[특허]Environmental test chamber and a carrier for use therein

[미국특허] Environmental test chamber and a carrier for use therein 원문보기

IPC분류정보
국가/구분	United States(US) Patent 등록
국제특허분류(IPC7판)	G01N-017/00 G01N-025/00 G01R-031/28
출원번호	US-0631055 (2000-08-01)
발명자 / 주소	Wanek, Donald L. Swanson, Loren L. Sands, Richard L. Troutman, Mark Melville, James A.
출원인 / 주소	Pemstar, Inc.
대리인 / 주소	Dorsey & Whitney LLP
인용정보	피인용 횟수 : 54 인용 특허 : 16

초록 ▼

One aspect of the present invention is a system of fabricating a barrier wall between the testing and tester volumes of an environmental test chamber. This aspect may use a plurality of pallets adapted to receive a device under test and a testing apparatus, a framework adapted to receive a plurality of pallets, and a plurality of insulation bricks associated with the plurality of pallets. The insulation bricks may be adapted such that they can cooperate to form an insulating barrier between the device under test and the testing apparatus.

대표청구항 ▼

1. An environmental test chamber, comprising: plurality of pallets; and a plurality of insulation bricks associated with the plurality of pallets, the insulation bricks having a sealing material comprised of a strip of hook and loop material and the insulation bricks cooperating to form an insulating barrier. 2. An environmental test chamber, comprising: a plurality of pallets; and a plurality of insulation bricks associated with the plurality of pallets, the insulation bricks having a sealing material comprised of a sponge rubber and the insulation bricks cooperating to form an insulating barrier. 3. The environmental test chamber of claim 2, wherein the pallets are adapted to receive a device under test and a testing apparatus, and wherein the insulating barrier is located between the device under test and the testing apparatus. 4. The environmental test chamber of claim 2, further comprising a rack adapted to receive the plurality of pallets. 5. An environmental test chamber comprising a frame defining a testing space and a tester space; and a plurality of insulation bricks received by the frame, the insulation bricks cooperating to form an insulating barrier between the testing space and the tester space and a plenum network. 6. The chamber of claim 5, wherein the frame defines an interior receiving slot and an exterior receiving slot. 7. The chamber of claim 5, wherein each insulation brick includes grooves along it side surfaces, and wherein the grooves cooperate to provide the plenum network. 8. The chamber of claim 5, wherein each insulation brick is disposed within a pallet, and wherein the frame is adapted to receive the pallet. 9. The chamber of claim 5, wherein the tester space includes an electronic testing package. 10. The chamber of claim 5, wherein each insulation brick includes a wall located between each testing space and each tester space, and wherein each wall cooperates with each other and with the frame to insulate each testing space from each tester space. 11. The chamber of claim 5, wherein each test space includes a fixture for holding a device under test. 12. The chamber of claim 5, and further comprising an air source in communication with each insulation brick. 13. The chamber of claim 12, wherein the air source regulates temperature. 14. The chamber of claim 12, wherein the air source regulates humidity. 15. The environmental test chamber of claim 5, wherein the insulation bricks define a plenum. 16. The environmental test chamber of claim 5, wherein the insulation bricks include a sealing material.

이 특허에 인용된 특허 (16) 인용/피인용 타임라인 분석

Han Seong Chan,KRX ; Lee Dong Chun,KRX ; Yu Kwang Su,KRX ; Kwon O Kyung,KRX, Apparatus for carrying plural printed circuit boards for semiconductor module.
상세보기
Wu Wen-Shien,TWX, Apparatus for thermally testing an electronic device.
상세보기
Fuoco Francis J. (Commack NY) Linardos Anthony (Copaigue NY), Burn-in testing equipment having an instrumentation control module.
상세보기
Jones Elmer R. (North Reading MA), Burn-in tower.
상세보기
Rieser Hansjorg (Elgg CHX) Schmoker Peter (Hallau CHX) Staubli Herbert (Kunten CHX), Device for testing electrical modules.
상세보기
Zhang Scott Yu-Feng (Carol Stream IL) Gosling Christopher David (Roselle IL) Sechrist Paul Alvin (Des Plaines IL) Funk Gregory A. (Carol Stream IL), Dual regeneration zone solid catalyst alkylation process.
상세보기
Duesler ; Jr. Ira D. (14 Walnut St. Mohawk NY 13407) Harney ; Jr. Thomas P. (62 John St. Ilion NY 13357), Environmental stress screening device transfer apparatus.
상세보기
Becker William M. ; Kim Sung H., Gear-driven docking apparatus for removable mass-storage drives.
상세보기
Graham Joseph (St. Paul MN) Gennrich Timothy J. (St. Paul MN) Laird James A. (St. Paul MN), Intumescent silicates having improved stability.
상세보기
Shea Lawrence E. (165 Lake Dr. San Bruno CA 94066), Method for making a double wall fire proof duct.
상세보기
Liken Peter A. (West Olive MI) Hartwig Kevin L. (Holland MI) Martin Peter A. (Holland MI), Product carrier with extended port interface.
상세보기
Hartley Jeffrey W. (Lancaster OH) Zelner Burch E. (Pataskala OH), Temperature cycling test chambers.
상세보기
Cassidy Michael P. (Chandler AZ), Test fixture with permanent circuit board extractor thereon.
상세보기
Wolff Ernest G. (Rolling Hills Estates CA) Eselun Steven A. (Long Beach CA), Test sample support assembly.
상세보기
O\Connor R. Bruce (San Diego CA) Toth Thomas E. (El Cajon CA) Ross James A. (Poway CA), Test station.
상세보기
Breunsbach Rex L. ; Austen Paul M., Wave solder analyzer.
상세보기

이 특허를 인용한 특허 (54) 인용/피인용 타임라인 분석

Noble, Scott; Garcia, Edward; Polyakov, Evgeny; Truebenbach, Eric L.; Merrow, Brian S., Bulk feeding disk drives to disk drive testing systems.
상세보기
Noble, Scott; Garcia, Edward; Polyakov, Evgeny; Truebenbach, Eric L.; Merrow, Brian S., Bulk feeding disk drives to disk drive testing systems.
상세보기
Truebenbach, Eric L., Bulk transfer of storage devices using manual loading.
상세보기
Truebenbach, Eric L., Bulk transfer of storage devices using manual loading.
상세보기
Rogel-Favila, Ben; Nalluri, Padmaja; Allison, Kirsten, Controlling automated testing of devices.
상세보기
Rogel-Favila, Ben; Fishman, James, Customizable tester having testing modules for automated testing of devices.
상세보기
Martino, Peter, Damping vibrations within storage device testing systems.
상세보기
Anderson, Ronald Eldon; Rancour, Michael Louis; Herdendorf, Brett Robert, Data storage component testing system.
상세보기
Merrow, Brian S.; Truebenbach, Eric L.; Smith, Marc Lesueur, Dependent temperature control within disk drive testing systems.
상세보기
Lin, Tao; Lin, Gang, Disk drive component test system.
상세보기
Merrow, Brian S.; Garcia, Edward; Polyakov, Evgeny, Disk drive transport, clamping and testing.
상세보기
Merrow, Brian S.; Garcia, Edward; Polyakov, Evgeny, Disk drive transport, clamping and testing.
상세보기
Merrow, Brian S.; Garcia, Edward; Polyakov, Evgeny, Disk drive transport, clamping and testing.
상세보기
Muncaster, Timothy J.; Saville, William A., Disk drive unit.
상세보기
Lin, Tao; Jen, Chih-Wu; Cheng, Chunjer C.; Lin, Gang H., Disk spindle assembly cartridge.
상세보기
Lin, Tao; Jen, Chih-Wu; Cheng, Chunjer Chuck; Lin, Gang Herbert, Disk spindle assembly cartridge.
상세보기
Arena, John Joseph; Suto, Anthony J., Electronic assembly test system.
상세보기
Merrow, Brian S., Enclosed operating area for disk drive testing systems.
상세보기
Merrow, Brian S., Enclosed operating area for storage device testing systems.
상세보기
Campbell, Philip; Wrinn, Joseph F., Engaging test slots.
상세보기
Wanek,Donald L.; Swanson,Loren L.; Sands,Richard L.; Troutman,Mark; Melville,James A., Environmental test chamber and a carrier for use therein.
상세보기
Wanek,Donald; Sands,Richard; Walter,Robert; Troutman,Mark, Hard drive test fixture.
상세보기
Cheng, Chunjer Chuck; Lin, Tao; Lin, Gang Herbert, Head stack assembly cartridge.
상세보기
Merrow, Brian S.; Akers, Larry W., Heating storage devices in a testing system.
상세보기
Atkins, Andrew William; Bailey, Steve Andrew; Farquhar, David Ronald Bain; Orriss, David John; Richardson, Kevin, Housings and devices for disk drives.
상세보기
Cheng, Chunjer Chuck; Lin, Tao; Lin, Gang Herbert, Method for test mounting a head stack assembly cartridge.
상세보기
Rancour, Michael Louis; Herdendorf, Brett Robert; Anderson, Ronald Eldon, Modular data storage device testing system.
상세보기
Rancour, Michael Louis; Herdendorf, Brett Robert; Anderson, Ronald Eldon, Modular data storage device testing system.
상세보기
Rogel-Favila, Ben; Fishman, James, Multi-configurable testing module for automated testing of a device.
상세보기
Merrow, Brian S.; Akers, Larry W., Storage device temperature sensing.
상세보기
Merrow, Brian S.; Akers, Larry W., Storage device temperature sensing.
상세보기
Merrow, Brian S., Storage device testing system cooling.
상세보기
Merrow, Brian S., Storage device testing system cooling.
상세보기
Merrow, Brian S.; Akers, Larry W., Storage device testing system with a conductive heating assembly.
상세보기
Rogel-Favila, Ben; Fishman, James, Supporting automated testing of devices in a test floor system.
상세보기
Mundt, Kevin; Adrian, Jason, Telescoping enclosure for information handling system component.
상세보기
Mundt, Kevin; Adrian, Jason, Telescoping enclosure for information handling system component.
상세보기
Merrow, Brian S., Temperature control within disk drive testing systems.
상세보기
Merrow, Brian S., Temperature control within disk drive testing systems.
상세보기
Merrow, Brian S., Temperature control within storage device testing systems.
상세보기
Wirtz, Michael; Kurze, Tobias, Test bench with a cooling gas inflow device.
상세보기
Merrow, Brian S.; Krikorian, Nicholas C., Test slot cooling system for a storage device testing system.
상세보기
Merrow, Brian S.; Krikorian, Nicholas C., Test slot cooling system for a storage device testing system.
상세보기
Merrow, Brian S., Thermal control system for test slot of test rack for disk drive testing system with thermoelectric device and a cooling conduit.
상세보기
Liu, Tai-Sheng; Wu, Chi-An, Thermal testing control system.
상세보기
Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring disk drives within disk drive testing systems.
상세보기
Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring disk drives within disk drive testing systems.
상세보기
Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring storage devices within storage device testing systems.
상세보기
Toscano, John; Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring storage devices within storage device testing systems.
상세보기
Toscano, John; Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring storage devices within storage device testing systems.
상세보기
Rogel-Favila, Ben; Wolff, Roland; Kushnick, Eric; Fishman, James, Universal container for device under test.
상세보기
Rogel-Favila, Ben; Wolff, Roland; Kushnick, Eric; Fishman, James, Universal test cell.
상세보기
Rogel-Favila, Ben; Wolff, Roland; Kushnick, Eric; Fishman, James; Su, Mei-Mei, Universal test floor system.
상세보기
Merrow, Brian S., Vibration isolation within disk drive testing systems.
상세보기

활용도 분석정보

상세보기

다운로드

내보내기

활용도 Top5 특허

해당 특허가 속한 카테고리에서 활용도가 높은 상위 5개 콘텐츠를 보여줍니다.
더보기 버튼을 클릭하시면 더 많은 관련자료를 살펴볼 수 있습니다.

IPC	Description
A	생활필수품
A62	인명구조; 소방(사다리 E06C)
A62B	인명구조용의 기구, 장치 또는 방법(특히 의료용에 사용되는 밸브 A61M 39/00; 특히 물에서 쓰이는 인명구조 장치 또는 방법 B63C 9/00; 잠수장비 B63C 11/00; 특히 항공기에 쓰는 것, 예. 낙하산, 투출좌석 B64D; 특히 광산에서 쓰이는 구조장치 E21F 11/00)
A62B-1/08	.. 윈치 또는 풀리에 제동기구가 있는 것

내보내기 구분	파일저장 인쇄 메일전송
구성항목	기본정보 상세정보 관리번호, 국가코드, 자료구분, 상태, 출원번호, 출원일자, 공개번호, 공개일자, 등록번호, 등록일자, 발명명칭(한글), 발명명칭(영문), 출원인(한글), 출원인(영문), 출원인코드, 대표IPC 관리번호, 국가코드, 자료구분, 상태, 출원번호, 출원일자, 공개번호, 공개일자, 공고번호, 공고일자, 등록번호, 등록일자, 발명명칭(한글), 발명명칭(영문), 출원인(한글), 출원인(영문), 출원인코드, 대표출원인, 출원인국적, 출원인주소, 발명자, 발명자E, 발명자코드, 발명자주소, 발명자 우편번호, 발명자국적, 대표IPC, IPC코드, 요약, 미국특허분류, 대리인주소, 대리인코드, 대리인(한글), 대리인(영문), 국제공개일자, 국제공개번호, 국제출원일자, 국제출원번호, 우선권, 우선권주장일, 우선권국가, 우선권출원번호, 원출원일자, 원출원번호, 지정국, Citing Patents, Cited Patents
저장형식	Text(ASCII format) Excel format PIAS분석(.xls)
메일정보	받는사람 (필수) @ 보내는사람 (선택) @ 제목 내용 KISTI 검색결과 이메일 서비스
안내	총 건의 자료가 검색되었습니다. 다운받으실 자료의 인덱스를 입력하세요. (1-10,000) 검색결과의 순서대로 최대 10,000건 까지 다운로드가 가능합니다. 데이타가 많을 경우 속도가 느려질 수 있습니다.(최대 2~3분 소요) 다운로드 파일은 UTF-8 형태로 저장됩니다. 파일의 내용이 제대로 보이지 않을실 때는 웹브라우저 상단의 보기 -> 인코딩 -> 자동선택 여부를 확인하십시오. ~ Text(ASCII format) Excel format

연합인증

[미국특허] Environmental test chamber and a carrier for use therein 원문보기

초록 ▼

대표청구항 ▼

연구과제 타임라인

이 특허에 인용된 특허 (16) 인용/피인용 타임라인 분석

이 특허를 인용한 특허 (54) 인용/피인용 타임라인 분석

활용도 분석정보

활용도 Top5 특허

관련 콘텐츠

특허 원문 보기

IPC 상위 출원인

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

선택된 텍스트

연합인증

[미국특허] Environmental test chamber and a carrier for use therein 원문보기

초록 ▼

대표청구항 ▼

연구과제 타임라인

전체(0) 논문(0) 특허(0) 보고서(0)

전체(0) 논문(0) 특허(0) 보고서(0)

이 특허에 인용된 특허 (16) 인용/피인용 타임라인 분석

이 특허를 인용한 특허 (54) 인용/피인용 타임라인 분석

활용도 분석정보

활용도 Top5 특허 더보기

관련 콘텐츠

특허 원문 보기

IPC 상위 출원인

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

선택된 텍스트

활용도 Top5 특허