초록 ▼

A programmable voltage divider has normal and test modes of operation. The divider includes first and second supply nodes, a divider node that provides a data value, and a first divider element that is coupled between the first supply node and the divider node. The divider also includes a controlled

A programmable voltage divider has normal and test modes of operation. The divider includes first and second supply nodes, a divider node that provides a data value, and a first divider element that is coupled between the first supply node and the divider node. The divider also includes a controlled node, a second divider element that has a selectable resistivity and that is coupled between the divider node and the controlled node, and a test circuit that is coupled between the controlled node and the second supply node. During the normal mode of operation, the first and second divider elements generate the data value having a first logic level when the second divider element has a first resistivity, and generate the data value having a second logic level when the second divider element has a second resistivity. The test circuit generates a first voltage at the controlled node during the normal mode of operation, and generates a second voltage at the controlled node during the test mode of operation. The test circuit may generate the first and second voltages by varying its impedance, or by switching in and out one or more fixed voltages.

대표청구항 ▼

A programmable voltage divider has normal and test modes of operation. The divider includes first and second supply nodes, a divider node that provides a data value, and a first divider element that is coupled between the first supply node and the divider node. The divider also includes a controlled

A programmable voltage divider has normal and test modes of operation. The divider includes first and second supply nodes, a divider node that provides a data value, and a first divider element that is coupled between the first supply node and the divider node. The divider also includes a controlled node, a second divider element that has a selectable resistivity and that is coupled between the divider node and the controlled node, and a test circuit that is coupled between the controlled node and the second supply node. During the normal mode of operation, the first and second divider elements generate the data value having a first logic level when the second divider element has a first resistivity, and generate the data value having a second logic level when the second divider element has a second resistivity. The test circuit generates a first voltage at the controlled node during the normal mode of operation, and generates a second voltage at the controlled node during the test mode of operation. The test circuit may generate the first and second voltages by varying its impedance, or by switching in and out one or more fixed voltages. equency ωpeak. 8. An apparatus according to claim 1, wherein the forcing waveform is a sine wave at frequency=ωpeak-δ. 9. An apparatus according to claim 1, wherein the forcing waveform is a sine wave at frequency=ωpeak+δ. 10. An apparatus according to claim 1, wherein the function generator generates two forcing waveforms constituting sine waves at different frequencies. 11. An apparatus according to claim 1, wherein the function generator generates three forcing waveforms constituting sine waves respectively at frequencies ωpeak,ωpeak-δ, and ωpeak+δ, and the wire is tested with: a pulse from the pulse generator alone; a pulse from the pulse generator and a sine wave at frequency=ωpeak; a pulse from the pulse generator and a sine wave at frequency=ωpeak-δ; and a pulse from the pulse generator and a sine wave at frequency=ωpeak+δ. 12. A method for monitoring integrity of a wire, comprising the steps of: generating via a pulse generator a pulse waveform for transmission through the wire; generating via a function generator a forcing waveform for transmission through the wire; transmitting the pulse waveform through the wire by itself; and transmitting the pulse waveform through the wire in combination with the forcing waveform; and measuring a change in dissipation factor values along the wire. 13. A method according to claim 12, further comprising a step of measuring a reflected waveform from the transmitted pulse waveform. 14. A method according to claim 13, further comprising a step of measuring the reflected waveform in the case of transmitting the pulse waveform through the wire by itself, and in the case of transmitting the pulse and forcing waveforms together. 15. A method according to claim 12, wherein the forcing waveform is a sine wave at frequency ωpeak. 16. A method according to claim 12, wherein the forcing waveform is a sine wave at frequency=ωpeak-δ. 17. A method according to claim 12, wherein the forcing waveform is a sine wave at frequency=ωpeak+δ. 18. A method according to claim 12, wherein the function generator generates two forcing waveforms constituting sine waves at different frequencies. 19. A method according to claim 12, wherein the function generator generates three forcing waveforms constituting sine waves respectively at frequencies ωpeak,ωpeak-δ, and ωpeak+δ, all three of which forcing waveforms, together with the pulse waveform, are respectively transmitted through the wire.