an electronic package. The inspection apparatus includes a plurality of reflecting devices for directing a plurality of different oblique images to a partially reflective beam splitter, wherein

대표청구항

An inspection apparatus and method is provided for inspecting external lead connectors in a grid array of an electronic package. The inspection apparatus includes a plurality of reflecting devices for directing a plurality of different oblique images to a partially reflective beam splitter, wherein

이 특허에 인용된 특허 (20)

  1. Tomiya Hiroshi (Tokyo JPX) Ohashi Hideharu (Kanagawa JPX) Takayama Masato (Kanagawa JPX), Apparatus and method for inspecting IC leads.
  2. Marrable ; Jr. Walter E. (Gunter TX), Apparatus and method for verifying the coplanarity of a ball grid array.
  3. King Steven Joseph ; Ludlow Jonathan Edmund, Arc illumination apparatus and method.
  4. DeCarlo John M., Automated system for placement of components.
  5. Stern Howard ; Metzger Robert J., Chromatic optical ranging sensor.
  6. Jackson Robert Lea (Moorpark CA) Boman Robert Cottle (Simi Valley CA), Grid array inspection system and method.
  7. Jackson Robert Lea ; Boman Robert Cottle, Grid array inspection system and method.
  8. LeBeau Christopher J. (Tempe AZ) Wang Shay-Ping T. (Tempe AZ), Lead inspection method using a plane of light for producing reflected lead images.
  9. Roy Rajiv ; Zemek Michael C. ; Wahawisan Weerakiat, Method and apparatus for inspecting a workpiece.
  10. Beaty Elwin M. ; Mork David P., Method and apparatus for three dimensional inspection of electronic components.
  11. Chen Sullivan (Centerport NY) Stern Howard K. (Greenlawn NY) Yonescu William E. (Dix Hills NY), Method and apparatus for three dimensional object surface determination using co-planar data from multiple sensors.
  12. Svetkoff Donald J. ; Rohrer Donald K. ; Noblett David A. ; Jackson Robert L., Method and system for triangulation-based, 3-D imaging utilizing an angled scanning beam of radiant energy.
  13. Bilodeau Steve (Setauket NY) Jacovino Frank (Plainview NY) Cameron Joanne (Oakdale NY) Cain James (Calverton NY), Method for coplanarity inspection of package or substrate warpage for ball grid arrays, column arrays, and similar struc.
  14. Harvey Richard Paul,GBX, Optical beam splitter and electronic high speed camera incorporating such a beam splitter.
  15. Caillat Patrice (Echirolles FRX) Parat Guy (Echirolles FRX) Nicolas Grard (Voreppe FRX), Process and device for checking the conformity of hybridization balls.
  16. Suzuki Yasuyoshi,JPX, Semiconductor package inspection apparatus.
  17. Watts Leonard A. (North Miami Beach FL) Espinosa Medardo (Hialeah FL), Stacking method and apparatus.
  18. Sussman Michael, System for obtaining a uniform illumination reflectance image during periodic structured illumination.
  19. Svetkoff Donald J. ; Rohrer Donald K. ; Kelley Robert W., Triangulation-based 3-D imaging and processing method and system.
  20. Overbeck James W., Wide field of view and high speed scanning microscopy.

이 특허를 인용한 특허 (18)

  1. Quist, Bradley L., Co-planarity and top-down examination method and optical module for electronic leaded components.
  2. Quist,Bradley L., Co-planarity examination method and optical module for electronic components.
  3. Olmstead, Bryan L., Data reader having compact arrangement for acquisition of multiple views of an object.
  4. Beaty,Elwin M.; Mork,David P., Electronic component products and method of manufacturing electronic component products.
  5. Itoh,Goh; Baba,Masahiro; Taira,Kazuki; Okumura,Haruhiko, Image display method.
  6. Olmstead, Bryan L., Image-based code reader for acquisition of multiple views of an object and methods for employing same.
  7. Olmstead, Bryan L., Image-based code reader for acquisition of multiple views of an object and methods for employing same.
  8. Smith, Larry J., Imaging scanner with multiple image fields.
  9. Smith, Larry J., Imaging scanner with multiple image fields.
  10. Kellar, Scot A; Crews, Darren S, Integrated circuit package having rectangular aspect ratio.
  11. Smets,Carl; Van Gils,Karel; Zabolitsky,John; Everaerts,Jurgen, Method and an apparatus for measuring positions of contact elements of an electronic component.
  12. Quist,Bradley L., Method and apparatus for backlighting and imaging multiple views of isolated features of an object.
  13. Ishii, Akira; Mitsudo, Jun, Method for measuring height of sphere or hemisphere.
  14. Olmstead, Bryan L., Monolithic mirror structure for use in a multi-perspective optical code reader.
  15. Olmstead, Bryan L., Systems and methods for forming a composite image of multiple portions of an object from multiple perspectives.
  16. Olmstead, Bryan L., Systems and methods for forming a composite image of multiple portions of an object from multiple perspectives.
  17. Kiani,Sepehr; Gessel,David Jacob; Wilson,Andrew, Systems and methods for inspecting an optical interface.
  18. Olmstead, Bryan L., Two-plane optical code reader for acquisition of multiple views of an object.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로