[미국특허]
System for guiding a beam of electromagnetic radiation
원문보기
IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
|
출원번호 |
US-0707346
(2000-11-06)
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우선권정보 |
EP-0870231 (1999-11-05) |
발명자
/ 주소 |
- Bienstman, Peter
- Baets, Roel
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출원인 / 주소 |
- Interuniversitair Microelektronica Centrum (IMEC, VZW), Universiteit Gent
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대리인 / 주소 |
McDonnell Boehnen Hulbert & Berghoff
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인용정보 |
피인용 횟수 :
2 인용 특허 :
2 |
초록
▼
A system and method for guiding a beam of electromagnetic radiation is disclosed. The system includes at least a first stack of dielectric layers, the first stack comprising at least a first substack, a second substack and a third substack, the third substack separating said first and second substac
A system and method for guiding a beam of electromagnetic radiation is disclosed. The system includes at least a first stack of dielectric layers, the first stack comprising at least a first substack, a second substack and a third substack, the third substack separating said first and second substack, the first substack comprising at least one dielectric layer, the second substack comprises at least one dielectric layer, the third substack comprises at least one dielectric layer. The dielectric layers of the first substack and the second substack equidistant from the third substack have the same refractive index. The sum of the thickness of dielectric layers of the first substack and the second substack equidistant from said third substack is a multiple of half of the vacuum wavelength of the beam divided by the refractive index of the dielectric layers of the first substack and the second substack having a same distance from the third substack, the third substack thickness being substantially different from a quarter of the vacuum wavelength of the beam divided by the refractive index of the one dielectric layer of the third substack.
대표청구항
▼
1. A system for guiding a beam of electromagnetic radiation, the beam including a vacuum wavelength, the system comprising: at least a first stack of dielectric layers; and at least one electromagnetic generating layer generating the beam of electromagnetic radiation, the electromagnetic generat
1. A system for guiding a beam of electromagnetic radiation, the beam including a vacuum wavelength, the system comprising: at least a first stack of dielectric layers; and at least one electromagnetic generating layer generating the beam of electromagnetic radiation, the electromagnetic generating layer being outside of the first stack of layers, at least a part of the beam being guided in the first stack of dielectric layers, the first stack comprising: a first substack, the first substack including at least one dielectric layer; a second substack, the second substack including at least one dielectric layer; and a third substack, the third substack including at least one dielectric layer, the third substack separating the first and second substack, wherein dielectric layers of the first substack and the second substack equidistant from the third substack have the same refractive index, wherein the sum of the thickness of dielectric layers of the first substack and the second substack being equidistant from the third substack is a multiple of half of the vacuum wavelength of the beam divided by the refractive index of the dielectric layers of the first substack and the second substack being equidistant from the third substack, wherein the third substack thickness is substantially different from a quarter of the vacuum wavelength of the beam divided by the refractive index of the dielectric layer of the third substack, and wherein the first substack and the second substack each have an odd number of layers and comprise dielectric layers with refractive indices n1and n2; and wherein said: refractive indices n1and n2are different in value relative to each other, such that the equivalent penetration depth of said beam is negative. 2. The system as recited in claim 1, wherein the first substack comprises a first and second layer with refractive index n2,a third layer with refractive index n1,the first and the third layer abutting one another, the second and the third layer abutting one another, the first and the second layer not abutting one another. 3. The system as recited in claim 1, wherein the first substack is a concatenation of a first layer with refractive index n2,a second layer with refractive index n1and a third layer with refractive index n2. 4. The system as recited in claim 3, wherein the third substack includes a dielectric layer with index n1. 5. The system as recited in claim 1, further comprising a second stack of dielectric layers, and wherein one side of the electromagnetic generating layer abuts the second stack of dielectric layers. 6. The system as recited in claim 5, wherein the second stack of dielectric layers is in between the first stack of dielectric layers and the electromagnetic generating layer. 7. The system as recited in claim 1, wherein one side of the electromagnetic generating layer abuts the first stack of dielectric layers.
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Hunt Neil E. J. (Scotch Plains NJ) Schubert Erdmann F. (New Providence NJ) Zydzik George J. (Columbia NJ), Photodetector with a resonant cavity.
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Cho Chih-Chen (Richardson TX) Duncan Walter M. (Dallas TX), Silicon-based microlaser by doped thin films.
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Ikuta, Mitsuhiro, Surface emitting laser.
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