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[미국특허] Method and apparatus for localized liquid treatment of the surface of a substrate 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • B08B-003/00
출원번호 US-0074706 (2002-02-13)
우선권정보 EP-8700563 (1998-03-20)
발명자 / 주소
  • Mertens, Paul
  • Meuris, Marc
  • Heyns, Marc
출원인 / 주소
  • Interuniversitair Microelektronica Centrum (IMEC, vzw)
대리인 / 주소
    McDonnell Boehnen Hulbert &
인용정보 피인용 횟수 : 30  인용 특허 : 11

초록

A method and apparatus for dispensing a liquid on the surface of a localized zone of a substrate, for example for cleaning of etching purposes. Along with the liquid, a gaseous tensio-active substance is supplied, which is miscible with said liquid and when mixed with the liquid, reduces the surface

대표청구항

1. An apparatus for subjecting a substrate to a localized liquid treatment for cleaning and/or etching of the substrate, the apparatus comprising:support for holding the substrate, a first supply system adapted to supply a liquid on a first part of the surface of the substrate, and a second supply s

이 특허에 인용된 특허 (11) 인용/피인용 타임라인 분석

  1. Kottman Rickie A. (Dallas TX) Terrill Robert E. (Carrollton TX) Wise Ann E. (Dallas TX), Apparatus and method for edge cleaning.
  2. Lee Je-cheol,KRX ; Kim Byung-jin,KRX, Apparatus for cleaning semiconductor wafers.
  3. Crowe Lawrence E., Heat exchanger for high power electrical component and package incorporating same.
  4. Bunkofske Raymond James, Method and apparatus for coating a semiconductor wafer.
  5. Paul Mertens BE; Marc Meuris BE; Marc Heyns BE, Method and apparatus for removing a liquid from a surface.
  6. Mathuni Josef,DEX, Method for etching damaged zones on an edge of a semiconductor substrate, and etching system.
  7. Leenaars Adriaan F. M. (Eindhoven NLX) Huethorst Johanna A. M. (Eindhoven NLX) Marra Johannes (Eindhoven NLX), Method for removing in a centrifuge a liquid from a surface of a substrate.
  8. Yamasaka Miyako,JPX, Method for washing and drying substrates.
  9. Kunze-Concewitz Horst,DEX, Method of cleaning surfaces with water and steam.
  10. Britten Jerald A. (Oakley CA), Moving zone Marangoni drying of wet objects using naturally evaporated solvent vapor.
  11. Kanno Itaru,JPX, Wafer cleaning apparatus.

이 특허를 인용한 특허 (30) 인용/피인용 타임라인 분석

  1. Ravkin,Mike; Boyd,John; Dordi,Yezdi N.; Redeker,Fred C.; de Larios,John M., Apparatus and method for depositing and planarizing thin films of semiconductor wafers.
  2. Freer, Erik M.; de Larios, John M.; Mikhaylichenko, Katrina; Ravkin, Michael; Korolik, Mikhail; Redeker, Fred C.; Thomas, Clint; Parks, John, Apparatus and system for cleaning a substrate.
  3. Ko,Se Jong; Kim,Jung Gwan; Yoon,Cheol Nam; Lee,Jeong Ho, Apparatus for cleaning the edges of wafers.
  4. de Larios,John M.; Owczarz,Aleksander; Schoepp,Alan; Redeker,Fritz, Apparatuses and methods for cleaning a substrate.
  5. Cheng, Wing Lau; Cheng, legal representative, Helen; Kholodenko, Arnold, Hybrid composite wafer carrier for wet clean equipment.
  6. Freer, Erik M.; deLarios, John M.; Mikhaylichenko, Katrina; Ravkin, Michael; Korolik, Mikhail; Redeker, Fred C., Method and apparatus for cleaning a semiconductor substrate.
  7. Freer, Erik M.; deLarios, John M.; Mikhaylichenko, Katrina; Ravkin, Michael; Korolik, Mikhail; Redeker, Fred C., Method and apparatus for cleaning a semiconductor substrate.
  8. de Larios, John M.; Ravkin, Mike; Farber, Jeffrey; Korolik, Mikhail; Redeker, Fred C., Method and apparatus for cleaning a substrate using non-Newtonian fluids.
  9. de Larios, John M.; Ravkin, Mike; Farber, Jeffrey; Korolik, Mikhail; Redeker, Fred C., Method and apparatus for cleaning a substrate using non-newtonian fluids.
  10. Freer, Erik M.; de Larios, John M.; Mikhaylichenko, Katrina; Ravkin, Michael; Korolik, Mikhail; Redeker, Fritz C., Method and apparatus for particle removal.
  11. Magni, Enrico; Lenz, Eric, Method and apparatus for physical confinement of a liquid meniscus over a semiconductor wafer.
  12. Holsteyns, Frank; Heyns, Marc; Mertens, Paul W., Method and apparatus for removing a liquid from a surface of a substrate.
  13. Zhu, Ji; Mendiratta, Arjun; Mui, David, Method and apparatus for removing contaminants from substrate.
  14. Freer, Erik M.; de Larios, John M.; Mikhaylichenko, Katrina; Ravkin, Michael; Korolik, Mikhail; Redeker, Fred C.; Thomas, Clint; Parks, John, Method and apparatus for removing contamination from substrate.
  15. de Larios,John M.; Ravkin,Mike; Parks,John; Korolik,Mikhail; Redeker,Fred C., Method and apparatus for transporting a substrate using non-Newtonian fluid.
  16. Freer, Erik M.; de Larios, John M.; Mikhaylichenko, Katrina; Ravkin, Michael; Korolik, Mikhail; Redeker, Fred C., Method and material for cleaning a substrate.
  17. Korolik, Mikhail; Freer, Erik M.; de Larios, John M.; Mikhaylichenko, Katrina; Ravkin, Mike; Redeker, Fritz, Method and system for using a two-phases substrate cleaning compound.
  18. Fyen, Wim; Mertens, Paul W., Method for coating substrates.
  19. Korolik, Mikhail; Ravkin, Michael; deLarios, John; Redeker, Fritz C.; Boyd, John M., Method for removing material from semiconductor wafer and apparatus for performing the same.
  20. Mikhaylichenko, Katrina; Ravkin, Mike; Redeker, Fritz; de Larios, John M.; Freer, Erik M.; Korolik, Mikhail, Methods for contained chemical surface treatment.
  21. Ravkin, Michael; de Larios, John M.; Redeker, Fred C.; Korolik, Mikhail; Freer, Erik M., Proximity head with angled vacuum conduit system, apparatus and method.
  22. Lenz, Eric, Reclaim chemistry.
  23. Ravkin, Mike; Kabansky, Alex; de Larios, John, Single phase proximity head having a controlled meniscus for treating a substrate.
  24. Stein, Nathan D.; Achkire, Younes; Franklin, Timothy J.; Svirchevski, Julia; Marohl, Dan A., Single wafer apparatus for drying semiconductor substrates using an inert gas air-knife.
  25. Freer, Erik M.; deLarios, John M.; Ravkin, Michael; Korolik, Mikhail; Redeker, Fritz C., Substrate cleaning technique employing multi-phase solution.
  26. Freer, Erik M.; de Larios, John M.; Ravkin, Michael; Korolik, Mikhail; Mikhaylichenko, Katrina; Redeker, Fritz C., Substrate preparation using stabilized fluid solutions and methods for making stable fluid solutions.
  27. Woods,Carl; de Larios,John, System for substrate processing with meniscus, vacuum, IPA vapor, drying manifold.
  28. Boyd, John M.; Redeker, Fred C., System method and apparatus for dry-in, dry-out, low defect laser dicing using proximity technology.
  29. O'Donnell, Robert; Lin, Cheng-Yu (Sean); Kholodenko, Arnold, System, method and apparatus for maintaining separation of liquids in a controlled meniscus.
  30. Parks,John, Wafer edge wheel with drying function.

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