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Recipe management system 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06F-019/00
출원번호 US-0274575 (2002-10-21)
발명자 / 주소
  • Chou, Alton
  • Wei, Chen-Hsien
출원인 / 주소
  • Taiwan Semiconductor Manufacturing Co., Ltd.
대리인 / 주소
    Duane Morris LLP
인용정보 피인용 횟수 : 29  인용 특허 : 7

초록

A recipe management system is provided including a processor configured to receive a first job file for a processing tool through a network, said first job file including a master job file for said processing tool. The processor also receives a second job file through the network from a host process

대표청구항

A recipe management system is provided including a processor configured to receive a first job file for a processing tool through a network, said first job file including a master job file for said processing tool. The processor also receives a second job file through the network from a host process

이 특허에 인용된 특허 (7)

  1. La Tho Le ; Shiau Ying, Defect management system for productivity and yield improvement.
  2. Nakamura Takashi CTY Utsunomiya,JPX ; Yamada Yasuyoshi,JPX ; Kyotoku Satoshi,JPX, Exposure unit, exposure system and device manufacturing method.
  3. Elfido Coss, Jr. ; Thomas Sonderman ; Robert W. Anderson, Method and apparatus for implementing corrected species by monitoring specific state parameters.
  4. Chow Wanyee Apple ; Chen Ming C. ; Lin Yung-Tao ; Shiau Ying, Method and apparatus for inspecting manufactured products for defects in response to in-situ monitoring.
  5. Manoj Betawar ; Vrunda Bhagwat ; Dinesh Goradia ; Manish Mehta ; Nitin Parekh, Recipe editor for editing and creating process recipes with parameter-level semiconductor-manufacturing equipment.
  6. Steffan Paul J. ; Yu Allen S., Scan tool recipe server.
  7. Lantz Mikkel ; Shea John ; Guinan Valerie ; Bartlett Richard, Validating process data in manufacturing process management.

이 특허를 인용한 특허 (29)

  1. Holmes,Timothy L.; Cianfrani,Susan M.; Young,Roger M., Automated tool recipe verification and correction.
  2. Bransky,Itai; Omer,Shachor; Simkin,Arkady; Baskin,Igor, Automatic recipe validation.
  3. Dick,Spencer B.; Aldrich,Stuart R.; Morgan,David A.; Hodges,Robert P.; Soot,Simon A.; Carpenter,Jody S.; Gorny,John S., Gauge system.
  4. Dick, Spencer B.; Aldrich, Stuart R.; McClure, Brennan J.; Lee, David L.; Vaughn, Brandon J.; Soot, Simon A.; Gorny, Norman F.; Harris, Matthew T.; Gilmore, Richard R., Gauge system for workpiece processing.
  5. Dick, Spencer B.; Aldrich, Stuart R.; McClure, Brennan J.; Lee, David L.; Vaughn, Brandon J.; Soot, Simon A.; Gorny, Norman F.; Harris, Matthew T.; Gilmore, Richard R., Gauge system for workpiece processing.
  6. Dick,Spencer B.; Aldrich,Stuart; Morgan,David A., Material handling system with saw and wheel drag mechanism.
  7. Dick,Spencer B.; Aldrich,Stuart; Morgan,David A., Material handling systems.
  8. Dick, Spencer B., Material processing system and a material processing method including a saw station and an interface with touch screen.
  9. Sawyer, Philip P.; Morgan, David A.; Lee, David, Method and apparatus for processing material.
  10. Brown,Russell Clinton; Jackson,Thomas P.; Savage, II,Ronald Ivan; Felber,Achim, Method and apparatus to reconcile recipe manager and manufacturing execution system context configurations.
  11. Chung,Jae Woo; Jung,Jun, Method for controlling a semiconductor processing apparatus.
  12. Ahmed, Ejaj; Archie, Charles N.; Goodrich, Stephen W.; Solecky, Eric P.; Vakas, Georgios A.; Weissmann, Erwin E.; Zhou, Lin, Metrology tool recipe validator using best known methods.
  13. Ahmed,Ejaj; Archie,Charles N.; Goodrich,Stephen W.; Solecky,Eric P.; Vakas,Georgios A.; Weissmann,Erwin E.; Zhou,Lin, Metrology tool recipe validator using best known methods.
  14. Dick, Spencer B.; Aldrich, Stuart; Morgan, David A.; Lee, David, Multi-step systems for processing workpieces.
  15. Dick, Spencer B.; Aldrich, Stuart; Morgan, David A.; Lee, David, Multi-step systems for processing workpieces.
  16. Sun, Cheng-I; Fun, Yu Pen; Lo, Yi-Chuan; Huang, Wei-Hsuang; Lin, Hsiang-Ming, Multivariate RBR tool aging adjuster.
  17. Weetman, Chad R., Processing information management in a plasma processing tool.
  18. Weetman, Chad R.; Huang, Chung-Ho; Seto, Jacqueline; Jensen, John, Processing information management system in a plasma processing tool.
  19. Tsai, Jung-Yi; Chang, Chao-Yu; Chiu, Chui-Chung; Tseng, Shu-Jung, Quality assurance system and method.
  20. Chang, Shih-Tzung; Li, Wei-Chin; Liu, Richard; Yin, Jing, Recipe management system and method.
  21. Dick, Spencer B.; McClure, Brennan J.; Tran, Minh Dat Ba, Saw system for miter joints.
  22. Cho, Pyong-II; Sim, Hyun-Sik; Choi, Kyoung-Hwan, Semiconductor equipment control system and method.
  23. Yamamoto, Satoko, Server device, information processing method and program.
  24. Yonebayashi, Toru, Substrate processing apparatus.
  25. Nakagawa, Yoshihiko, Substrate processing apparatus and display method of substrate processing apparatus.
  26. Peters, Dan; Tran, Son V.; Newman, David R.; Antao, Leonard F.; Slagley, David O.; Kolls, H. Brock, Systems and methods for dispensing consumable products.
  27. Peters, Jr., Dan; Tran, Son V.; Newman, David R.; Antao, Leonard F.; Slagley, David O.; Kolls, H. Brock, Systems and methods for dispensing consumable products.
  28. Dick, Spencer B.; Lee, David; Morgan, David A., Systems and methods of processing materials.
  29. Dick,Spencer B.; Aldrich,Stuart; Morgan,David A.; Lee,David, Systems for processing workpieces.
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