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Apparatus for maintaining wafer back side and edge exclusion during supercritical fluid processing 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • B08B-006/00
  • C25F-001/00
출원번호 US-0011499 (2001-12-07)
발명자 / 주소
  • Gopinath, Sanjay
  • Van Cleemput, Patrick A.
  • Juarez, Francisco
  • Shrinivasan, Krishnan
출원인 / 주소
  • Novellus Systems, Inc.
대리인 / 주소
    Beyer Weaver & Thomas, LLP
인용정보 피인용 횟수 : 42  인용 특허 : 2

초록

The present invention pertains to apparatus and methods for maintaining wafer back side, bevel, and front side edge exclusion during supercritical fluid processing. Apparatus of the invention include a pedestal and an exclusion ring. When the exclusion ring is engaged with the pedestal a channel is

대표청구항

The present invention pertains to apparatus and methods for maintaining wafer back side, bevel, and front side edge exclusion during supercritical fluid processing. Apparatus of the invention include a pedestal and an exclusion ring. When the exclusion ring is engaged with the pedestal a channel is

이 특허에 인용된 특허 (2)

  1. van de Ven Everhardus P. ; Broadbent Eliot K. ; Benzing Jeffrey C. ; Chin Barry L. ; Burkhart Christopher W., Gas-based substrate deposition protection.
  2. E. Derryck Settles, Method and apparatus for heating substrates in supercritical fluid reactor.

이 특허를 인용한 특허 (42)

  1. Yokomizo,Kenji, Apparatus and method of securing a workpiece during high-pressure processing.
  2. Biberger, Maximilian Albert; Layman, Frederick Paul; Sutton, Thomas Robert, Apparatus for supercritical processing of a workpiece.
  3. Biberger, Maximilian Albert; Layman, Frederick Paul; Sutton, Thomas Robert, Apparatus for supercritical processing of multiple workpieces.
  4. Nagamine, Shuichi; Kishita, Naofumi; Takayanagi, Koji; Miyata, Yuichiro; Takiguchi, Yasushi, Coater cup.
  5. Jones,William Dale, Control of fluid flow in the processing of an object with a fluid.
  6. Blank, Rich, Dedicated hot and cold end effectors for improved throughput.
  7. Blank, Richard M., Dedicated hot and cold end effectors for improved throughput.
  8. Sheydayi,Alexei; Sutton,Thomas, Gate valve for plus-atmospheric pressure semiconductor process vessels.
  9. Sutton, Thomas R.; Biberger, Maximilan A., High pressure compatible vacuum chuck for semiconductor wafer including lift mechanism.
  10. Jones, William D., High pressure fourier transform infrared cell.
  11. Biberger, Maximilian A.; Layman, Frederick Paul; Sutton, Thomas Robert, High pressure processing chamber for semiconductor substrate.
  12. Biberger,Maximilian A.; Layman,Frederick Paul; Sutton,Thomas Robert, High pressure processing chamber for semiconductor substrate.
  13. Jones,William Dale, High-pressure processing chamber for a semiconductor wafer.
  14. Jones,William Dale, High-pressure processing chamber for a semiconductor wafer.
  15. Ho, Henry; Pang, Lily L.; Nguyen, Anh N.; Lerner, Alexander N., Integrated bevel clean chamber.
  16. Suzuki, Kouki; Toriya, Daisuke; Yamazaki, Koichi, Liner for plasma processing apparatus.
  17. Suzuki, Kouki; Yamashita, Jun; Ban, Masakazu; Ueda, Atsushi, Liner for plasma processing apparatus.
  18. Suzuki, Kouki; Yamashita, Jun; Ban, Masakazu; Ueda, Atsushi, Liner for plasma processing apparatus.
  19. Sheydayi,Alexei, Method and apparatus for clamping a substrate in a high pressure processing system.
  20. Goshi,Gentaro, Method and apparatus for cooling motor bearings of a high pressure pump.
  21. Gopinath, Sanjay; Van Cleemput, Patrick A.; Schulberg, Michelle; Ramanathan, Sasangan; Juarez, Francisco; Joyce, Patrick, Method and apparatus for introduction of solid precursors and reactants into a supercritical fluid reactor.
  22. Biberger, Maximilian Albert; Layman, Frederick Paul; Sutton, Thomas Robert, Method and apparatus for supercritical processing of multiple workpieces.
  23. Parent,Wayne M.; Goshi,Gentaro, Method and system for cooling a pump.
  24. Parent,Wayne M., Method and system for determining flow conditions in a high pressure processing system.
  25. Parent, Wayne M.; Geshell, Dan R., Method and system for passivating a processing chamber.
  26. Hansen,Brandon; Lowe,Marie, Method and system for treating a substrate with a high pressure fluid using fluorosilicic acid.
  27. Kawamura,Kohei; Asano,Akira; Miyatani,Koutarou; Hillman,Joseph T.; Palmer,Bentley, Method for supercritical carbon dioxide processing of fluoro-carbon films.
  28. Biberger, Maximilian Albert; Layman, Frederick Paul; Sutton, Thomas Robert, Method for supercritical processing of multiple workpieces.
  29. Biberger,Maximilian Albert; Layman,Frederick Paul; Sutton,Thomas Robert, Method of supercritical processing of a workpiece.
  30. Sheydayi,Alexei, Non-contact shuttle valve for flow diversion in high pressure systems.
  31. Sheydayi,Alexei, Pressure energized pressure vessel opening and closing device and method of providing therefor.
  32. Wuester,Christopher D., Process flow thermocouple.
  33. Mullee, William H., Removal of photoresist and photoresist residue from semiconductors using supercritical carbon dioxide process.
  34. Yudovsky, Joseph, Spring-loaded pins for susceptor assembly and processing methods using same.
  35. Toshima, Takayuki; Terada, Kazuo, Substrate carrying apparatus having circumferential sidewall and substrate processing system.
  36. Gale,Glenn; Hillman,Joseph T.; Jacobson,Gunilla; Palmer,Bentley, System and method for processing a substrate using supercritical carbon dioxide processing.
  37. Jacobson,Gunilla; Yellowaga,Deborah, Treatment of a dielectric layer using supercritical CO.
  38. Kevwitch, Robert, Treatment of substrate using functionalizing agent in supercritical carbon dioxide.
  39. Sheydayi,Alexei, Vacuum chuck utilizing sintered material and method of providing thereof.
  40. Blank, Richard M., Vacuum robot with linear translation carriage.
  41. Parks,John, Wafer clamping apparatus and method for operating the same.
  42. Yu, Chen-Hua; Liu, Chung-Shi; Huang, Hui-Min; Huang, Chih-Fan; Cheng, Ming-Da; Chen, Meng-Tse; Jang, Bor-Ping; Hwang, Chien Ling, Wafer-level molding chase design.
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