$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Method and apparatus for detecting the endpoint of a chamber cleaning 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • B08B-007/04
출원번호 US-0904432 (1997-08-01)
발명자 / 주소
  • Blonigan, Wendell T.
  • Gardner, James T.
출원인 / 주소
  • Applied Komatsu Technology, Inc.
대리인 / 주소
    Stern, Robert J.
인용정보 피인용 횟수 : 40  인용 특허 : 18

초록

A method and apparatus for cleaning a CVD chamber including optoelectronic detection of the completion or endpoint of the cleaning procedure once a ratio of emission lines reaches a threshold value. The method comprises the steps of: providing a plasma of a cleaning gas into the chamber and creating

대표청구항

A method and apparatus for cleaning a CVD chamber including optoelectronic detection of the completion or endpoint of the cleaning procedure once a ratio of emission lines reaches a threshold value. The method comprises the steps of: providing a plasma of a cleaning gas into the chamber and creating

이 특허에 인용된 특허 (18)

  1. Davis Cecil J. (Greenville TX) Spencer John E. (Plano TX) Hockersmith Dan T. (Garland TX) Hildenbrand Randall C. (Richardson TX) Brown Frederick W. (Colleyville TX) Kohan Stanford P. (Garland TX), Automated single slice powered load lock plasma reactor.
  2. Nulty James E. (San Jose CA), Method and apparatus for end point detection.
  3. Ghanayem Steve G. (Sunnyvale CA), Method and apparatus for etchback endpoint detection.
  4. Mizutani Tatsumi (Kokubunji JPX) Ueki Kazuyoshi (Ohme JPX) Iida Shinya (Tama JPX) Komatsu Hideo (Tokyo JPX), Method and apparatus for monitoring etching.
  5. O\Neill James A. (New City NY) Passow Michael L. (Pleasant Valley NY) Singh Jyothi (Hopewell Junction NY), Method and apparatus for optical emission end point detection in plasma etching processes.
  6. Saito Susumu (Yamanashi-ken JPX) Koshimizu Chishio (Yamanashi-ken JPX) Eguchi Kazuo (Yamanashi-ken JPX), Method and device for detecting the end point of plasma process.
  7. Aoki Kazutsugu (Kanagawa JPX), Method for controlling plasma surface-treatments with a plurality of photodetectors and optical filters.
  8. Tsukada Tsutomu (Tokyo JPX), Method of monitoring status of a silicon layer by detecting, emission spectra variable during etching.
  9. Fong Gary ; Xia Li-Qun ; Nemani Srinivas ; Yieh Ellie, Methods and apparatus for cleaning surfaces in a substrate processing system.
  10. Cheng David (San Jose CA), Multi-channel plasma discharge endpoint detection method.
  11. Jerde Leslie G. (Hopewell Township ; Mercer County NJ) Lory Earl R. (Pennington NJ) Muething Kevin A. (Hillsborough Township ; Somerset County NJ) Tsou Len Y. (Lawrence Township ; Mercer County NJ), Optical emission end point detector.
  12. Zhao Jun (Milpitas CA) Wolff Stefan (Sunnyvale CA) Smyth Kenneth (Sunnyvale CA) Taylor ; Jr. William Nixon (Dublin CA) McNutt Gerald (Los Altos Hills CA), Plasma chamber with fixed RF matching.
  13. Chen Ching-Hwa (Milpitas CA) Arnett David (Fremont CA) Liu David (San Jose CA), Plasma cleaning method for removing residues in a plasma treatment chamber.
  14. Horioka, Keiji; Yoshida, Yukimasa; Koyama, Shiro, Plasma etching apparatus.
  15. Koshimizu Chishio (Nirasaki JPX), Plasma-process system with improved end-point detecting scheme.
  16. Koshimizu Chishio (Nirasaki JPX), Plasma-process system with improved end-point detecting scheme.
  17. Doi Satoshi (Izumi JPX), Post treatment method for in-situ cleaning.
  18. Jerbic Chris (Cupertino CA), Process for dynamic control of the concentration of one or more reactants in a plasma-enhanced process for formation of.

이 특허를 인용한 특허 (40)

  1. Gealy, Dan; Weimer, Ronald A., Ampoules for producing a reaction gas and systems for depositing materials onto microfeature workpieces in reaction chambers.
  2. Carpenter, Craig M.; Mardian, Allen P.; Dando, Ross S.; Tschepen, Kimberly R.; Derderian, Garo J., Apparatus and method for depositing materials onto microelectronic workpieces.
  3. Carpenter,Craig M.; Mardian,Allen P.; Dando,Ross S.; Tschepen,Kimberly R.; Derderian,Garo J., Apparatus and method for depositing materials onto microelectronic workpieces.
  4. Mardian, Allen P.; Rodriguez, Santiago R., Apparatus and methods for manufacturing microfeatures on workpieces using plasma vapor processes.
  5. Derderian,Garo J., Apparatus and methods for plasma vapor deposition processes.
  6. Carpenter,Craig M.; Dando,Ross S.; Mardian,Allen P., Apparatus for controlling gas pulsing in processes for depositing materials onto micro-device workpieces.
  7. Dimeo, Frank; Dietz, James; Olander, W. Karl; Kaim, Robert; Bishop, Steven; Neuner, Jeffrey W.; Arno, Jose; Marganski, Paul J.; Sweeney, Joseph D.; Eldridge, David; Yedave, Sharad; Byl, Oleg; Stauf, Gregory T., Cleaning of semiconductor processing systems.
  8. Hosch, Jimmy W.; Goeckner, Matthew J.; Whelan, Mike; Kueny, Andrew Weeks; Harvey, Kenneth C.; Thamban, P.L. Stephan, Electron beam exciter for use in chemical analysis in processing systems.
  9. Shanker, Sunil; Lang, Chi-I; Nguyen, Minh Anh; Huang, Judy H., H2-based plasma treatment to eliminate within-batch and batch-to-batch etch drift.
  10. Kawata, Masahiro, Inline vacuum processing apparatus, method of controlling the same, and information recording medium manufacturing method.
  11. Sweeney, Joseph D.; Yedave, Sharad N.; Byl, Oleg; Kaim, Robert; Eldridge, David; Feng, Lin; Bishop, Steven E.; Olander, W. Karl; Tang, Ying, Ion source cleaning in semiconductor processing systems.
  12. Strang, Eric J.; Parsons, Richard, Method and apparatus for wall film monitoring.
  13. Entley,William R.; Langan,John G.; Murali,Amith; Bennett,Kathleen, Method for endpointing CVD chamber cleans following ultra low-k film treatments.
  14. Nogami, Hiroshi, Method of cleaning CVD device.
  15. Nogami, Hiroshi, Method of cleaning a CVD device.
  16. Wongsenakhum, Panya; Manohar, Abhishek, Methods and apparatus for cleaning deposition reactors.
  17. Zheng,Lingyi A.; Doan,Trung T.; Breiner,Lyle D.; Ping,Er Xuan; Beaman,Kevin L.; Weimer,Ronald A.; Kubista,David J.; Basceri,Cem, Methods and apparatus for processing microfeature workpieces, e.g., for depositing materials on microfeature workpieces.
  18. Beaman,Kevin L.; Weimer,Ronald A.; Breiner,Lyle D.; Ping,Er Xuan; Doan,Trung T.; Basceri,Cem; Kubista,David J.; Zheng,Lingyi A., Methods and apparatus for processing microfeature workpieces; methods for conditioning ALD reaction chambers.
  19. Carpenter,Craig M.; Dando,Ross S.; Gealy,Dan; Derderian,Garo J.; Mardian,Allen P., Methods and apparatus for vapor processing of micro-device workpieces.
  20. Beaman, Kevin L.; Doan, Trung T.; Breiner, Lyle D.; Weimer, Ronald A.; Ping, Er-Xuan; Kubista, David J.; Basceri, Cem; Zheng, Lingyi A., Methods and systems for controlling temperature during microfeature workpiece processing, E.G. CVD deposition.
  21. Beaman, Kevin L.; Doan, Trung T.; Breiner, Lyle D.; Weimer, Ronald A.; Ping, Er-Xuan; Kubista, David J.; Basceri, Cem; Zheng, Lingyi A., Methods and systems for controlling temperature during microfeature workpiece processing, E.G., CVD deposition.
  22. Beaman,Kevin L.; Doan,Trung T.; Breiner,Lyle D.; Weimer,Ronald A.; Ping,Er Xuan; Kubista,David J.; Basceri,Cem; Zheng,Lingyi A., Methods and systems for controlling temperature during microfeature workpiece processing, e.g., CVD deposition.
  23. Carpenter, Craig M.; Dando, Ross S.; Mardian, Allen P., Methods for controlling gas pulsing in processes for depositing materials onto micro-device workpieces.
  24. Carpenter,Craig M.; Dynka,Danny, Methods for controlling mass flow rates and pressures in passageways coupled to reaction chambers and systems for depositing material onto microfeature workpieces in reaction chambers.
  25. Dando, Ross S.; Gealy, Dan, Methods for depositing material onto microfeature workpieces in reaction chambers and systems for depositing materials onto microfeature workpieces.
  26. Dando, Ross S.; Gealy, Dan, Methods for depositing material onto microfeature workpieces in reaction chambers and systems for depositing materials onto microfeature workpieces.
  27. Zheng, Lingyi A.; Doan, Trung T.; Breiner, Lyle D.; Ping, Er-Xuan; Beaman, Kevin L.; Weimer, Ronald A.; Basceri, Cem; Kubista, David J., Methods for forming small-scale capacitor structures.
  28. Derderian, Garo J.; Sandhu, Gurtej, Methods for forming thin layers of materials on micro-device workpieces.
  29. Zheng,Lingyi A.; Doan,Trung T.; Breiner,Lyle D.; Ping,Er Xuan; Weimer,Ronald A.; Kubista,David J.; Beaman,Kevin L.; Basceri,Cem, Microfeature workpiece processing apparatus and methods for batch deposition of materials on microfeature workpieces.
  30. Basceri,Cem; Doan,Trung T.; Weimer,Ronald A.; Beaman,Kevin L.; Breiner,Lyle D.; Zheng,Lingyi A.; Ping,Er Xuan; Sarigiannis,Demetrius; Kubista,David J., Microfeature workpiece processing apparatus and methods for controlling deposition of materials on microfeature workpieces.
  31. Basceri,Cem; Doan,Trung T.; Weimer,Ronald A.; Beaman,Kevin L.; Breiner,Lyle D.; Zheng,Lingyi A.; Ping,Er Xuan; Sarigiannis,Demetrius; Kubista,David J., Microfeature workpiece processing apparatus and methods for controlling deposition of materials on microfeature workpieces.
  32. Kim, Nam Hun, Plasma chamber having plasma source coil and method for etching the wafer using the same.
  33. Hanprasopwattana, Aree; Augustyniak, Edward J.; Tian, Jason L.; Van Schravendijk, Bart J., Plasma clean for a semiconductor thin film deposition chamber.
  34. Fang, Zhiyuan; Subramonium, Pramod; Henri, Jon; Fox, Keith, Plasma clean method for deposition chamber.
  35. Murugesh, Laxman; Ahr, Gary R., Process endpoint detection in processing chambers.
  36. Dando, Ross S., Reactors with isolated gas connectors and methods for depositing materials onto micro-device workpieces.
  37. Miller, Matthew W.; Basceri, Cem, Reactors, systems and methods for depositing thin films onto microfeature workpieces.
  38. Shimazu, Tadashi; Kawano, Yuichi, Seasoning method for film-forming apparatus.
  39. Sarigiannis,Demetrius; Meng,Shuang; Derderian,Garo J., Systems and methods for depositing material onto microfeature workpieces in reaction chambers.
  40. Kubista, David J.; Doan, Trung T.; Breiner, Lyle D.; Weimer, Ronald A.; Beaman, Kevin L.; Ping, Er-Xuan; Zheng, Lingyi A.; Basceri, Cem, Systems for depositing material onto workpieces in reaction chambers and methods for removing byproducts from reaction chambers.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로