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Low distortion kinematic reticle support 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • A61N-005/00
  • G21G-005/00
  • G21K-005/10
출원번호 US-0952444 (2001-09-13)
발명자 / 주소
  • Novak, W. Thomas
출원인 / 주소
  • Nikon Corporation
대리인 / 주소
    Pennie & Edmonds LLP
인용정보 피인용 횟수 : 25  인용 특허 : 39

초록

A chuck assembly for use in semiconductor processing equipment includes elements that permit reticle expansion and assembly misalignment without additional reticle deformation. Reticle expansion is allowed by flexible support elements that are positioned to move in the direction of expansion, but th

대표청구항

A chuck assembly for use in semiconductor processing equipment includes elements that permit reticle expansion and assembly misalignment without additional reticle deformation. Reticle expansion is allowed by flexible support elements that are positioned to move in the direction of expansion, but th

이 특허에 인용된 특허 (39)

  1. Prikryl Ivan (Colorado Springs CO) Hall Hollis O\Neal (Colorado Springs CO), Adjustable optical test apparatus including interferometer with micromirror and alignment observation system.
  2. Nishi Kenji (Kawasaki JPX), Alignment system for exposure apparatus.
  3. Bowen John P., Apparatus and a method for measurement of wedge in optical components.
  4. Ono Kazuya (Yokohama JPX) Yamane Yukio (Yokohama JPX), Apparatus and method for exposure.
  5. Eisler Gyula (81/a ; Endrodi Sndor utca 1026 Budapest HUX), Apparatus for adjusting the angular position of optical elements.
  6. Ikeda Masatoshi (Tokyo JPX), Apparatus for holding a lens barrel for providing accurate lens adjustment regardless of environmental conditions.
  7. Chappelow Ronald E. (Jeffersonville VT) Conrad Edward W. (Jeffersonville VT), Apparatus for identifying and distinguishing temperature and system induced measuring errors.
  8. Renander Ake C. (Hovas SEX) Samuelsson Rune P. S. (Angered SEX), Arrangement for adjustably mounting an optical direction indicator.
  9. O\Brien Michael J. (Rochester NY) Smith William B. (Rochester NY), Athermalized beam source and collimator lens assembly.
  10. Novak W. Thomas, Dual guide beam stage mechanism with yaw control.
  11. Matsushita Koichi (Chiba JPX) Isohata Junji (Tokyo JPX) Yamamoto Hironori (Chigasaki JPX) Miyazaki Makoto (Yokohama JPX) Ozawa Kunitaka (Isehara JPX) Yoshinari Hideki (Yokohama JPX), Exposure apparatus.
  12. Takabayashi Yukio (Kawasaki JPX) Tokuda Yukio (Kawasaki JPX), Exposure apparatus having mount means to suppress vibrations.
  13. Chandler Jasper S. (Rochester NY), Flexure supported read head.
  14. Hale Layton C. ; Jensen Steven A., Highly damped kinematic coupling for precision instruments.
  15. La Plante John A. (Winchester MA) Schaefer Robert D. (Huntington Beach CA), Kinematic mount.
  16. Marc Spinali, Kinematic optical mounting.
  17. Archibald John H. (P.O. Box 283 Golden CO 80401), Kinematic restraint.
  18. Jessop Thomas C. (Webster NY), Lens adjustment apparatus.
  19. Kendall Rodney A. (Fairfield County CT), Lithography tool with vibration isolation.
  20. Deschenaux Warren (Shelton CT) Hughes Gregory (Norwalk CT) Kreuzer Justin (Trumbull CT) La Fiandra Carlo (New Canaan CT), Mask ring assembly for X-ray lithography.
  21. Okumura Masahiko,JPX, Method and apparatus for aligning a mask and a set of substrates to be exposed.
  22. Watson Douglas C., Method and apparatus for compensating for reaction forces in a stage assembly.
  23. Loopstra Erik R.,NLX, Method and apparatus for repetitively projecting a mask pattern on a substrate, using a time-saving height measurement.
  24. Nishi Kenji (Kawasaki JPX), Method and apparatus for the alignment of a substrate.
  25. Umatate Toshikazu (Kawasaki JPX) Suzuki Hiroyuki (Tokyo JPX), Method for successive alignment of chip patterns on a substrate.
  26. Ota Kazuya (Tokyo JPX), Method of determining regularity of a pattern array to enable positioning of patterns thereof relative to a reference po.
  27. Galburt Daniel N. (520 Belden Hill Rd. Wilton CT 06897), Microlithographic apparatus.
  28. Shiraishi Takashi,JPX, Optical exposure unit and image forming unit used in optical exposure unit.
  29. Yoshitake Shusuke,JPX ; Itoh Masamitsu,JPX ; Takigawa Tadahiro,JPX, Pattern transfer apparatus, an operation management system thereof, and an operation management system for a semiconduct.
  30. Bacich John J. (Brookfield CT), Precision lens mounting.
  31. Novak W. Thomas (Hillsborough CA) Premji Zahirudeen (Boulder CO) Nayak Uday G. (San Jose CA) Ebihara Akimitsu (San Mateo CA), Precision motion stage with single guide beam and follower stage.
  32. Novak W. Thomas ; Premji Zahirudeen ; Nayak Uday G. ; Ebihara Akimitsu, Precision motion stage with single guide beam and follower stage.
  33. Unno Yasuyuki,JPX ; Orii Seiji,JPX ; Yonekawa Masami,JPX, Projection optical system, exposure apparatus and semiconductor-device manufacturing method using the system.
  34. Sullivan Mark T. (1661 18th Ave. San Francisco CA 94122), Rotating kinematic optic mount.
  35. Albrecht Thomas R. (San Jose CA) Dovek Moris-Musa (Portola Valley CA) Kirk Michael D. (San Jose CA) Park Sang-IL (Palo Alto CA), Scanning force microscope having aligning and adjusting means.
  36. Nakai Akiya (Tokyo JPX), Semiconductor device manufacturing method wherein the substrate is interferically aligned by measuring the rotation of t.
  37. Moreno Isabel L. (Oceanside CA), Thermal compensator assembly.
  38. Miyai Tsuneo (Tokyo JPX) Imai Yuji (Ohmiya JPX) Taniguchi Tetsuo (Yokohama JPX) Suzuki Kousuke (Kawasaki JPX), Thermal distortion compensated projection exposure method and apparatus for manufacturing semiconductors.
  39. Toshima Masato, Wafer transfer system and method of using the same.

이 특허를 인용한 특허 (25)

  1. Sorg, Franz; Wurmbrand, Andreas; Petasch, Thomas; Schaffer, Dirk; Wahl, Siegfried, Device for the low-deformation replaceable mounting of an optical element.
  2. Sorg,Franz; Wurmbrand,Andreas; Petasch,Thomas; Schaffer,Dirk; Wahl,Siegfried, Device for the low-deformation replaceable mounting of an optical element.
  3. Heerens,Gart Jan; Ham,Erik Leonardus; Van De Ven,Bastiaan Lambertus Wilhemus Marinus, Mask handling method, and mask and device or apparatus comprising a gripper therefor, device manufacturing method and device manufactured thereby.
  4. Ono, Kazuyuki, Movable stage apparatus.
  5. Ono,Kazuyuki, Movable stage apparatus.
  6. Heise, Heino; Nolte, Andreas; Thomas, Christian; Edelmann, Martin; Wolf, Uwe; Kohlhaas, Ulrich; Lysenkov, Dmitry, Specimen holder having alignment marks.
  7. Lin, Mou-Shiung, Top layers of metal for high performance IC's.
  8. Lin, Mou-Shiung, Top layers of metal for high performance IC's.
  9. Lin, Mou-Shiung, Top layers of metal for high performance IC's.
  10. Lin, Mou-Shiung, Top layers of metal for high performance IC's.
  11. Lin, Mou-Shiung, Top layers of metal for high performance IC's.
  12. Lin, Mou-Shiung, Top layers of metal for high performance IC's.
  13. Lin, Mou-Shiung, Top layers of metal for high performance IC's.
  14. Lin,Mou Shiung, Top layers of metal for high performance IC's.
  15. Lin,Mou Shiung, Top layers of metal for high performance IC's.
  16. Lin,Mou Shiung, Top layers of metal for high performance IC's.
  17. Lin,Mou Shiung, Top layers of metal for high performance IC's.
  18. Lin,Mou Shiung, Top layers of metal for high performance IC's.
  19. Lin,Mou Shiung, Top layers of metal for high performance IC's.
  20. Lin,Mou Shiung, Top layers of metal for high performance IC's.
  21. Lin,Mou Shiung, Top layers of metal for high performance IC's.
  22. Lin,Mou Shiung, Top layers of metal for high performance IC's.
  23. Lin,Mou Shiung, Top layers of metal for high performance IC's.
  24. Lin,Mou Shiung, Top layers of metal for high performance IC's.
  25. Lin,Mou Shiung, Top layers of metal for high performance IC's.
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