초록

Devices, systems, and methods for processing sample materials. The sample materials may be located in a plurality of process chambers in the device, which is rotated during heating of the sample materials.

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Devices, systems, and methods for processing sample materials. The sample materials may be located in a plurality of process chambers in the device, which is rotated during heating of the sample materials. er et al., 200/067.E; US-4159563, 19790700, Bauer et al., 029/622; US-4352964, 19821000, Engli

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