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Method and apparatus for cut-point frontier selection and for counter-example generation in formal equivalence verification 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06F-017/50
출원번호 US-0291287 (2002-11-07)
발명자 / 주소
  • Moondanos, John
  • Khasidashvili, Zurab
  • Hanna, Ziyad E.
출원인 / 주소
  • Intel Corporation
대리인 / 주소
    Faatz Cynthia T.
인용정보 피인용 횟수 : 5  인용 특허 : 22

초록

An approach for cut-point frontier selection and/or counter-example generation. Both a lazy and an eager cut-point frontier are identified. A reconvergence (or non-reconvergence) ratio is then computed for each of the frontiers and the one with the smaller (larger) reconvergence (non-reconvergence)

대표청구항

1. A method comprising:for an integrated circuit model, identifying a lazy cut-point frontier and an eager cut-point frontier, the lazy cut-point frontier being one of inputs of the model and a cut-point frontier closest to a prior cut-point frontier and the eager cut-point frontier being a cut-poin

이 특허에 인용된 특허 (22)

  1. Pixley Carl (Austin TX), Apparatus and method for determining sequential hardware equivalence.
  2. Chang Henry ; Cooke Larry ; Hunt Merrill ; Ke Wuudiann ; Lennard Christopher K. ; Martin Grant ; Paterson Peter ; Truong Khoan ; Venkatramani Kumar, Block based design methodology.
  3. Takehiko Tsuchiya JP, Design verification device, method and memory media for integrated circuits.
  4. Aharon Aharon (Doar Na Misgav) Bar-David Ayal (Haifa) Gewirtzman Raanan (Haifa) Gofman Emanuel (Haifa) Leibowitz Moshe (Haifa) Shwartzburd Victor (Haifa ILX), Dynamic process for the generation of biased pseudo-random test patterns for the functional verification of hardware des.
  5. Ashar Pranav N. ; Malik Sharad, Enhanced binary decision diagram-based functional simulation.
  6. Leaver Andrew ; Heile Francis B., Mapping heterogeneous logic elements in a programmable logic device.
  7. Burch Jerry R. ; Singhal Vigyan, Method and system for combinational verification having tight integration of verification techniques.
  8. Dangelo Carlos ; Watkins Daniel ; Mintz Doron, Method and system for creating and validating low level description of electronic design from higher level, behavior-or.
  9. Rostoker Michael D. (Boulder Creek CA) Dangelo Carlos (Los Gatos CA) Watkins Daniel R. (Los Altos CA), Method and system for creating, deriving and validating structural description of electronic system from higher level, b.
  10. Moondanos, John; Seger, Carl J.; Hanna, Ziyad; Kaiss, Daher Adil, Method and system for formal verification of a circuit model using binary decision diagrams.
  11. Pixley Carl ; Park Jaehong, Method for determining functional equivalence between design models.
  12. Aharon Aharon,ILX ; Fournier Laurent ; Gluska Alon,ILX ; Lichtenstein Yossi,ILX ; Malka Yossi,ILX, Method for measuring architectural test coverage for design verification and building conformal test.
  13. Kuehlmann Andreas ; Krohm Florian Karl, Method for performing functional comparison of combinational circuits.
  14. Ashar Pranav N ; Gupta Aarti ; Malik Sharad, Method for using complete-1-distinguishability for FSM equivalence checking.
  15. Jain Jawahar ; Mukherjee Rajarshi ; Takayama Koichiro,JPX, Method for verification of combinational circuits using a filtering oriented approach.
  16. Jain Jawahar ; Mukherjee Rajarshi ; Takayama Koichiro,JPX, Method for verification of combinational circuits using a filtering oriented approach.
  17. Jain Jawahar, Method for verifying and representing hardware by decomposition and partitioning.
  18. Scott Kyl W. ; Skidmore James M., System and method for improving fault coverage of an electric circuit.
  19. Aharon Aharon,ILX ; Malka Yossi,ILX ; Lichtenstein Yossi,ILX, Test program generator.
  20. Andrew K. Martin ; Narayanan Krishamurthy ; Magdy S. Abadir ; Li-Chung Wang, Verification of design blocks and method of equivalence checking of multiple design views.
  21. Rajarshi Mukherjee ; Jawahar Jain ; Vamsi Boppana, Verification of sequential circuits with same state encoding.
  22. Iyer Mahesh A. ; Stok Leon ; Sullivan Andrew J., Wavefront technology mapping.

이 특허를 인용한 특허 (5)

  1. Arbel, Eli; Rokhlenko, Oleg, Circuit design approximation.
  2. Arbel, Eli; Rokhlenko, Oleg, Circuit design approximation.
  3. Krishnamurthy,Narayanan, Derivation of circuit block constraints.
  4. Charlebois,Steven E.; Salem,Gerard M., Method and system for performing static timing analysis on digital electronic circuits.
  5. Seigler, Adrian E.; Van Huben, Gary A., Method, system, and program product for automated verification of gating logic using formal verification.
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