초록 ▼

A semiconductor device includes a substrate, a first epitaxial layer, a second epitaxial layer, a third epitaxial layer, a first trench, and a second trench. The first epitaxial layer is formed on the substrate. The first layer has lattice mismatch relative to the substrate. The second epitaxial lay

A semiconductor device includes a substrate, a first epitaxial layer, a second epitaxial layer, a third epitaxial layer, a first trench, and a second trench. The first epitaxial layer is formed on the substrate. The first layer has lattice mismatch relative to the substrate. The second epitaxial layer is formed on the first layer, and the second layer has lattice mismatch relative to the first layer. The third epitaxial layer is formed on the second layer, and the third layer has lattice mismatch relative to the second layer. Hence, the third layer may be strained silicon. The first trench extends through the first layer. The second trench extends through the third layer and at least partially through the second layer. At least part of the second trench is aligned with at lease part of the first trench, and the second trench is at least partially filled with an insulating material.

대표청구항 ▼

1. A method of manufacturing a semiconductor device, comprising:providing a substrate; forming a first epitaxial layer on the substrate, wherein the first layer has lattice mismatch relative to the substrate; forming a first trench in the first layer; forming a second epitaxial layer on the first la

1. A method of manufacturing a semiconductor device, comprising:providing a substrate; forming a first epitaxial layer on the substrate, wherein the first layer has lattice mismatch relative to the substrate; forming a first trench in the first layer; forming a second epitaxial layer on the first layer, wherein the second layer has lattice mismatch relative to the first layer; forming a third epitaxial layer on the second layer, wherein the third layer has lattice mismatch relative to the second layer; and forming a second trench in the third and second layers, wherein at least part of the second trench is in alignment with at least part of the first trench. 2. The method of claim 1, wherein the substrate is silicon.3. The method of claim 1, wherein the first layer comprises silicon germanium.4. The method of claim 1, wherein the second layer comprises relaxed silicon germanium.5. The method of claim 1, wherein the third layer is strained silicon.6. The method of claim 1, wherein the first trench extends at least partially through the first layer.7. The method of claim 6, wherein the first trench extends through the first layer and into the substrate.8. The method of claim 1, wherein material of the second layer at least partially fills the first trench.9. The method of claim 1, wherein the second trench connects with and opens to the first trench.10. The method of claim 1, further comprising:at least partially filling the second trench with an insulating material; and if the second trench opens to the first trench and the first trench is not completely filled, filling an open remainder of the first trench with the insulating material. 11. The method of claim 1, further comprising:forming a transistor adjacent to the second trench, wherein at least part of the transistor is formed in the third layer. 12. The method of claim 1, wherein the first layer is deposited at a deposition temperature, and further comprising:after forming the first trench, annealing the first layer at about 100° C. higher than the deposition temperature. 13. The method of claim 1, further comprising:planarizing the first layer prior to forming the second layer. 14. The method of claim 1, further comprising:planarizing the second layer prior to forming the third layer. 15. A semiconductor device produced using the method of claim 1.16. A method of manufacturing a semiconductor device, comprising:providing a substrate; forming a first epitaxial layer on the substrate, wherein the first layer has lattice mismatch relative to the substrate; forming a second epitaxial layer on the first layer, wherein the second layer has lattice mismatch relative to the first layer; forming a first trench in the second and first layers; forming a third epitaxial layer on the second layer, wherein the third layer has lattice mismatch relative to the second layer, and forming a second trench in the third and second layers, wherein at least part of the second trench is in alignment with at least part of the first trench. 17. The method of claim 16, wherein the third layer is strained silicon.18. The method of claim 16, wherein the first trench extends through the second layer and into the first layer.19. The method of claim 18, wherein the first trench extends through the second layer, through the first layer, and into the substrate.20. The method of claim 16, wherein the second trench connects with and opens to the first trench.21. The method of claim 16, further comprising:at least partially filling the second trench with an insulating material; and if the second trench opens to the first trench and the first trench is not completely filled, filling an open remainder of the first trench with the insulating material. 22. The method of claim 16, further comprising:forming a transistor adjacent to the second trench, wherein at least part of the transistor is formed in the third layer. 23. A semiconductor device produced using the method of claim 16.