IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
|
출원번호 |
US-0623811
(2000-09-08)
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우선권정보 |
JP-0002559 (1999-01-08) |
국제출원번호 |
PCT/JP00/00063
(2000-01-11)
|
국제공개번호 |
WO00/40984
(2000-07-13)
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발명자
/ 주소 |
|
출원인 / 주소 |
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대리인 / 주소 |
Lathrop, Esq., David N.Gallagher & Lathrop
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인용정보 |
피인용 횟수 :
4 인용 특허 :
6 |
초록
▼
A waveform generating apparatus capable of outputting a desired waveform is provided. Among delay data is selected a set pulse generating delay data depending on test logical data and waveform mode information. The delay data, a skew adjusting delay data, and a fraction data in each test cycle are c
A waveform generating apparatus capable of outputting a desired waveform is provided. Among delay data is selected a set pulse generating delay data depending on test logical data and waveform mode information. The delay data, a skew adjusting delay data, and a fraction data in each test cycle are computed to obtain an integer delay data and a fraction delay data, which are supplied to a counter delay circuit. From the counter delay circuit are outputted a set pulse generating effective flag for delaying a test period timing by a delay time corresponding to the integer delay data, and a fraction delay data related thereto. The effective flag is delayed based on the related fraction delay data to obtain a set pulse. Similarly with the set pulse, a reset pulse is obtained, thereby to set/reset an S-R flip-flop to output a desired waveform.
대표청구항
▼
A waveform generating apparatus capable of outputting a desired waveform is provided. Among delay data is selected a set pulse generating delay data depending on test logical data and waveform mode information. The delay data, a skew adjusting delay data, and a fraction data in each test cycle are c
A waveform generating apparatus capable of outputting a desired waveform is provided. Among delay data is selected a set pulse generating delay data depending on test logical data and waveform mode information. The delay data, a skew adjusting delay data, and a fraction data in each test cycle are computed to obtain an integer delay data and a fraction delay data, which are supplied to a counter delay circuit. From the counter delay circuit are outputted a set pulse generating effective flag for delaying a test period timing by a delay time corresponding to the integer delay data, and a fraction delay data related thereto. The effective flag is delayed based on the related fraction delay data to obtain a set pulse. Similarly with the set pulse, a reset pulse is obtained, thereby to set/reset an S-R flip-flop to output a desired waveform. et al.; US-5355313, 19941000, Moll et al.; US-5434927, 19950700, Brady et al.; US-5444619, 19950800, Hoskins et al., 702/013; US-5459587, 19951000, Fukushima; US-5496093, 19960300, Barlow; US-5613039, 19970300, Wang et al.; US-5648938, 19970700, Jakubowicz; US-5732697, 19980300, Zhang et al.; US-5740274, 19980400, Ono et al.; US-5742740, 19980400, McCormack et al.; US-5754709, 19980500, Moriya et al.; US-5761326, 19980600, Brady et al.; US-5775806, 19980700, Allred; US-5776063, 19980700, Dittrich et al.; US-5777481, 19980700, Vivekanandan; US-5812068, 19980900, Wisler et al.; US-5828981, 19981000, Callender et al.; US-5862513, 19990100, Mezzatesta et al.; US-5884295, 19990300, Moll et al.; US-5924048, 19990700, McCormack et al.; US-5940777, 19990800, Keskes; US-6002985, 19991200, Stephenson, 702/013; US-6119112, 20000900, Bush; US-6218841, 20010400, Wu; US-6236942, 20010500, Bush, 702/014 lor series expansion is in half-integer powers of frequency. 6. The method of claim 5 wherein said skin-effect corrected conductivity measurements is related to the coefficient of the three-half power of frequency in the Taylor series expansion. 7. The method of claim 1 wherein obtaining said model further comprises making measurements of a Hzzcomponent at a plurality of frequencies and inverting said Hzzcomponents. 8. The method of claim 1 wherein obtaining said model further comprises: (A) making measurements of a Hzzcomponent at a plurality of spacings of a transmitter and a receiver on an electromagnetic logging tool; and (B) at least one of: (i) inverting of said Hzzcomponents and, (iii) focusing of said Hzzcomponents. 9. The method of claim 1 wherein determining said expected value of said at least one skin-effect corrected conductivity further comprises: (i) setting a vertical conductivity equal to a horizontal conductivity; and (ii) using a forward modeling program to obtain at least one of: (A) an expected Hxxcomponent, and, (B) an expected Hyycomponent; wherein said expected components are obtained at a plurality of frequencies. 10. The method of claim 9 wherein determining said expected value of said at least one skin-effect corrected conductivity further comprises applying a skin-effect correction to said expected components. 11. The method of claim 10 wherein determining a vertical conductivity of the at least one layer further comprises using a relationship of the form wherein λ is an anisotropy ratio, σisois said expected value of said at least one skin-effect corrected conductivity measurement from said model, σmeasis said skin-effect corrected conductivity measurement, and σtis said horizontal conductivity. 12. A method of determining a parameter of interest of subsurface formations including a plurality of layers each having a horizontal resistivity and a vertical resistivity, the method comprising: (a) using sensors on an electromagnetic logging tool conveyed in a borehole in the subsurface formations and making measurements indicative of said horizontal conductivities; (b) deriving from said measurements indicative of horizontal conductivities an isotropic model of said subsurface formations; (c) using sensors on an electromagnetic logging tool conveyed in a borehole in the subsurface formations and making measurements indicative of said vertical conductivities; (d) applying a skin-effect correction to said measurements in (c) at said plurality of frequencies and obtaining a skin-effect corrected conductivity measurement; (e) using a modeling program and determining from said isotropic model expected measurements corresponding to said skin-effect corrected conductivity measurements and applying skin-effect corrections to said expected measurements; (f) determining from said skin-effect corrected measurements, corresponding skin-effect corrected expected measurements, and said isotropic model, said parameter of interest. 13. The method of claim 12 wherein said parameter of interest is a vertical conductivity of one of said plurality of layers. 14. The method of claim 12 wherein using said sensors further comprises making measurements at a plurality of frequencies. 15. The method of claim 14 wherein said plurality of frequencies is less than eight. 16. The method of claim 12 wherein said measurements indicative of vertical conductivities comprise at least one of: (i) a Hxxcomponent, (ii) a Hyycomponent, and, (iii) a sum of the Hxxand Hyycomponents. 17. The method of claim 12 wherein applying said skin-effect correction further comprises using a Taylor series expansion of said at least one component. 18. The method of claim 17 wherein said Taylor series expansion is in half-integer powers of frequency. 19. The method of claim 18 w herein said skin-effect corrected conductivity measurements is related to the coefficient of the three-half power of frequency in the Taylor series expansion. 20. The method of claim 12 wherein deriving said isotropic model further comprises at least one of: (i) inversion of a Hzzcomponent at a plurality of frequencies, (ii) inversion of a Hzzcomponent acquired with a plurality of spacings of a transmitter and a receiver on the logging tool of (a), and, (iii) focusing of a Hzzacquired with a plurality of spacings of a transmitter and receiver on the logging tool of (a). 21. The method of claim 12 further comprising determining said expected measurements at a plurality of frequencies, and wherein applying skin effect corrections to said expected measurements further comprises using a Taylor series expansion in half integer powers of frequency. 22. The method of claim 12 wherein determining the parameter of interest further comprises using a relationship of the form wherein λ is an anisotropy ratio, σisois said expected value of said at least one skin-effect corrected conductivity measurement from said model, σmeasis said skin-effect corrected conductivity measurement, and σtis a resistivity in said isotropic model. 23. A method of logging of subsurface formations including at least one layer having a horizontal conductivity and a vertical conductivity, the method comprising: (a) conveying an electromagnetic logging tool into a borehole in the subsurface formations; (b) using said electromagnetic logging tool for obtaining at at least one frequency, at least one measurement indicative of said vertical conductivity; (c) obtaining a substantially isotropic model including, for said at least one layer, a layer thickness and a horizontal conductivity; (d) determining from said model an expected value of said at least one measurement; (e) determining from said measurement, said expected value of the measurement, and said horizontal conductivity, a vertical conductivity of the at least one layer. 24. The method of claim 23 wherein said at least one measurement is selected from the group consisting of (i) a Hxxcomponent, (ii) a Hyycomponent, and, (iii) a sum of a Hxxand a Hyycomponent. 25. The method of claim 23 wherein obtaining said model further comprises making measurements of a Hzzcomponent at a plurality of frequencies and inverting said Hzzcomponents. 26. The method of claim 23 wherein obtaining said model further comprises: (A) making measurements of a Hzzcomponent at a plurality of spacings of a transmitter and a receiver on an electromagnetic logging tool; and (B) at least one of: (i) inverting of said Hzzcomponents, and, (iii) focusing of said Hzzcomponents. 27. The method of claim 23 wherein determining a vertical conductivity of the at least one layer further comprises using a relationship of the form wherein λ is an anisotropy ratio, σisois said expected value of said conductivity measurement from said model, σmeasis said conductivity measurement, and σtis said horizontal conductivity. 28. A method of logging of subsurface formations including at least one layer having a horizontal conductivity and a vertical conductivity, the method comprising: (a) conveying an electromagnetic logging tool into a borehole in the subsurface formations; (b) using said electromagnetic logging tool for obtaining at at least one frequency, a plurality of measurements with different source-receiver spacings, said plurality of measurements indicative of said vertical conductivity; (c) correcting said plurality of measurements to provide a corrected measurement indicative of a zero-frequency value, (d) obtaining a substantially isotropic model including, for said at least one layer, a layer thickness and a horizontal c
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