[특허]Method and apparatus for generating structural data from laser reflectance images

[미국특허] Method and apparatus for generating structural data from laser reflectance images 원문보기

IPC분류정보
국가/구분	United States(US) Patent 등록
국제특허분류(IPC7판)	G01B-011/26 G01C-003/08
출원번호	US-0054333 (2002-01-23)
발명자 / 주소	Hoffman, Eric Persi, Fred M.
출원인 / 주소	Quantapoint, Inc.
인용정보	피인용 횟수 : 37 인용 특허 : 8

초록 ▼

An apparatus for generating structural data of a structure. The apparatus includes a scanning laser range finder that produces reflectance data of the structure. The apparatus includes a memory which stores the reflectance data. The apparatus includes means for determining desired spatial relationships of the structure from the reflectance data. A method for generating structural data of a structure. The method includes the steps of producing reflectance data of the structure with a scanning laser range finder. There is the step of storing the reflectance data in a memory. There is the step of determining desired spatial relationships of the structure from the reflectance data.

대표청구항 ▼

1. An apparatus for generating structural data of a structure comprising:a scanning laser range finder which provides up to 125,000 discrete data points every second that produces reflectance data of the structure; a memory which stores the reflectance data; and means for determining desired spatial relationships of the structure from the reflectance data. 2. An apparatus as described in claim 1 wherein the determining means includes interface means for allowing desired spatial relationships to be chosen.3. An apparatus as described in claim 2 wherein the data includes a reflectance image and a point cloud of the structure that are produced simultaneously by the laser range finder.4. An apparatus as described in claim 3 wherein the reflectance image is provided to the interface means which allows a user to work with the reflectance image that is a 2D representation of the point cloud which is a 3D representation of the structure.5. An apparatus described in claim 4 wherein the data includes distance measurements and reflectance measurements of the structure that have a direct correspondence.6. An apparatus as described in claim 5 wherein the reflectance image is formed from reflectance measurements and range data.7. A method for generating structural data of a structure comprising the steps of:loading a reflectance image into an image window; selecting a first point of the structure in the image; selecting a second point on the structure; selecting a third point of the structure; measuring edges with respect to the first point, second point and third point; extracting straight edges for the first point, second point and third point; constructing a plane so as to be perpendicular to an average of directions of lines defined by the straight edges; intersecting the plane in turn with each of the lines to determine three control points; and computing dimensions with the three control points for measuring distances between discrete points on the structure. 8. A method as described in claim 7 wherein the constructing step includes the step of constructing a plane so as to be perpendicular to a weighted average of directions of the lines of the straight edges.9. A method as described in claim 8 including the step of generating queries into a data set of the reflectance image.10. A method as described in claim 9 wherein the selecting a first point step includes the step of selecting the first point on an exterior face near a first edge of the structure in the image.11. A method as described in claim 10 wherein the generating queries step includes the step of generating queries into the data set of the reflectance image by interacting with a set of icons and windowing commands.12. A method as described in claim 11 wherein the extracting step includes the step of checking that the straight edges are essentially parallel.13. A method as described in claim 12 wherein the selecting the second point step includes the step of selecting the second point on the face near the second edge of opposite the first edge.14. A method as described in claim 13 wherein the selecting a second point includes the step of selecting a second point at a same longitudinal position as the first point.15. A method as described in claim 14 wherein the selecting the third point includes the step of selecting the third point on the structure on an opposite side of the exterior face of the structure near a third edge in the interior of the structure.

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[미국특허] Method and apparatus for generating structural data from laser reflectance images 원문보기

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[미국특허] Method and apparatus for generating structural data from laser reflectance images 원문보기

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