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Microbolometer and method for forming 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-031/0376
  • H01L-031/20
출원번호 US-0557748 (2000-04-25)
발명자 / 주소
  • Gooch, Roland W.
  • Schimert, Thomas R.
  • McCardel, William L.
  • Ritchey, Bobbi A.
출원인 / 주소
  • Raytheon Company
대리인 / 주소
    Baker Botts L.L.P.
인용정보 피인용 횟수 : 59  인용 특허 : 64

초록

A microbolometer is provided that includes an absorber element having material properties to change temperature in response to absorbing infrared radiation. An amorphous silicon detector is thermally coupled to the absorber element and is suspended above a silicon substrate at a height of one-quarte

대표청구항

A microbolometer is provided that includes an absorber element having material properties to change temperature in response to absorbing infrared radiation. An amorphous silicon detector is thermally coupled to the absorber element and is suspended above a silicon substrate at a height of one-quarte

이 특허에 인용된 특허 (64)

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이 특허를 인용한 특허 (59)

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  4. Ajisawa, Akira, Bolometer type infrared detector.
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  6. Brady, John F.; Syllaios, Athanasios J.; Schimert, Thomas R.; McCardel, William L.; Gooch, Roland W., Color correction for radiation detectors.
  7. Hiliali, Mohamed M.; Herner, S. Brad, Creation and translation of low-relief texture for a photovoltaic cell.
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