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Method and system for testing reliability attributes in disk drives 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06F-011/00
출원번호 US-0728545 (2000-11-30)
발명자 / 주소
  • Viglione, Joseph M.
  • Utzig, Yvonne M.
출원인 / 주소
  • Western Digital Technologies, Inc.
대리인 / 주소
    Shara, Esq., Milad G.Posey, Esq., Ivan
인용정보 피인용 횟수 : 66  인용 특허 : 5

초록

A system and method for manufacturing disk drives, the disk drives having reliability attributes and manufacturing attributes, the manufacturing attributes comprising process or component manufacturing attributes is disclosed. The reliability attributes comprise measurements for predicting future re

대표청구항

A system and method for manufacturing disk drives, the disk drives having reliability attributes and manufacturing attributes, the manufacturing attributes comprising process or component manufacturing attributes is disclosed. The reliability attributes comprise measurements for predicting future re

이 특허에 인용된 특허 (5)

  1. Assouad Nicolas C., Disk drive testing.
  2. Craig A. Parris, Hard disk drive infant mortality test.
  3. Burns Harry A. ; Larson Brent H. ; Brown Larry K., Local device and process diagnostics in a process control network having distributed control functions.
  4. Ottesen Hal Hjalmar ; Smith Gordon James, Rigid disk surface defect detection and classification.
  5. Chevalier David (Santa Clara CA), Servo pattern for location and positioning of information on a disk drive.

이 특허를 인용한 특허 (66)

  1. Magsombol, Fernando A.; Amornmannun, Arnon; Ashametra, Saravut; Songwiroj, Nitipat, Adaptive tacking of head gimbal assembly long tail and HSA arm slot.
  2. Pakzad, Mostafa; Pang, Peter Cheok Him; Bahadori, Mohammad R.; Viglione, Joseph M.; Leang, Roma; Yang, Boon Nee, Asynchronous automatic software module updates in a multi-cell disk drive test system.
  3. Gough,Ross E.; Rivkin,Steven Neal; Abrahamsson,Jan G.; Messenger,Carl R.; Makhija,Arun; Rydquist,Gordon K.; Cullen,Michael J., Binning disk drives during manufacturing by evaluating quality metrics prior to a final quality audit.
  4. Noble, Scott; Garcia, Edward; Polyakov, Evgeny; Truebenbach, Eric L.; Merrow, Brian S., Bulk feeding disk drives to disk drive testing systems.
  5. Noble, Scott; Garcia, Edward; Polyakov, Evgeny; Truebenbach, Eric L.; Merrow, Brian S., Bulk feeding disk drives to disk drive testing systems.
  6. Truebenbach, Eric L., Bulk transfer of storage devices using manual loading.
  7. Truebenbach, Eric L., Bulk transfer of storage devices using manual loading.
  8. Tan, Jit Han; Tarrant, Dean Albert, Comb gripper for use with a shipping comb and a ramp in the assembly of a disk drive.
  9. Boyle, William B.; Neppalli, Srinivas, Condensing a defect scan log for a disk of a disk drive.
  10. Boyle, William B.; Neppalli, Srinivas, Condensing a defect scan log for a disk of a disk drive.
  11. Martino, Peter, Damping vibrations within storage device testing systems.
  12. Thongrattana, Chaiya; Boonpuang, Ruksakul; Khamon, Wirat; Nontree, Jetsada; Maneechote, Piya; Khwanma, Chaiyan, De-swage machine for removal of a head from a head stack assembly and method of using the same.
  13. Thongrattana, Chaiya; Boonpuang, Ruksakul; Khamon, Wirat; Nontree, Jetsada; Maneechote, Piya; Khwanma, Chaiyan, De-swage machine for removal of a head from a head stack assembly and method of using the same.
  14. Merrow, Brian S.; Truebenbach, Eric L.; Smith, Marc Lesueur, Dependent temperature control within disk drive testing systems.
  15. Nicholson,Robert Bruce; Whyte,Barry Douglas, Device, system and method for predictive failure analysis.
  16. Chong, Jin Yang; Chang, Yih Fey; Hastama, Lie Dhani, Disk clamp and motor hub cleaning with stamping adhesive.
  17. Merrow, Brian S.; Garcia, Edward; Polyakov, Evgeny, Disk drive transport, clamping and testing.
  18. Merrow, Brian S.; Garcia, Edward; Polyakov, Evgeny, Disk drive transport, clamping and testing.
  19. Merrow, Brian S.; Garcia, Edward; Polyakov, Evgeny, Disk drive transport, clamping and testing.
  20. Arena, John Joseph; Suto, Anthony J., Electronic assembly test system.
  21. Merrow, Brian S., Enclosed operating area for disk drive testing systems.
  22. Merrow, Brian S., Enclosed operating area for storage device testing systems.
  23. Campbell, Philip; Wrinn, Joseph F., Engaging test slots.
  24. Thongrattana, Chaiya; Khamon, Wirat; Boonpuang, Ruksakul, Etching continuous periodic pattern on a suspension to adjust pitch and roll static attitude.
  25. Henry, Paul H., Gas-charging head with integral valves.
  26. Gamble, Eric T.; Livaccari, Steve J.; Pesulima, Henry; Poetzinger, John A; Landell, Timothy; Stegner, Eric A., Generating a storage drive qualification test plan.
  27. Thongrattana, Chaiya; Nontree, Jetsada; Srikwanjai, Teeraporn; Maneechote, Piya; Krudpuek, Chainat; Khamon, Wirat, HSA swage metrology calibration using solid weight gauge and torque sensor.
  28. Ferre, Andres G.; Phuah, Sie Cheang; Hastama, Lie Dhani; Lim, Mooi Hoon, Hard disk drive top cover removal.
  29. Thorsen, Jack D., Hard drive eraser.
  30. Merrow, Brian S.; Akers, Larry W., Heating storage devices in a testing system.
  31. Wong, Kelvin; Sungkhaphong, Komgrit, Mechanism to deliver fastener vertically.
  32. Thongrattana, Chaiya; Thongsuksai, Angkhan; Rungsang, Phatrasiri; Rodchom, Panuwat; Prangprasit, Porntep, Method and apparatus for measuring a pitch static attitude of a head stack assembly.
  33. Kim,Seonki; Zhou,Fan, Method and apparatus for testing a servo circuit of a read/write head system.
  34. Vangal-Ramamurthy, Jambunathan; Vasudevan, Rahool; Perez, Roberto, Method and devices for picking and placing workpieces into devices under manufacture using dual robots.
  35. Dyer,Richard Clinton, Method and system for reducing production cycle time of a hard disk drive by featuring an inventoried generic hard disk drive with customized microcode.
  36. Eichblatt,Stephen; Samuelson,Laurence, Method for evaluating processes for manufacturing components.
  37. Alshawabkeh, Malak; Martin, Owen, Method, system and computer readable medium for controlling performance of storage pools.
  38. Vangal-Ramamurthy, Jambunathan; Yan, Kam Fung, Moveable slider for use in a device assembly process.
  39. Muchiyev, Sergey; Sherman, Paul Dylan; Vinh, Trung; Dangrungroj, Rungnapa, Pre-amplifier cartridge for test equipment of head gimbal assembly.
  40. Gough, Ross E.; Rivkin, Steven Neal, Predicting disk drive failure at a central processing facility using an evolving disk drive failure prediction algorithm.
  41. Tharumalingam, Maheswaran, Recording defects on a hard drive.
  42. Merrow, Brian S.; Akers, Larry W., Storage device temperature sensing.
  43. Merrow, Brian S.; Akers, Larry W., Storage device temperature sensing.
  44. Merrow, Brian S., Storage device testing system cooling.
  45. Merrow, Brian S., Storage device testing system cooling.
  46. Merrow, Brian S.; Akers, Larry W., Storage device testing system with a conductive heating assembly.
  47. Ashametra, Saravut; Thaijarearn, Prachearn, Swage key enabling simultaneous transfer of two head gimbal assemblies onto two corresponding actuator pivot flex assembly arms.
  48. Fan, Chiou-Lin; Huang, Ying-Chih; Chen, Chin-Feng, System for testing hard disks.
  49. Vaver, Jon G., Systems and methods for tracking the reliability of communications networks.
  50. Merrow, Brian S., Temperature control within disk drive testing systems.
  51. Merrow, Brian S., Temperature control within disk drive testing systems.
  52. Merrow, Brian S., Temperature control within storage device testing systems.
  53. Merrow, Brian S.; Krikorian, Nicholas C., Test slot cooling system for a storage device testing system.
  54. Merrow, Brian S.; Krikorian, Nicholas C., Test slot cooling system for a storage device testing system.
  55. Messenger, Carl R.; Strecke, Karsten C., Testing data storage devices running different versions of an operating system.
  56. Merrow, Brian S., Thermal control system for test slot of test rack for disk drive testing system with thermoelectric device and a cooling conduit.
  57. Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring disk drives within disk drive testing systems.
  58. Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring disk drives within disk drive testing systems.
  59. Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring storage devices within storage device testing systems.
  60. Toscano, John; Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring storage devices within storage device testing systems.
  61. Toscano, John; Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring storage devices within storage device testing systems.
  62. Gough,Ross E.; Rivkin,Steven Neal, Using a genetic algorithm to select a subset of quality metrics as input to a disk drive failure prediction algorithm.
  63. Sungkhaphong, Komgrit; Jaisorn, Chalermpon, Vacuum embedded bit for screw drivers.
  64. Chhajed, Parag K., Vacuum nozzle having back-pressure release hole.
  65. Wong, Kelvin; Sungkhaphong, Komgrit, Vacuum pick-up end effector with improved vacuum reading for small surface.
  66. Merrow, Brian S., Vibration isolation within disk drive testing systems.
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