초록

A ray-based interaction system and related techniques are described. The ray-based interaction system and rendering techniques can be used to display haptic interactions between objects having one or more dimensions and a haptic probe modeled as a line segment.

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A ray-based interaction system and related techniques are described. The ray-based interaction system and rendering techniques can be used to display haptic interactions between objects having one or more dimensions and a haptic probe modeled as a line segment. deviation. 10. The recording medium as

A ray-based interaction system and related techniques are described. The ray-based interaction system and rendering techniques can be used to display haptic interactions between objects having one or more dimensions and a haptic probe modeled as a line segment. deviation. 10. The recording medium as set forth in claim 9, wherein said controller judges that an integrated circuit having a maximum G/SD is in failure, when said standard deviation is greater than said threshold value. 11. The recording medium as set forth in claim 10, wherein said apparatus further includes a normalizer which normalizes said spectrum and replaces the previous spectrum with the normalized spectrum. 12. The recording medium as set forth in claim 9, wherein said controller judges an integrated circuit to be in failure, if said value is greater than said threshold value, and judges an integrated circuit to be in no failure, if said value is equal to or smaller than said threshold value. 13. The recording medium as set forth in claim 9, wherein said apparatus further includes a second memory in which said threshold value is to be stored. 14. The recording medium as set forth in claim 8, wherein said apparatus further includes a normalizer which normalizes said spectrum and replaces the previous spectrum with the normalized spectrum. 15. A recording medium readable by a computer, storing a program therein for causing a computer to carry out a method of detecting an integrated circuit in failure among integrated circuits, based on spectrum which is a result of analyzing a frequency of a current running through an integrated circuit when a test signal is applied to said integrated circuit, without preparing data of an integrated circuit in no failure, as a reference, said method comprising the steps of: (a) assuming that all integrated circuits under test define a under-test integrated circuit set, and testing each one of said integrated circuits in said under-test integrated circuit set to judge if any of one of said integrated circuits is in failure; (b) modifying said under-test integrated circuit set by removing integrated circuits having been judged to be in failure in said step (a), from said under-test integrated circuit set; (c) measuring spectrum of a current associated with each one of said integrated circuits in said under-test integrated circuit set modified in step (b); (d) calculating both a mean value and standard deviation of said spectrum for said under-test integrated circuit set modified in step (b); (e) judging whether an integrated circuit in said under-test integrated circuit set modified in step (b) is in failure or not failure, based on both said mean value and said standard deviation of said spectrum; (f) modifying said under-test integrated circuit set by removing integrated circuits having been judged to be in failure in said step (e), from said under-test integrated circuit set; and (g) judging said under-test integrated circuit set modified in step (f) to be in no failure. 16. The recording medium as set forth in claim 15, wherein said method further includes the step (h) of normalizing said spectrum, said step (h) being to be carried out subsequently to said step (c). 17. The recording medium as set forth in claim 16, wherein said step (h) further includes the steps of: (h1) summing up spectrum for all frequencies to have a total; and (h2) calculating a ratio of spectrum for each one of frequencies to said total. 18. The recording medium as set forth in claim 15, wherein said step (e) further includes the steps of: (e1) calculating a gap between said spectrum and said mean value; (e2) dividing said gap by said standard deviation; (e3) comparing a quotient obtained in said step (e2) to a predetermined value; and (e4) judging an integrated circuit to be in failure, if said quotient is greater than said predetermined value, and judging an integrated circuit to be in no failure, if said quotient is equal to or smaller than said predetermined value. 19. A method of detecting an integrated circuit in failure among integrated circuits, based on spectrum which is a result of analyzing a frequency of a current running through an integrated circuit when a test signal i s applied to said integrated circuit, without preparing data of an integrated circuit in no failure, as a reference, said method comprising the steps of: (a) assuming that all integrated circuits under test define a under-test integrated circuit set, and testing each one of said integrated circuits in said under-test integrated circuit set to judge if any of one of said integrated circuits is in failure; (b) modifying said under-test integrated circuit set by removing integrated circuits having been judged to be in failure in said step (a), from said under-test integrated circuit set; (c) measuring spectrum of a current associated with each one of said integrated circuits in said under-test integrated circuit set modified in step (b); (d) calculating both a mean value and standard deviation of said spectrum for said under-test integrated circuit set modified in step (b); (e) judging whether an integrated circuit is in failure or in no failure, based on both said mean value and said standard deviation of said spectrum; (f) modifying said under-test integrated circuit set by removing integrated circuits having been judged to be in failure in said step (e), from said under-test integrated circuit set; and (g) judging said under-test integrated circuit set modified in step (f) to be in no failure, wherein said method further comprises step (h) normalizing said spectrum, said step (h) being carried out subsequently to said step (c) and comprising the steps of: (h1) summing up spectrum for all frequencies to have a total; and (h2) calculating a ratio of spectrum of each one of frequencies to said total. 20. A method of detecting an integrated circuit in failure among integrated circuits, based on spectrum which is a result of analyzing a frequency of a current running through an integrated circuit when a test signal is applied to said integrated circuit, without preparing data of an integrated circuit in no failure, as a reference, said method comprising the steps of: (a) assuming that all integrated circuits under test define a under-test integrated circuit set, and testing each one of said integrated circuits in said under-test integrated circuit set to judge if any of one of said integrated circuits is in failure; (b) modifying said under-test integrated circuit set by removing integrated circuits having been judged to be in failure in said step (a), from said under-test integrated circuit set; (c) measuring spectrum of a current associated with each one of said integrated circuits in said under-test integrated circuit set modified in step (b); (d) calculating both a mean value and standard deviation of said spectrum for said under-test integrated circuit set modified in step (b); (e) judging whether an integrated circuit is in failure or in no failure, based on both said mean value and said standard deviation of said spectrum; (f) modifying said under-test integrated circuit set by removing integrated circuits having been judged to be in failure in said step (e), from said under-test integrated circuit set; and (g) judging said under-test integrated circuit set modified in step (f) to be in no failure, wherein said step (e) further includes the steps of: (e1) calculating a gap between said spectrum and said mean value; (e2) dividing said gap by said standard deviation; (e3) comparing a quotient obtained in said step (e2) to a predetermined value; and (e4) judging an integrated circuit to be in failure, if said quotient is greater than said predetermined value, and judging an integrated circuit to be in no failure, if said quotient is equal to or smaller than said predetermined value.