[특허]System for dimensioning objects using at least one light beam offset relative to a perpendicular from an object supporting surface

IPC분류정보
국가/구분	United States(US) Patent 등록
국제특허분류(IPC7판)	G01B-011/14
출원번호	US-0766815 (2001-01-22)
발명자 / 주소	Wurz, Albert Romaine, John E. Martin, David L.
출원인 / 주소	Accu-Sort Systems, Inc.
대리인 / 주소	Volpe and Koenig, P.C.
인용정보	피인용 횟수 : 8 인용 특허 : 41

초록 ▼

The present invention provides a dimensioning system for determining the minimum size box necessary to enclose an object traveling on a moving conveyor. The dimensioning system is comprised of a light source which generates a scan beam that is moved by a mirrored wheel. A line scan camera whose fiel

The present invention provides a dimensioning system for determining the minimum size box necessary to enclose an object traveling on a moving conveyor. The dimensioning system is comprised of a light source which generates a scan beam that is moved by a mirrored wheel. A line scan camera whose field of view tracks the moving scan beam receives images of the scan beam and outputs a signal which is processed to compute a three dimensional box structure of the scanned object.

대표청구항 ▼

1. An apparatus for measuring an object on a support surface comprising:a chassis;a rotatable, multifaceted mirror wheel located on the chassis;a light source located on the chassis to selectively strike a facet of the mirror wheel;a reflective surface located on the chassis at a known distance from

1. An apparatus for measuring an object on a support surface comprising:a chassis;a rotatable, multifaceted mirror wheel located on the chassis;a light source located on the chassis to selectively strike a facet of the mirror wheel;a reflective surface located on the chassis at a known distance from the support surface, the reflective surface receives light reflected from the selected facet of the mirror wheel, directs that light toward an object on the support surface, receives light reflected from the object and directs it back to the selected facet which redirects the reflected light;a detector located on the chassis with a field of detection that includes the selected facet, detects redirected light from the selected facet and outputs a signal that identifies a point of contact with the object; anda processor that receives the signal and establishes a measurement of distance between the support surface and the point of contact with the object. 2. The apparatus of claim 1, wherein the reflective surface is parabolic with a concave light receiving side that reflects the light toward the support surface at a predetermined nonzero angle relative to a perpendicular extending from the support surface. 3. The apparatus of claim 1, wherein the light source emits a light beam at a fixed orientation relative to the chassis that is converted to a moving light beam by the mirrored wheel such that when the moving light beam leaves the mirrored wheel toward the reflective surface, the moving light beam rotatably sweeps through an arc of a circle, the reflecting surface changing the moving light beam from sweeping rotatably through the arc of a circle to anther type of moving light beam that moves laterally through a plane, when the object is positioned on the support surface, the other moving light beam moves across the support surface and the detector registers a plurality of points of contact along the object. 4. The apparatus of claim 3, wherein the reflective surface is fixed in position and directs the light toward the support surface at a nonzero angle relative to a perpendicular thereto. 5. The apparatus of claim 4, wherein the field of view which intersects the support surface remains centered about the perpendicular. 6. The apparatus of claim 4, wherein the light source and the detector are oriented toward the selected facet of the mirrored wheel and positioned offset from each other by an angle of less than ninety (90) degrees. 7. The apparatus of claim 3, wherein the light source and the detector are oriented toward the selected facet of the mirrored wheel and positioned offset from each other by an angle of less than forty-five (45) degrees. 8. The apparatus of claim 3, wherein the processor calculates a height value for each of the plurality of points of contact, stores data from the plurality of points of contact, and compares the data to provide a three dimensional measurement of an object on the supporting surface. 9. The apparatus of claim 8, wherein the supporting surface is a conveyor. 10. The apparatus of claim 3, wherein the detector is a line scan camera that transmits a path-height-profile-measurement-signal which represents a height of the object along a linear section of the support area. 11. The apparatus of claim 10, wherein the transport of the object on a conveyor which forms part of the support surface allows the path-height-profile-measurement-signal to be used to determine a height and width of the object. 12. A method of measuring an object on a support surface, comprising:emitting a fixed light beam in a fixed orientation toward a selected facet of a multifaceted, rotatable, mirrored wheel that reflects the fixed light beam as a moving light beam that rotatably sweeps through an arc of a circle;redirecting the moving light beam using a reflective surface such that the rotatable sweeping of the moving light beam through an arc of a circle is converted to a modified moving light beam that moves laterally through a plane across the support surface;detecting a plurality of points of contact that occur within a detector field of view, wherein the detector field of view and the fixed light beam are initially oriented directly toward and redirected by the selected facet of the mirrored wheel; andcalculating height data that corresponds to each of the plurality of points of contact to determine a height profile across a linear section of the measuring area. 13. The method of claim 12, wherein the modified moving light beam impacts the support surface at an angle relative to a perpendicular thereto and the field of view impacts the support surface generally along the perpendicular. 14. The method of claim 12, further comprising transporting the object on a conveyor which forms at least part of the support surface such that the modified moving light beam moves across the conveyor so that a detector can register a plurality of points of contact along the object and/or the support surface. 15. The method of claim 14, further comprising storing data from the plurality of image points and comparing the data to provide a three dimensional measurement of the object in the measuring area. 16. The method of claim 12, further comprising providing a light source and a detector that are oriented directly toward the selected facet along an unobstructed path and are offset from each other by an angle of less than ninety (90) degrees. 17. The method of claim 16, wherein the step of providing the detector comprises providing a line scan camera that transmits a path-height-profile-measurement-signal which represents a height of the object along the linear section of the measuring area. 18. The method of claim 17, further comprising determining if the path-height-profile-measurement-signal represents one or more objects. 19. The method of claim 18, further comprising transmitting a signal corresponding to the number of objects identified by the path-height-profile-measurement-signal.

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이 특허에 인용된 특허 (41) 인용/피인용 타임라인 분석

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Thomas Alan E. (Tulsa OK) Thompson Leon E. (Slippery Rock PA), Optical profile measuring apparatus.
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[미국특허] System for dimensioning objects using at least one light beam offset relative to a perpendicular from an object supporting surface 원문보기

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[미국특허] System for dimensioning objects using at least one light beam offset relative to a perpendicular from an object supporting surface 원문보기

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