초록 ▼

A method and apparatus for a micromachine relay is provided. A pin controller comprises at least one spring pin designed to movably couple the pin controller to a device under test (DUT) to provide signals to the DUT. The pin controller further includes a micromachine relay coupled to the at least o

A method and apparatus for a micromachine relay is provided. A pin controller comprises at least one spring pin designed to movably couple the pin controller to a device under test (DUT) to provide signals to the DUT. The pin controller further includes a micromachine relay coupled to the at least one spring pin to control the movement of the at least one spring pin and an integrated circuit for controlling the micromachine relay.

대표청구항 ▼

1. A test unit comprisinga computing system: a test head coupled to the computing system and receiving control signals from the computing system, the test head having a place for a device under test (DUT), the test head comprising: a location to put a DUT; a plurality of spring pins for connecting s

1. A test unit comprisinga computing system: a test head coupled to the computing system and receiving control signals from the computing system, the test head having a place for a device under test (DUT), the test head comprising: a location to put a DUT; a plurality of spring pins for connecting signals to the DUT; a plurality of micromachine relays for controlling the plurality of spring pins; and an integrated circuit device for controlling the relays; wherein the micromachine relays are included within a substrate of the integrated circuit device. 2. The testing unit of claim 1, wherein the test head is moveable with respect to the computing system.3. The testing unit of claim 1, wherein the test head is coupled to the computing system via a flexible transmission line.4. The testing unit of claim 3, wherein the flexible transmission line is a flexible low impedance bus.5. The testing unit of claim 1, wherein the testing unit further includes a timing generator for generating clocking and timing signals for the integrated circuit device.6. The testing unit of claim 5, wherein the timing generator is located on the test head, thereby reducing signal delays.7. The testing unit of claim 1, further comprising a tester for generating the signals used to test the DUT.8. The testing unit of claim 7, further comprising a logic circuit receiving signals from the tester.9. The testing unit of claim 1, wherein the test head has a circular body, and the integrated circuit device comprises a plurality of integrated circuit cards located within the test head.10. The testing unit of claim 9, wherein:the body of the test head includes a plurality of cut-outs; the integrated circuit device includes a plurality of circuit cards having tops that fit within the cut-outs of the test head; and the plurality of spring pins extend from the tops of the circuit cards through the cut-outs. 11. The testing unit of claim 1, further comprising a micromachine relay switch matrix coupled to the integrated circuit device, the micromachine relay switch matrix selectively coupling signals to the plurality of spring pins.12. The testing unit of claim 11, wherein the micromachine relay switch matrix comprises a plurality of switches implemented on the substrate.13. The testing unit of claim 11, wherein the micromachine relay switch matrix is implemented on a hybrid circuit.14. The testing unit of claim 1, wherein the micromachine relay comprises a moveable cantilever arm controlled by electromagnetic attraction/repulsion.15. The testing unit of claim 1, wherein the micromachine relay comprises rhodium contracts and a ferrite electromagnets.16. The testing unit of clam 1, wherein the micromachine relay comprises a relay built of micromachined parts.17. The testing unit of claim 1, wherein the micromachine relay comprises an electrostatic relay.