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A membrane probing assembly includes a support element having an incompressible forward support tiltably coupled to a rearward base and a membrane assembly, formed of polyimide layers, with its central region interconnected to the support by an elastomeric layer. Flexible traces form data/signal lin

A membrane probing assembly includes a support element having an incompressible forward support tiltably coupled to a rearward base and a membrane assembly, formed of polyimide layers, with its central region interconnected to the support by an elastomeric layer. Flexible traces form data/signal lines to contacts on the central region. Each contact comprises a rigid beam and a bump located in off-centered location on the beam, which bump includes a contacting portion. After initial touchdown of these contacting portions, further over-travel of the pads causes each beam to independently tilt locally so that different portions of each beam move different distances relative to the support thus driving each contact into lateral scrubbing movement across the pad thereby clearing away oxide buildup. The elastomeric member backed by the incompressible support ensures sufficient scrub pressure and reliable tilt recovery of each contact without mechanical straining of the beam. In an alternative embodiment, the contacts comprise conductive beams each supported on a loose U-shaped flap formed in the membrane assembly where each flap and beam is tiltably supported in inclined position by an elastomeric hub interposed between the flap and support.

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1. A probing assembly for probing an electrical device comprising:(a) a plurality of contacts, each of said contacts having a length and a contacting portion spaced apart from an axis of moment of said contact, and each contact being electrically connected to a corresponding conductor; and (b) an el

1. A probing assembly for probing an electrical device comprising:(a) a plurality of contacts, each of said contacts having a length and a contacting portion spaced apart from an axis of moment of said contact, and each contact being electrically connected to a corresponding conductor; and (b) an elastic assembly including a single continuous surface supporting said plurality of contacts, said elastic assembly operating in respect to each contact to urge each contact, when in pressing engagement with said electrical device, into tilting motion so that each contact is driven in accordance with said tilting motion into lateral scrubbing movement across said electrical device, each contact remaining supported by said elastic assembly along substantially all of said length during the tilting motion. 2. The probing assembly of claim 1 wherein each one of said contacts is tiltable substantially independently of the other ones of said contacts.3. The probing assembly of claim 1 including a base, said elastic assembly being tillably coupled to said base so as to enable said elastic assembly to automatically tilt relative to said base toward a position parallel to said electrical device in response to pressing engagement between respective ones of said contacts and said electrical device.4. The probing assembly of claim 1 wherein each contact includes a contact bump fixedly joined to said contact in an off-centered location on said contact.5. The probing assembly of claim 1 wherein said contacts are provided in pairs and the respective lateral scrubbing movements of said contacts in each pair are in opposite directions.6. The probing assembly of claim 1 wherein the distance of said lateral scrubbing movement of each contact after touchdown on said electrical device is uniformly dependent for each contact on the distance traveled after touchdown.7. The probing assembly of claim 1 wherein said contacts are arranged by rows and columns.8. The probing assembly of claim 1 wherein each contact is joined in overlapping relationship to the corresponding conductor.9. The probing assembly of claim 1 wherein said elastic assembly is substantially continuous over said surface supporting said contacts.10. The probing assembly of claim 1 wherein each contact is supported by a continuous portion of said elastic assembly.11. A method for probing an electrical device comprising:(a) providing a plurality of contacts supported by a single continuous surface of an elastic assembly, each of said contacts having a length and a contacting portion spaced apart from an axis of moment of said contact, and each contact being electrically connected to a corresponding conductor; and (b) urging each contact, when placed into pressing engagement with said electrical device, into tilting motion so as to drive each contact in accordance with said tilting motion into lateral scrubbing movement across said electrical device, each contact remaining supported by said elastic assembly along substantially all of said length of said contact during said tilting motion. 12. The method of claim 11 including urging a shorter one of said contacts into tilting motion at a later time than an immediately neighboring larger one of said contacts.13. The method of claim 11 including providing a base tiltably coupled to said elastic assembly and automatically tilting said elastic assembly relative to said base toward a position parallel to said electrical device in response to pressing engagement between respective ones of said contacts and said electrical device.14. The method of claim 11 including providing contacts in pairs and driving said contacts in each pair so that each of said contacts lateral scrubbing movement is opposite to that of the other.15. A probing assembly for probing an electrical device comprising:(a) a pair of contacts, each contact having a length and a contacting portion spaced apart from an axis of moment of said contact, and each contact being electrically connected to a corresponding conductor; and (b) an elastic assembly operating in respect to each contact to urge each contact, wherein each of said contacts is supported by a single continuous surface of said elastic assembly, when placed into pressing engagement with said electrical device, into tilting motion so that each contact is driven in accordance with said tilting motion into lateral scrubbing movement across said device, so that said lateral scrubbing movement of a first contact is opposite to that of the other contact of said pair. 16. The probing assembly for claim 15 wherein said elastic assembly comprises an elastomeric member having a first surface substantially resisting outward displacement normal to said first surface.17. The probing assembly of claim 15 wherein each one of said contacts is tiltable independently of the other one of said contacts.18. The probing assembly of claim 15 including a base, said elastic member being tiltably coupled to said base so as to enable said elastic member to automatically tilt relative to said base toward a position parallel to said electrical device in response to pressing engagement between said pair of contacts and said electrical device.19. The probing assembly of claim 15 wherein each of said contacts has a downwardly protruding contacting portion.20. A probing assembly for probing an electrical device comprising:(a) a plurality of substantially asymmetric contacts, each of said contacts having a length and electrically connected to a corresponding conductor; and (b) an elastic assembly having a single continuous surface supporting said contacts, said elastic assembly operating in respect to each contact to urge each contact, when placed into pressing engagement with said electrical device, into tilting motion so that each contact is driven in accordance with said tilting motion into lateral scrubbing movement across said electrical device, and each contact remaining supported by said elastic assembly along substantially all of said length during the tilting motion. 21. The probing assembly of claim 20 wherein each one of said contacts is tiltable independently of the other ones of said contacts.22. The probing assembly of claim 20 including a base, said elastic assembly being tiltably coupled to said base so as to enable said elastic assembly to automatically tilt relative to said base toward a position parallel to said electrical device in response to pressing engagement between respective ones of said contacts and said electrical device.23. The probing assembly of claim 20 wherein each contact includes a contact bump fixedly joined in off-centered location on said contact.24. The probing assembly of claim 20 wherein said contacts are provided in pairs and the respective lateral scrubbing movements of said contacts in each pair are in opposite directions.25. The probing assembly of claim 20 wherein the distance of said lateral scrubbing movement of each contact after touchdown on said electrical device is uniformly dependent for each contact on the distance traveled after touchdown.26. The probing assembly of claim 20, wherein said elastic assembly comprises an elastomeric member having a first surface substantially resisting outward displacement normal to said first surface.27. The probing assembly of claim 20 wherein said contacts are arranged by rows and columns.28. The probing assembly of claim 20 wherein each contact is joined in overlapping relationship to the corresponding conductor.29. The probing assembly of claim 20 wherein said elastic assembly is substantially continuous over said surface supporting said contacts.30. The probing assembly of claim 20 wherein each contact is supported by a continuous portion of said elastic assembly.31. A method for probing an electrical device comprising:(a) providing an elastic assembly; (b) providing a plurality of substantially asymmetric contacts supported by a single continuous surface of said elastic assembly, each of said contacts having a length and each contact being electrically connected to a corresponding conductor; and (c) urging each contact, when placed into pressing engagement with said electrical device, into tilting motion so as to drive each contact in accordance with said tilting motion into lateral scrubbing movement across said electrical device, each contact remaining supported by said elastic assembly along substantially all of said length of said contact during said tilting motion. 32. The method of claim 31 including urging a shorter one of said contacts into tilting motion at a later time than an immediately neighboring larger one of said contacts.33. The method of claim 31 including providing a base tiltably coupled to said elastic assembly and automatically tilting said elastic assembly relative to said base toward a position parallel to said electrical device in response to pressing engagement between respective ones of said contacts and said electrical device.34. The method of claim 31 including providing contacts in pairs and driving said contacts in each pair so that each of said contact's lateral scrubbing movement is opposite to that of the other.35. A probing assembly for probing an electrical device comprising:(a) a pair of substantially asymmetric contacts, each contact having a length and being electrically connected to a corresponding conductor; and (b) an elastic assembly supporting said contacts and operating in respect to each contact to urge each contact, wherein each of the contacts is supported by a single continuous surface of the elastic assembly, when placed into pressing engagement with said electrical device, into tilting motion so that each contact is driven in accordance with said tilting motion into lateral scrubbing movement across said device, each contact remaining supported by said elastic assembly along substantially all of said length of said contact during said tilting motion, so that the respective lateral scrubbing movement of each of said contacts of said pair is opposite to that of the other. 36. The probing assembly for claim 35 wherein said elastic assembly includes an elastomeric member having a first surface substantially resisting outward displacement normal to said first surface and a second surface exerting a recovery force on said contact when said elastomeric member is compressed.37. The probing assembly of claim 35 wherein each one of said contacts is tiltable independently of the other one of said contacts.38. The probing assembly of claim 35 including a base, said elastic assembly being tiltably coupled to said base so as to enable said elastic assembly to automatically tilt relative to said base toward a position parallel to said electrical device in response to pressing engagement between a contact and said electrical device.39. The probing assembly of claim 35 wherein each of said contacts has a downwardly protruding contacting portion.40. A probing assembly for probing an electrical device comprising:(a) a plurality of contacts, each of said contacts having a length and a height where said height is not uniform along said length, without symmetry around the center point of said length, and each contact being electrically connected to a corresponding conductor; and (b) an elastic assembly having a single continuous surface region supporting said contacts, said elastic assembly operating with respect to each contact to urge each contact, when placed into pressing engagement with said electrical device, into tilting motion so that each contact is driven in accordance with said tilting motion into lateral scrubbing movement across said electrical device, and each contact remaining supported by said elastic assembly along substantially all of said length during the tilting motion. 41. The probing assembly of claim 40 wherein each one of said contacts is tiltable independently of the other ones of said contacts.42. The probing assembly of claim 40 including a base, said elastic assembly being tiltably coupled to said base so as to enable said elastic assembly to automatically tilt relative to said base toward a position parallel to said electrical device in response to pressing engagement between respective ones of said contacts and said electrical device.43. The probing assembly of claim 40 wherein each contact includes a contact bump fixedly joined to said contact in off-center location on said contact.44. The probing assembly of claim 40 wherein said contacts are provided in pairs and the respective lateral scrubbing movements of said contacts in each pair are in opposite directions.45. The probing assembly of claim 40 wherein the distance of said lateral scrubbing movement of each contact after touchdown on said electrical device is uniformly dependent for each contact on the distance traveled after touchdown.46. The probing assembly of claim 40, wherein said elastic assembly includes an elastomeric member having a first surface substantially resisting outward displacement normal to said first surface.47. The probing assembly of claim 40 wherein said contacts are arranged by rows and columns.48. The probing assembly of claim 40 wherein each contact is joined in overlapping relationship to the corresponding conductor.49. The probing assembly of claim 40 wherein said elastic assembly is substantially continuous along said surface region supporting said contacts.50. The probing assembly of claim 40 wherein each contact is supported by a continuous portion of said elastic assembly.51. A method for probing an electrical device comprising:(a) providing a plurality of contacts, each of said contacts having a length and a height where said height is nonuniform along said length without symmetry around the center point of said length, and each contact being electrically connected to a corresponding conductor; and (b) urging each contact, when placed into pressing engagement with said electrical device, into tilting motion so as to drive each contact in accordance with said tilting motion into lateral scrubbing movement across said electrical device, each contact being supported by an elastic assembly along substantially all of said length of said contact during said tilting motion, wherein each of the contacts is supported by a single continuous surface of the elastic assembly. 52. The method of claim 51 including urging a shorter one of said contacts into tilting motion at a later time than an immediately neighboring larger one of said contacts.53. The method of claim 51 including providing a base tiltably coupled to said elastic assembly and automatically tilting said elastic assembly relative to said base toward a position parallel to said electrical device in response to pressing engagement between respective ones of said contacts and said electrical device.54. The method of claim 51 including providing contacts in pairs and driving said contacts in each pair so that the respective lateral scrubbing movement of each contact is opposite to that of the other of said pair of contacts.55. A probing assembly for probing an electrical device comprising:(a) a pair of contacts, each contact having a length and a height where said height is nonuniform along said length without symmetry around the center point of said length, and each contact is electrically connected to a corresponding conductor; and (b) an elastic assembly operating in respect to each contact to urge each contact, when placed into pressing engagement with said electrical device, into tilting motion so that each contact is driven in accordance with said tilting motion into lateral scrubbing movement across said device, each contact remaining supported by said elastic assembly along substantially all of said length of said contact during said tilting motion, so that the lateral scrubbing movement of a contact is opposite to the lateral scrubbing movement of the other contact of said pair of contacts wherein each of the contacts is supported by a single continuous surface of the elastic assembly. 56. The probing assembly for claim 55 wherein said elastic assembly includes an elastomeric member having a first surface substantially resisting outward displacement normal to said first surface and a second surface exerting a recovery force on said contact when said elastomeric member is compressed.57. The probing assembly of claim 55 wherein each one of said contacts is tiltable independently of the other one of said contacts.58. The probing assembly of claim 55 including a base, said elastic assembly being tiltably coupled to said base so as to enable said elastic assembly to automatically tilt relative to said base toward a position parallel to said electrical device in response to pressing engagement between said pair of contacts and said electrical device.59. The probing assembly of claim 55 wherein each of said contacts has a downwardly protruding contacting portion.60. A probing assembly for probing an electrical device defining a first plane comprising:(a) a plurality of contacts, each of said contacts having a length, and each contact being electrically connected to a corresponding conductor; and (b) an elastic assembly including a region supporting said contacts and defining a second plane, said elastic assembly urging each contact, when placed into pressing engagement with said electrical device, and as a result of relative perpendicular movement of said first plane with respect to said second plane where said first plane and said second plane are parallel to one another, into tilting motion so that each contact is driven in accordance with said tilting motion into lateral scrubbing movement across said electrical device, each contact remaining supported by said elastic assembly along substantially all of said length during the tilting motion, wherein each of the contacts is supported by a single continuous surface of the elastic assembly. 61. The probing assembly of claim 60 wherein each one of said contacts is tillable independently of the other ones of said contacts.62. The probing assembly of claim 60 including a base, said elastic assembly being tiltably coupled to said base so as to enable said elastic assembly to automatically tilt relative to said base toward a position parallel to said electrical device in response to pressing engagement between respective ones of said contacts and said electrical device.63. The probing assembly of claim 60 wherein each contact includes a contact bump fixedly joined to said contact in an off-center location on said contact.64. The probing assembly of claim 60 wherein said contacts are provided in pairs and the respective lateral scrubbing movements of said contacts in each pair are in opposite directions.65. The probing assembly of claim 60 wherein the distance of said lateral scrubbing movement of each contact after touchdown on said electrical device is uniformly dependent for each contact on the distance traveled after touchdown.66. The probing assembly of claim 60, wherein said elastic assembly includes an elastomeric member having a substantially first surface resisting outward displacement normal to said first surface.67. The probing assembly of claim 60 wherein said contacts are arranged by rows and columns.68. The probing assembly of claim 60 wherein each contact is joined in overlapping relationship to the corresponding conductor.69. The probing assembly of claim 60 wherein said elastic assembly is substantially continuous along said region.70. The probing assembly of claim 60 wherein each contact is supported by a continuous portion of said elastic assembly.71. A method for probing an electrical device defining a first plane, said method comprising:(a) providing an elastic assembly having a region defining a second plane; (b) providing a plurality of contacts supported by said region of said elastic assembly, each of said contacts having a length an electrical connection to a corresponding conductor, each of the contacts is supported by a single continuous surface of the elastic assembly; and (c) urging each contact, when placed into pressing engagement with said electrical device, and as a result of relative perpendicular movement of said first plane with respect to said second plane where said first plane and said second plane are parallel to one another, into tilting motion so as to drive each contact in accordance with said tilting motion into lateral scrubbing movement across said electrical device, each contact remaining supported by said elastic assembly along substantially all of said length of said contact during said tilting motion. 72. The method of claim 71 including urging a shorter one of said contacts into tilting motion at a later time than an immediately neighboring larger one of said contacts.73. The method of claim 71 including providing a base tiltably coupled to said elastic assembly and automatically tilting said elastic assembly relative to said base toward a position parallel to said electrical device in response to pressing engagement between respective ones of said contacts and said electrical device.74. The method of claim 71 including providing contacts in pairs and driving said contacts in each pair so that the lateral scrubbing movement of a contact is opposite the lateral scrubbing movement of the other contact of a pair of contacts.75. A probing assembly for probing an electrical device defining a first plane, said probing assembly comprising:(a) a pair of contacts, each contact having a length and an electrical connection to a corresponding conductor; and (b) an elastic assembly including a region defining a second plane, said region of said elastic assembly supporting said pair of contacts and operating in respect to each contact to urge each contact, when placed into pressing engagement with said electrical device, and as a result of relative perpendicular movement of said first plane with respect to said second plane where said first plane and said second plane are parallel to one another, into tilting motion so that each contact is driven in accordance with said tilting motion into lateral scrubbing movement across said device, each contact remaining supported by said elastic assembly along substantially all of said length of said contact during said tilting motion, so that each of said lateral scrubbing movement of a contact is opposite the lateral scrubbing movement of the other contact of said pair of contacts, each of the contacts is supported by a single continuous surface of the elastic assembly. 76. The probing assembly of claim 75 wherein said elastic assembly includes an elastomeric member having a first surface substantially resisting outward displacement normal to said first surface.77. The probing assembly of claim 75 wherein each one of said contacts is tiltable independently of the other one of said contacts.78. The probing assembly of claim 75 including a base, said elastic assembly being tiltably coupled to said base so as to enable said elastic assembly to automatically tilt relative to said base toward a position parallel to said electrical device in response to pressing engagement between said pair of contacts and said electrical device.79. The probing assembly of claim 75 wherein each of said contacts has a downwardly protruding contacting portion.80. A method for probing an electrical device comprising:(a) providing an elastic assembly; (b) providing a plurality of contacts supported by elastic assembly, each of said contacts having a length and a contacting portion spaced apart from an axis of moment of said contact, and each contact being electrically connected to a corresponding conductor, each of the contacts is supported by a single continuous surface of the elastic assembly; and (c) urging each contact, when placed into pressing engagement with said electrical device, into tilting motion so as to drive each contact in accordance with said tilting motion into lateral scrubbing movement across said electrical device, each contact remaining supported by said elastic assembly along substantially all of said length of said contact during said tilting motion. 81. The method of claim 80 including providing a base tiltably coupled to said elastic assembly and automatically tilting said elastic assembly relative to said base toward a position parallel to said electrical device in response to pressing engagement between respective ones of said contacts and said electrical device.82. The method of claim 80 including providing contacts in pairs and driving said contacts in each pair so that said lateral scrubbing movement of a contact is opposite the lateral scrubbing movement of the other contact of a pair of contacts.