$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Kalman filter state estimation for a manufacturing system 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G05B-013/02
  • G06F-019/00
출원번호 US-0209758 (2002-07-31)
발명자 / 주소
  • Pasadyn, Alexander J.
출원인 / 주소
  • Advanced Micro Devices, Inc.
대리인 / 주소
    Williams, Morgan & Amerson
인용정보 피인용 횟수 : 54  인용 특허 : 12

초록

A method for monitoring a manufacturing system includes defining a plurality of observed states associated with the manufacturing system. State estimates are generated for the observed states. An uncertainty value is generated for each of the state estimates. Measurement data associated with an enti

대표청구항

1. A method for monitoring a manufacturing system, comprising:defining a plurality of observed states associated with the manufacturing system;generating state estimates for the observed states;generating an uncertainty value for each of the state estimates;receiving measurement data including assoc

이 특허에 인용된 특허 (12)

  1. Bartusiak Raymond Donald (Houston TX) Fontaine Robert William (Houston TX), Feedback method for controlling non-linear processes.
  2. Yueh William, In-situ endpoint control apparatus for semiconductor wafer polishing process.
  3. Puthenpura Sarat C. (Jackson NJ) Sinha Lakshman P. (East Brunswick NJ), Kalman filter-based optimizer and method and optimizing.
  4. Gough ; Jr. William Albert Gordon (Aldergrove CAX), Method and apparatus for adaptive control.
  5. Uhlmann Jeffrey K., Method and apparatus for fusing mean and covariance estimates.
  6. Jevtic, Dusan; Pool, Mark; Sunkara, Raja, Method and apparatus for managing scheduling in a multiple cluster tool.
  7. Hayner David A., Method and control system for changing the state of a plant.
  8. Patel, Nital S.; Jenkins, Steven T., Method and system for dispatching semiconductor lots to manufacturing equipment for fabrication.
  9. Lange Antti Aarne (Liisankatu 15 A 10 Helsinki 17 FIX 00170 ), Method for fast Kalman filtering in large dynamic system.
  10. Shah Sunil C. ; Pandey Pradeep, Method for real-time nonlinear system state estimation and control.
  11. Tsutsui Hiroaki,JPX ; Kurosaki Atsushi,JPX ; Kamimura Kazuyuki,JPX ; Matsuba Tadahiko,JPX, State estimating apparatus.
  12. Bickford, Randall L., Surveillance system and method having parameter estimation and operating mode partitioning.

이 특허를 인용한 특허 (54)

  1. Choi, DongSub; Widmann, Amir; Kandel, Daniel; Tien, David, Advanced process control optimization.
  2. Denison, David R.; Lewis, Marty James; Wojsznis, Peter; Mehta, Ashish, Analytical server integrated in a process control network.
  3. Neuse, Douglas M.; Matchett, Douglas K.; Walton, Chris, Apparatus and method for capacity planning for data center server consolidation and workload reassignment.
  4. Neuse, Douglas M; Matchett, Douglas K; Walton, Chris, Apparatus and method for capacity planning for data center server consolidation and workload reassignment.
  5. Hartman, Jehuda; Brill, Eyal; Kokolov, Yuri, Apparatus and method for the analysis of a process having parameter-based faults.
  6. Ydstie, Birger Erik, Apparatuses, systems, and methods utilizing adaptive control.
  7. Rozenson, Aleksandr, Computational architecture and method for a time-varying control system.
  8. Fuxman, Adrian Matias; Pachner, Daniel, Condition-based powertrain control system.
  9. Komatsu, Hideaki; Takahashi, Hitomi; Zhang, Gang, Control system design simulation using switched linearization.
  10. Stewart, Greg; Pekar, Jaroslav; Pachner, Daniel, Coordinated engine and emissions control system.
  11. Chong, Robert J.; Miller, Michael L.; Pasadyn, Alexander J.; Green, Eric O., Determining a next tool state based on fault detection information.
  12. Pachner, Daniel; Pekar, Jaroslav, Engine and aftertreatment optimization system.
  13. Wang, Jin; He, Qinghua, Enhanced state estimation based upon information credibility.
  14. Hofmann,Jim, Extended Kalman filter incorporating offline metrology.
  15. Pachner, Daniel, Identification approach for internal combustion engine mean value models.
  16. Mehta, Ashish; Wojsznis, Peter; Lewis, Marty J.; Jundt, Larry O.; Pettus, Nathan W., Method and apparatus for intelligent control and monitoring in a process control system.
  17. Markle, Richard J.; Chong, Robert J.; Pasadyn, Alexander J., Method and apparatus for modifying design constraints based on observed performance.
  18. Matchett, Douglas K.; Palmer, Annette S.; Wise, Timothy E.; Lehr, Ted, Method and apparatus for organizing, visualizing and using measured or modeled system statistics.
  19. Lefebvre,Wesley Curt; Kohn,Daniel W., Method and system for SCR optimization.
  20. Stirton, James Broc; Holfeld, Andre, Method and system for advanced process control using a combination of weighted relative bias values.
  21. Malig, Hans-Juergen; Stirton, James Broc, Method and system for advanced process control using measurement uncertainty as control input.
  22. Rosenof,Howard; Lefebvre,W. Curt; Kohn,Daniel W.; Spinney,Peter, Method and system for calculating marginal cost curves using plant control models.
  23. Wang,Eugene; Ni,Jinghua, Method and system for processing commonality of semiconductor devices.
  24. Vanderwerf, Kevin D., Method and system for providing integrity for hybrid attitude and true heading.
  25. Wang,Eugene, Method and system for reliability similarity of semiconductor devices.
  26. Lefebvre,W. Curt; Kohn,Daniel W., Method and system for sootblowing optimization.
  27. Wang, Eugene, Method and system for yield similarity of semiconductor devices.
  28. Patel, Nital S.; Carson, Steven L., Method for consistent updates to automated process control (APC) models with partitioning along multiple components.
  29. Lefebvre,Wesley Curt; Kohn,Daniel W., Method for implementing indirect controller.
  30. Lefebvre,Wesley Curt; Kohn,Daniel W., Method for implementing indirect controller.
  31. Lefebvre,Wesley Curt; Kohn,Daniel W., Method for implementing indirect controller.
  32. Lefebvre, W. Curt; Kohn, Daniel W., Method for sootblowing optimization.
  33. Lefebvre, W. Curt; Kohn, Daniel W., Method for sootblowing optimization.
  34. Feng, Jian-Huei; Jiang, Ming; Newman, Clayton R.; Wong, Yeak-Chong, Methods for providing asymmetric run to run control of process parameters.
  35. Feng, Jian-Huei; Jiang, Ming; Newman, Clayton R.; Wong, Yeak-Chong, Methods for providing run to run process control using a dynamic tuner.
  36. Sayyar-Rodsari, Bijan, Model Predictive control system and method for reduction of steady state error.
  37. Benosman, Mouhacine; Di Cairano, Stefano, Model predictive control with uncertainties.
  38. Vanderwerf, Kevin, Navigation system with apparatus for detecting accuracy failures.
  39. Vanderwerf, Kevin, Navigation system with apparatus for detecting accuracy failures.
  40. Middlebrooks,Scott A., Observability in metrology measurements.
  41. Mos, Everhardus Cornelis; Dusa, Mircea; Finders, Jozef Maria; De Mol, Christianus Gerardus Maria; Middlebrooks, Scott Anderson; Wangli, Dongzi, Optimization method and a lithographic cell.
  42. Taylor, Mark P.; Chen, John J. J., Process control of an industrial plant.
  43. Caldwell, John M.; Blevins, Terrence L.; Wojsznis, Peter; Wojsznis, Wilhelm K., Process model identification in a process control system.
  44. Kumar, Dinesh; Tantawi, Asser N.; Zhang, Li, Real-time performance modeling of software systems with multi-class workload.
  45. Wojsznis, Wilhelm K.; Mehta, Ashish; Thiele, Dirk, Robust process model identification in model based control techniques.
  46. James, John Robert; McDermott, John; Piche, Stephen; Pickard, Fred; Parikh, Neel J., Sootblowing optimization for improved boiler performance.
  47. James, John Robert; McDermott, John; Piche, Stephen; Pickard, Fred; Parikh, Neel J., Sootblowing optimization for improved boiler performance.
  48. Lefebvre, W. Curt; Kohn, Daniel W., System and method for assigning credit to process inputs.
  49. Zink, Kenneth C.; Neuse, Douglas M.; Walton, Christopher B., System and method for capacity planning for systems with multithreaded multicore multiprocessor resources.
  50. Zink, Kenneth C.; Neuse, Douglas M.; Walton, Christopher B., System and method for capacity planning for systems with multithreaded multicore multiprocessor resources.
  51. Ang, Swee Keng; Mohamed, Hanif Bin Mohamed; Tan, Joo Ming Jackson, System and method for measuring tool performance.
  52. Esmaili, Ali; Mehta, Sanjay; Neogi, Debashis; Valenzuela, Carlos A., System and method for process monitoring.
  53. Kahn, Aaron D., System and method of improved kalman filtering for estimating the state of a dynamic system.
  54. Markham, Thomas R., Vehicle security module system.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로