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A testing apparatus and a fabricating method of a semiconductor integrated circuit device for reducing the fabrication cost by placing, in the wafer level burn-in, divided contactors in equally contact with the full surface of wafer, enabling repair of each contactor and improving the yield of conta

A testing apparatus and a fabricating method of a semiconductor integrated circuit device for reducing the fabrication cost by placing, in the wafer level burn-in, divided contactors in equally contact with the full surface of wafer, enabling repair of each contactor and improving the yield of contactors. The cassette structure of the mechanical pressurizing system in the testing apparatus is structured with a plurality of divided silicon contactor blocks and a guide frame for integrating these blocks and employs the wafer full surface simultaneous contact system of the divided contactor integration type. Each probe of the silicon contactor is equally placed in contact in the predetermined pressure with each test pad of each chip of the test wafer by mechanically pressuring each silicon contactor block which moves individually, the test control signal is supplied to each chip and this test result signal is obtained for the wafer level burn-in test.

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1. A semiconductor integrated circuit device fabrication method comprising: performing an electrical test to a plurality of wafer surface regions over a major surface of a wafer, each of said plurality of wafer surface regions including a plurality of chip regions, using a plate holding structure

1. A semiconductor integrated circuit device fabrication method comprising: performing an electrical test to a plurality of wafer surface regions over a major surface of a wafer, each of said plurality of wafer surface regions including a plurality of chip regions, using a plate holding structure integrally holding a plurality of wiring/stylus composite plates, each of said wiring/stylus composite plates including a first wiring film structure having a plurality of test stylus sections electrically connected thereto, each of the test stylus sections having a stylus tip portion contacting one of a plurality of terminals in one of the wafer surface regions in said performing the electrical test. 2. A semiconductor integrated circuit device fabrication method according to claim 1, wherein said electrical test is a wafer level burn-in test. 3. A semiconductor integrated circuit device fabrication method according to claim 1, wherein, prior to said performing the electrical test, a plurality of semiconductor elements are formed on said wafer. 4. A semiconductor integrated circuit device fabrication method according to claim 1, wherein said plurality of wiring/stylus composite plates are composite plates divided from each other and integrated together by an integrating structure. 5. A semiconductor integrated circuit device fabrication method according to claim 1, wherein each of said plurality of wiring/stylus composite plates contacts terminals of a plurality of said chip regions. 6. A semiconductor integrated circuit device fabrication method according to claim 1, wherein said wiring/stylus composite plates include a material having a thermal expansion coefficient the same as that of the wafer.