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Apparatus, methods, and articles of manufacture for a switch having sharpened control voltage 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H03K-017/687
출원번호 US-0390957 (2003-03-18)
발명자 / 주소
  • Brindle, Christopher N.
  • Kelcourse, Mark F.
출원인 / 주소
  • MIA-Com, Inc.
인용정보 피인용 횟수 : 62  인용 특허 : 39

초록

A sharp control voltage switch utilizing a plurality of field effect transistors (FETs) and a bypass resistance topology to sharpen the control voltage. Utilizing a total of six FETs allows the switch to operate at a low control voltage without the need to increase device periphery or die size. Feed

대표청구항

1. A switch comprising: a plurality of field effect transistors (FETs) connected together in series; and a bypass resistance topology, including a first terminal and a second terminal, coupled in parallel to said plurality of FETs such that the first terminal is coupled to a first of the plurality

이 특허에 인용된 특허 (39)

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  1. Willard, Simon Edward; Ranta, Tero Tapio, AC coupling modules for bias ladders.
  2. Dribinsky, Alexander; Kim, Tae Youn; Kelly, Dylan J.; Brindle, Christopher N., Circuit and method for controlling charge injection in radio frequency switches.
  3. Shapiro, Eric S.; Allison, Matt, Circuit and method for improving ESD tolerance and switching speed.
  4. Ranta, Tero Tapio; Bawell, Shawn; Greene, Robert W.; Brindle, Christopher N.; Englekirk, Robert Mark, Devices and methods for improving voltage handling and/or bi-directionality of stacks of elements when connected between terminals.
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  32. Brindle, Christopher N.; Stuber, Michael A.; Kelly, Dylan J.; Kemerling, Clint L.; Imthurn, George; Welstand, Robert B.; Burgener, Mark L., Method and apparatus for use in improving linearity of MOSFETs using an accumulated charge sink.
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  35. Stuber, Michael A.; Brindle, Christopher N.; Kelly, Dylan J.; Kemerling, Clint L.; Imthurn, George P.; Burgener, Mark L.; Dribinsky, Alexander; Kim, Tae Youn, Method and apparatus improving gate oxide reliability by controlling accumulated charge.
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  58. Bakalski, Winfried, System and method for a switchable capacitance.
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  60. Lam, Fleming, Systems and methods for generation of internal chip supply bias from high voltage control line inputs.
  61. Englekirk, Robert Mark, Tuning capacitance to enhance FET stack voltage withstand.
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