초록 ▼

A method and system for phase angle diagnostics in a sinusoidally excited PM electric machine, including: a controller that executes a process to facilitate the method including receiving a position value indicative of the rotational position from a position sensor configured to measure a rotor posi

A method and system for phase angle diagnostics in a sinusoidally excited PM electric machine, including: a controller that executes a process to facilitate the method including receiving a position value indicative of the rotational position from a position sensor configured to measure a rotor position of said electric machine and transmit a position signal; receiving a phase advance value indicative of a commanded phase advance angle; determining an expected phase voltage and expected status thereof; observing a selected phase voltage signal and determining an actual status corresponding thereto; and comparing the expected status and the actual status.

대표청구항 ▼

A method and system for phase angle diagnostics in a sinusoidally excited PM electric machine, including: a controller that executes a process to facilitate the method including receiving a position value indicative of the rotational position from a position sensor configured to measure a rotor posi

A method and system for phase angle diagnostics in a sinusoidally excited PM electric machine, including: a controller that executes a process to facilitate the method including receiving a position value indicative of the rotational position from a position sensor configured to measure a rotor position of said electric machine and transmit a position signal; receiving a phase advance value indicative of a commanded phase advance angle; determining an expected phase voltage and expected status thereof; observing a selected phase voltage signal and determining an actual status corresponding thereto; and comparing the expected status and the actual status. ent has a linear temperature/resistance characteristic curve. 8. The device according to claim 6, wherein the measuring circuit of the multivibrator in the semiconductor component has a greater temperature-dependence than the driver circuit of the multivibrator. 9. The device according to claim 5, wherein the measuring circuit in the semiconductor component has a linear temperature/resistance characteristic curve. 10. The device according to claim 9, wherein the measuring circuit of the multivibrator in the semiconductor component has a greater temperature-dependence than the driver circuit of the multivibrator. 11. The device according to claim 5, wherein the measuring circuit of the multivibrator in the semiconductor component has a greater temperature-dependence than the driver circuit of the multivibrator. 12. A device for determining an operating temperature of a semiconductor component during operation, the semiconductor component comprising a PROM memory area which can be read from the outside, and a programming device for programming the PROM memory area of the semiconductor component, comprising a multivibrator for generating a measurement signal which comprises a measuring circuit and a driver circuit, the frequency of the measurement signal depending on the temperature of the measuring circuit in the semiconductor component, and a frequency counter for sensing the frequency of the measurement signal in a predefined measuring interval, wherein the measuring circuit of the multivibrator in the semiconductor component has a greater temperature-dependence than the driver circuit of the multivibrator.