[특허]Probe construction using a recess

[미국특허] Probe construction using a recess 원문보기

IPC분류정보
국가/구분	United States(US) Patent 등록
국제특허분류(IPC7판)	H01R-043/16
출원번호	US-0814584 (2001-03-22)
발명자 / 주소	Gleason, Reed Bayne, Michael A. Smith, Kenneth Lesher, Timothy Koxxy, Martin
출원인 / 주소	Cascade Microtech, Inc.
대리인 / 주소	Chernoff Vilhauer McClung &
인용정보	피인용 횟수 : 14 인용 특허 : 66

초록 ▼

A method of constructing a probe which includes providing a substrate and creating a first substantially asymmetrical recess within the substrate. A conductive material is located within the recess and a conductive trace is electrically connected with the conductive material. A membrane supports the conductive trace, wherein the conductive material is located between the membrane and the substrate. The substrate is removed from the conductive material.

대표청구항 ▼

1. A method of constructing a probe comprising:(a) providing a substrate; (b) creating a first substantially asymmetrical recess within said substrate; (c) locating conductive material within said recess; (d) providing a conductive trace electrically connected with said conductive material; (e) providing a membrane supporting said conductive trace, wherein said conductive material is located between said membrane and said substrate; (f) removing said substrate from said conductive material; and (g) affixing said membrane supporting said conductive trace which is electrically connected to said conductive material to a support such that said conductive material comes into contact with a device under test when probing. 2. The method of claim 1 wherein said recess is created using a tool.3. The method of claim 2 further including a step of pressing said tool into contact with said substrate.4. The method of claim 2 further including a step of creating a second recess with said tool.5. The method of claim 4 further including a step of moving said tool laterally relative to said substrate to create said second recess.6. The method of claim 2 including forming a vertical stop on said tool.7. The method of claim 2 wherein said tool has a shaping portion used to create said first recess.8. The method of claim 7 wherein said shaping portion has inclined sidewalls.9. The method of claim 7 wherein said shaping portion has a beam and a bump.10. The method of claim 7 wherein said shaping portion has an inclined surface between a tail and a head.11. The method of claim 7 wherein said shaping portion has a head and a tail, and said tail is thinner than said head.12. The method of claim 1 wherein said substrate is a ductile material.13. The method of claim 2 wherein said tool is formed from a material that is harder than said substrate.14. The method of claim 1 further comprising a step of creating a second recess.15. The method of claim 14 wherein said first recess is substantially similar to said second recess.16. The method of claim 1 further comprising a step of patterning an insulative layer on said substrate.17. The method of claim 16 wherein said insulative layer is patterned on said substrate prior to creating said first recess.18. The method of claim 16 wherein said insulative layer defines an opening and said first recess is created at a location corresponding with said opening.19. The method of claim 1 wherein said conductive material contains at least one of nickel and rhodium.20. The method of claim 1 further comprising a step of forming an exterior layer of rhodium on said conductive material.21. The method of claim 20 wherein said exterior layer of rhodium forms a v-shape.22. The method of claim 1 wherein said step of locating conductive material within said recess comprises electroplating said conductive material onto said support.23. The method of claim 1 wherein said conductive material is deposited uniformly.24. The method of claim 1 further comprising a step of planarizing said conductive material after locating said conductive material in said recess.25. The method of claim 1 further comprising a step of forming said recess so that said conductive material has a substantially flat surface inclined with respect to a supporting surface of said membrane support.26. The method of claim 1 further comprising a step of forming said recess so that said conductive material is substantially pyramidal in shape.27. The method of claim 1 further comprising a step of polishing said substrate prior to creating said recess.28. The method of claim 1 further comprising a step of forming a roughened surface on said conductive material.29. The method of claim 1 wherein said substrate has a crystal grain and said recess has at least one substantially flat surface inclined relative to said crystal grain, said surface and said crystal grain defining an acute angle therebetween.

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[미국특허] Probe construction using a recess 원문보기

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