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Method for synchronized delta-VBE measurement for calculating die temperature 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01K-007/01
  • G01K-007/16
  • H01L-035/00
출원번호 US-0375297 (2003-02-26)
발명자 / 주소
  • Sheehan, Gary E.
  • Wan, Jun
출원인 / 주소
  • National Semiconductor Corporation
대리인 / 주소
    Patent Law Group LLP
인용정보 피인용 횟수 : 33  인용 특허 : 19

초록

A method for measuring a temperature of an integrated circuit is disclosed. The integrated circuit includes a temperature sensing element being excited by a first switched current and a second switched current. The method includes coupling a first capacitor to the temperature sensing element through

대표청구항

A method for measuring a temperature of an integrated circuit is disclosed. The integrated circuit includes a temperature sensing element being excited by a first switched current and a second switched current. The method includes coupling a first capacitor to the temperature sensing element through

이 특허에 인용된 특허 (19)

  1. Bicking, Robert E., AC-coupled sensor signal conditioning circuit.
  2. Packard Roger E. (Huntington Beach CA) Thomas Jacob E. (Ithaca NY), Cordless electronic thermometer.
  3. Bell, Florian G.; Barton, Donna K.; Laird, Jesse S.; Jones, Christopher T., Digital sensor for miniature medical thermometer, and body temperature monitor.
  4. Pinkham Clinton L. (New Hartford NY), Digital thermometer.
  5. Aslan Mehmet ; Can Sumer, Direct temperature sensing of a semiconductor device semiconductor device.
  6. Thomson, David; Blake, John; Manus, Lorcan Mac, Four current transistor temperature sensor and method.
  7. Ernst H Dummermuth ; Patrick C Herbert ; Steven M. Galecki, Highly sensitive capacitance comparison circuit.
  8. Boeckmann Eduard F. B. (Huntsville AL), Integrated circuit temperature sensor.
  9. Borys S. Senyk, Method and apparatus for monitoring the temperature of a processor.
  10. Doorenbos Jerry L., Method of curvature compensation, offset compensation, and capacitance trimming of a switched capacitor band gap reference.
  11. Nolan James B. ; Darmawaskita Hartono, Precision temperature sensor integrated circuit.
  12. Schneider Georg (Schopfheim-Langenau DEX) Wagner Richard (Maulburg DEX), Processor for processing sensor signals to obtain a desired transfer behavior.
  13. Obata Yosimori (Tokyo JPX), Resistor sensor input apparatus.
  14. Seelbach Walter C. (Scottsdale AZ), Semiconductor temperature sensor.
  15. Tuthill Michael G.,IEX, Switched current temperature sensor circuit with compounded .DELTA.V.sub.BE.
  16. Evoy David R. ; Richardson Nicholas J., System margin and core temperature monitoring of an integrated circuit.
  17. Kurihara Shinji (Gunma JPX), Temperature detecting circuit generating an output signal according to the temperature.
  18. Sanchez Hector ; Alvarez Jose, Temperature sensor.
  19. Wingate Steven L. (420 E. 57th St. #80 Loveland CO 80537), Temperature sensor/controller system.

이 특허를 인용한 특허 (33)

  1. Yoshida,Munehiro, Advanced thermal sensor.
  2. Mielke, Frank C., Apparatus and method for measuring the current consumption and the capacitance of a semiconductor device.
  3. Niederberger, Mark, Arrangement and method for providing a temperature-dependent signal.
  4. Harvey, Barry, Bandgap voltage reference circuits and methods for producing bandgap voltages.
  5. Aslan,Mehmet; Branch,John W., Beta variation cancellation in temperature sensors.
  6. Lin, Xijian; Benzel, Phillip J., CMOS temperature-to-digital converter with digital correction.
  7. Lin, Xijian; Benzel, Phillip J., CMOS temperature-to-digital converter with digital correction.
  8. Harvey, Barry, Circuits and methods to produce a VPTAT and/or a bandgap voltage.
  9. Herbst, Steven G., Circuits and methods to produce a VPTAT and/or a bandgap voltage with low-glitch preconditioning.
  10. Harvey, Barry, Circuits and methods to produce a bandgap voltage with low-drift.
  11. Holloway, Peter R.; Blom, Eric D.; Wan, Jun; Urie, Stuart H., Digitizing temperature measurement system.
  12. Holloway, Peter R.; Blom, Eric D.; Wan, Jun; Urie, Stuart H., Digitizing temperature measurement system and method of operation.
  13. Henderson,Richard; Aslan,Mehmet, Efficient method of sharing diode pins on multi-channel remote diode temperature sensors.
  14. Tesi,Davide; Zampieri,Ugo, Integrated digital temperature sensor.
  15. McLeod,Scott C., Integrated resistance cancellation in temperature measurement systems.
  16. Shih,Kelvin, LED junction temperature tester.
  17. Eberlein, Matthais, Method and apparatus for calibrating a sensor.
  18. Drapkin, Oleg; Temkine, Grigori; Au, Kristina; Chekmazov, Filipp; Edelshteyn, Paul, Method and apparatus for integrated circuit temperature control.
  19. Clabes,Joachim Gerhard; Powell, Jr.,Lawrence Joseph; Stasiak,Daniel Lawrence; Wang,Michael Fan, Method to calibrate a chip with multiple temperature sensitive ring oscillators by calibrating only TSRO.
  20. Franch, Robert L.; Jenkins, Keith A., On chip temperature measuring and monitoring circuit and method.
  21. Franch,Robert L.; Jenkins,Keith A., On chip temperature measuring and monitoring circuit and method.
  22. Franch,Robert L.; Jenkins,Keith A., On chip temperature measuring and monitoring circuit and method.
  23. Franch, Robert L.; Jenkins, Keith A., On chip temperature measuring and monitoring method.
  24. Franch, Robert L.; Jenkins, Keith A., On chip temperature measuring and monitoring method.
  25. Cordan, Ernest; Hunter, Robert; Cornwall, Michael, One pin calibration assembly and method for sensors.
  26. St. Pierre, Robert; McLeod, Scott C., Proportional settling time adjustment for diode voltage and temperature measurements dependent on forced level current.
  27. St. Pierre,Robert; McLeod,Scott C., Proportional settling time adjustment for diode voltage and temperature measurements dependent on forced level current.
  28. Harvey, Barry; Herbst, Steven, Rotating gain resistors to produce a bandgap voltage with low-drift.
  29. Wan, Jun; Holloway, Peter R.; Sheehan, Gary E., Synchronized delta-VBE measurement system.
  30. Schnaitter, William N., System for on-chip temperature measurement in integrated circuits.
  31. Wang, Dong; Yamamoto, Akihisa, Temperature detector.
  32. Miyazaki, Takashi; Hamano, Hiroyuki, Temperature measurement device, integrated circuit, and temperature measurement method.
  33. Tanaka, Nobue, Temperature measuring sensor incorporated in semiconductor substrate, and semiconductor device containing such temperature measuring sensor.
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