[특허]Portable laser plasma spectroscopy apparatus and method for in situ identification of deposits

[미국특허] Portable laser plasma spectroscopy apparatus and method for in situ identification of deposits 원문보기

IPC분류정보
국가/구분	United States(US) Patent 등록
국제특허분류(IPC7판)	G01J-003/30 G01N-021/00
출원번호	US-0152349 (2002-05-22)
발명자 / 주소	Benicewicz, Pamela Travaly, Andrew Joseph Wu, Pingfan Rozier, Elena
출원인 / 주소	General Electric Company
대리인 / 주소	Nixon & Vanderhye PC
인용정보	피인용 횟수 : 18 인용 특허 : 12

초록 ▼

A portable Laser Plasma Spectroscopy (LPS) system and process is provided for performing in situ, near-real time, remote elemental analysis and identification of deposits or other foreign material found on surfaces of machine parts, such as turbine compressor blades or the like, wherein identification of the elemental constituents of a particular deposit is obtained without incurring significant ablative damage to the machine part substrate material underlying the deposit.

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1. A method for performing Laser Plasma Spectroscopy (LPS) on a foreign substance or deposit found on a surface of a machine part or object, comprising the steps of:a) collecting tight emitted from a plasma generated by focusing a predetermined amount of laser output light energy onto a surface of a machine part or object;b) directing at least a portion of light collected in step (a) to an optical filter that only passes one predetermined narrow wavelength band containing elemental atomic emission wavelengths that are characteristic of one or more elemental components of a characteristic material comprising said machine part or object;c) detecting an amount of light passed by said filter; andd) preventing further laser output light energy from impinging on the machine part or object when light in step (c) is detected;wherein an identification of one or more elemental constituents of the foreign substance or deposit found on a surface of a machine part or object is obtained through LPS without incurring further ablation to the characteristic material of the machine part or object that lies beneath the foreign substance or deposit. 2. The method of claim 1 wherein a plasma is generated from one or more pulses of laser output light energy. 3. The method of claim 2 wherein each pulse of laser output light energy is focused to an intensity of 1 GW/cm 2 or greater. 4. The method of claim 1 wherein preventing step (d) comprises activating a shutter to block said laser output energy. 5. The method of claim 4 wherein the shutter comprises a mechanical shutter. 6. The method of claim 1 wherein said portion of light in step (b) is directed to the optical filter by using one branch portion of a bifurcated fiber optic cable. 7. The method of claim 1 wherein said portion of light in step (b) is directed to the optical filter by a beam splitter. 8. The method of claim 1 wherein 10% of light collected in step (a) is directed to the optical filter. 9. The method of claim 1 further comprising the step of directing a portion of light collected in step (a) to a spectrometer device. 10. The method of claim 2 wherein further pulses of laser output light energy are prevented from impinging on the machine part or object after a single laser output light energy pulse produces light detected in step (c). 11. The method of claim 1 wherein the machine part or object is a turbine compressor blade. 12. The method of claim 1 wherein the machine part or object is a component in power generating equipment. 13. A portable LPS apparatus for providing in situ elemental analysis of a foreign substance or deposit located on a surface of a machine part or object, comprising:a laser device;a spectrometer device;a semiconductor array detector device coupled to the spectrometer device for detecting a spectrum of light resolved by the spectrometer device;a low-level light detecting device;an optical fiber probe for delivering the laser device output light energy to a location on a surface of a machine part or object that is remote from the LPS apparatus; means for collecting light radiation emitted from a plasma created during LPS;a timing source for controlling on/off gating of the array detector and the low-level light detecting device at a substantially identical time and duration during an LPS plasma evolution event;means for providing a portion of collected plasma light radiation to the low-level light detecting device;a bandpass filter arrangement for limiting the portion of collected plasma light radiation provided to the low-level light detecting device to one predetermined narrow wavelength band encompassing an elemental atomic emission wavelength or wavelengths that are characteristic of one or more elemental components of a characteristic material comprising the machine part or object; anda shutter device for preventing laser output light energy from reaching a surface of said machine part or object in response to light of a specific range of wavelengths d etected by the low-level light detecting device;wherein identification of the elemental constituents of the foreign substance or deposit is obtained without incurring substantial ablation of a machine part or object substrate material underlying the foreign substance or deposit. 14. The apparatus of claim 13 further comprising a laser light impenetrable housing which encloses one or more optical components. 15. The apparatus of claim 13 wherein the optical fiber probe is contained within a flexible protective sheath. 16. The apparatus as defined by claim 15 wherein the protective sheath incorporates a lens positioned at an output end of the fiber and a sheath that extends beyond the lens at least an amount equal to a focal length of the lens. 17. The apparatus of claim 13 further comprising a portable computing device for performing an analysis on data collected by the array detector to determine an emission spectra profile of collected plasma light radiation. 18. The system according to claim 17 wherein the analysis is performed by the portable computing device substantially in real time. 19. The system according to claim 17 wherein the emission spectra profile of collected plasma light radiation is displayed by the computing device as a graph of intensity vs. wavelength. 20. The apparatus of claim 13 wherein the machine part or object is a turbine compressor blade. 21. The apparatus of claim 13 wherein the machine part or object is a component in power generating equipment.

이 특허에 인용된 특허 (12) 인용/피인용 타임라인 분석

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Miles Brian Herndon ; Cooper Stafford S. ; Cespedes Ernesto R. ; Theriault Greg A., Standoff laser induced-breakdown spectroscopy penetrometer system.
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이 특허를 인용한 특허 (18) 인용/피인용 타임라인 분석

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A	생활필수품
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[미국특허] Portable laser plasma spectroscopy apparatus and method for in situ identification of deposits 원문보기

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[미국특허] Portable laser plasma spectroscopy apparatus and method for in situ identification of deposits 원문보기

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이 특허에 인용된 특허 (12) 인용/피인용 타임라인 분석

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