[특허]Apparatus and method for analyzing chemical system data

[미국특허] Apparatus and method for analyzing chemical system data 원문보기

IPC분류정보
국가/구분	United States(US) Patent 등록
국제특허분류(IPC7판)	G05B-021/00
출원번호	US-0387230 (1999-08-31)
발명자 / 주소	Millett, Peter J. Burns, Gary D. Brobst, Gary E.
출원인 / 주소	Electric Power Research Institute, Inc.
대리인 / 주소	Pennie & Edmonds LLP
인용정보	피인용 횟수 : 17 인용 특허 : 11

초록 ▼

A power plant water chemistry analysis apparatus and method relies upon water chemistry sensors to obtain power plant water chemistry data characterizing the chemical activity of a power plant water system. An analytical model processor is used to generate model predictions for the power plant water system. A statistical data fitting processor selects screened data from the power plant water chemistry data that corresponds to the model predictions. The screened data is processed by an artificial intelligence processor to derive power plant water chemistry diagnostic information. The artificial intelligence processor includes an expert system, rule base, plant water chemistry system simulator, and pattern recognition module.

대표청구항 ▼

1. A physical system analysis apparatus, comprising: sensors to obtain physical system data characterizing the physical activity of a physical system; an analytical model processor to generate model predictions for said physical system independent of said physical system data obtained from said sensors; and an artificial intelligence processor to process said physical system data and said model predictions, which in combination constitutes over specified physical system data with more known physical system data than unknown model predictions, said artificial intelligence processor generating diagnostic information from said over specified system data. 2. The apparatus of claim 1 wherein said artificial intelligence processor includes a physical system simulator to process said over specified system data. 3. The apparatus of claim 1 further comprising: a statistical data fitting processor to select screened data from said over specified system data. 4. The apparatus of claim 3 wherein said statistical data fitting processor determines the statistical best fit of said physical system data that satisfy the constraints given by said model predictions. 5. The apparatus of claim 1 wherein said artificial intelligence processor includes a rule base to process said over specified system data. 6. The apparatus of claim 1 wherein said artificial intelligence processor further includes a pattern recognition module to process said over specified system data. 7. A computer readable memory to direct a computer to function in a specified manner comprising: physical data characterizing the physical activity of a physical system; model predictions for said physical system independent of said physical system data obtained from said sensors; and executable instructions stored in said memory, said executable instructions including instructions to process said physical data and said model predictions, which in combination constitutes over specified system data with more known physical data than unknown model predictions, to generate diagnostic information from said over specified system data. 8. The apparatus of claim 7 wherein said executable instructions include instructions defining a physical system simulator to process said over specified system data. 9. The apparatus of claim 7 wherein said executable instructions include instructions defining a statistical data fitting processor to select screened data from said over specified system data. 10. The apparatus of claim 7 wherein said executable instructions include instructions defining a rule base to process said over specified system data. 11. The apparatus of claim 7 wherein said executable instructions include instructions defining a pattern recognition module to process said over specified system data. 12. A method of analyzing physical data, said method comprising the steps of: accumulating physical data characterizing the physical activity of a physical system; generating model predications for said physical system independent of said physical system data obtained from said sensors; and deriving diagnostic information from said physical data and said model predictions, which in combination constitute over specified system data with more known physical data than unknown model predictions. 13. The method of claim 12 further comprising the step of selecting screened data from said over specified system data. 14. The method of claim 12 wherein said deriving step include the step of processing said over specified system data with a rule base. 15. The method of claim 12 wherein said deriving step includes the step of processing said over specified system data with a physical system simulator. 16. The method of claim 12 wherein said deriving step includes the step of processing said over specified system data with a pattern recognition module.

이 특허에 인용된 특허 (11) 인용/피인용 타임라인 분석

Millett Peter J. ; Burns Gary D. ; Brobst Gary E., Apparatus and method for analyzing chemical system data.
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Millett Peter J. ; Burns Gary D. ; Brobst Gary E., Apparatus and method for analyzing power plant water chemistry.
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Gunther John C. (Bensalem PA) Boyette Scott M. (Wilmington DE) Thungstrom Eric A. (Wyndmoor PA) Worrell Norman B. (Feasterville PA) Burgmayer Paul R. (Wayne PA), Apparatus and method for automatically achieving and maintaining congruent control in an industrial boiler.
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Barto Ronald J. (West Hartford CT) Gabrielli Frank (So. Windsor CT) Mohn Nancy C. (Windsor CT), Intelligent chemistry management system.
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Hill Fletcher L. (Golden CO) Jurestovsky Nancy R. (Golden CO) Beal David G. (Longmont CO), Knowledge based machine initiated maintenance system.
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[미국특허] Apparatus and method for analyzing chemical system data 원문보기

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